diff --git a/acknowledgments.aux b/acknowledgments.aux
index d2ced5d6a15772bca7c1fbf354afb1809942d153..dd1ff1ba0d1d18910bb57ed54965ef5301bec548 100644
--- a/acknowledgments.aux
+++ b/acknowledgments.aux
@@ -1,8 +1,8 @@
\relax
\providecommand\hyper@newdestlabel[2]{}
-\@writefile{toc}{\contentsline {chapter}{Acknowledgments}{97}{chapter*.114}\protected@file@percent }
+\@writefile{toc}{\contentsline {chapter}{Acknowledgments}{95}{chapter*.112}\protected@file@percent }
\@setckpt{acknowledgments}{
-\setcounter{page}{98}
+\setcounter{page}{96}
\setcounter{equation}{1}
\setcounter{enumi}{4}
\setcounter{enumii}{0}
@@ -22,7 +22,7 @@
\setcounter{section@level}{4}
\setcounter{Item}{14}
\setcounter{Hfootnote}{1}
-\setcounter{bookmark@seq@number}{67}
+\setcounter{bookmark@seq@number}{66}
\setcounter{parentequation}{0}
\setcounter{FancyVerbLine}{0}
\setcounter{NAT@ctr}{25}
diff --git a/appendix.aux b/appendix.aux
index d326ce9a0e9cc71517ce1e5db37842259e9864a1..6433eaa50a96cfa23ae2eba3b21f335d45d62e88 100644
--- a/appendix.aux
+++ b/appendix.aux
@@ -1,59 +1,59 @@
\relax
\providecommand\hyper@newdestlabel[2]{}
-\@writefile{toc}{\contentsline {chapter}{Appendix}{77}{chapter*.79}\protected@file@percent }
-\@writefile{toc}{\contentsline {section}{\numberline {A}LockIn amplifier settings}{77}{section.4.1}\protected@file@percent }
-\newlabel{app:lock_in}{{A}{77}{LockIn amplifier settings}{section.4.1}{}}
-\@writefile{lot}{\contentsline {table}{\numberline {4.1}{\ignorespaces Settings used for the Lock-in amplifier in the experiment. Sensitivity is increased a step at a time until the Lock-in is no longer in overload. Source is chosen as internal. Ground is set to grounded.}}{77}{table.caption.80}\protected@file@percent }
-\newlabel{fig:app_lock_in}{{4.1}{77}{Settings used for the Lock-in amplifier in the experiment. Sensitivity is increased a step at a time until the Lock-in is no longer in overload. Source is chosen as internal. Ground is set to grounded}{table.caption.80}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {B}Evaporation parameters}{77}{section.4.2}\protected@file@percent }
-\newlabel{app:evaporation}{{B}{77}{Evaporation parameters}{section.4.2}{}}
-\@writefile{lot}{\contentsline {table}{\numberline {4.2}{\ignorespaces Table with all the evaporation parameters. FIL stands for the current applied to the heating Filament, EMIS stands for the emission current, FLUX is the measured molecular flux. Press is the maximum pressure in the chamber during the evaporation, and T is the maximal temperature the crucible reached during the evaporation. The voltage was changed to ensure FLUX was in the desired range between $450-520$}}{77}{table.caption.81}\protected@file@percent }
-\newlabel{tab:evaporation_settings}{{4.2}{77}{Table with all the evaporation parameters. FIL stands for the current applied to the heating Filament, EMIS stands for the emission current, FLUX is the measured molecular flux. Press is the maximum pressure in the chamber during the evaporation, and T is the maximal temperature the crucible reached during the evaporation. The voltage was changed to ensure FLUX was in the desired range between $450-520$}{table.caption.81}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {C}Walker principle diagram}{78}{section.4.3}\protected@file@percent }
-\newlabel{app:walker_diagram}{{C}{78}{Walker principle diagram}{section.4.3}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {4.10}{\ignorespaces Overview of the entire signal generation and amplification process of the new Mask Aligner controller.}}{78}{figure.caption.82}\protected@file@percent }
-\newlabel{fig:electronics_diagramm}{{4.10}{78}{Overview of the entire signal generation and amplification process of the new Mask Aligner controller}{figure.caption.82}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {D}Walker circuit diagrams}{78}{section.4.4}\protected@file@percent }
-\newlabel{app:circuit_electronics}{{D}{78}{Walker circuit diagrams}{section.4.4}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {E}Mask Aligner Walker Commands}{82}{section.4.5}\protected@file@percent }
-\newlabel{sec:appendix_walker}{{E}{82}{Mask Aligner Walker Commands}{section.4.5}{}}
-\@writefile{toc}{\contentsline {paragraph}{pulse?}{82}{section*.83}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{pol x}{82}{section*.84}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{amp x}{82}{section*.85}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{volt x}{82}{section*.86}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{channel x}{82}{section*.87}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{maxmstep x}{82}{section*.88}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{step x}{82}{section*.89}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{mstep x}{82}{section*.90}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{cancel}{83}{section*.91}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{help}{83}{section*.92}\protected@file@percent }
-\@writefile{toc}{\contentsline {section}{\numberline {F}Mask Aligner Walker Code}{83}{section.4.6}\protected@file@percent }
-\newlabel{sec:walker_code}{{F}{83}{Mask Aligner Walker Code}{section.4.6}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {G}Raycast Simulation}{94}{section.4.7}\protected@file@percent }
-\newlabel{sec:appendix_raycast}{{G}{94}{Raycast Simulation}{section.4.7}{}}
-\@writefile{toc}{\contentsline {paragraph}{radius\_1}{94}{section*.93}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{angle}{94}{section*.94}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{radius\_mask}{95}{section*.95}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{distance\_circle\_mask}{95}{section*.96}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{distance\_sample}{95}{section*.97}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{rays\_per\_frame}{95}{section*.98}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{running\_time}{95}{section*.99}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{deposition\_gain}{95}{section*.100}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{penalize\_deposition}{95}{section*.101}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{first\_layer\_deposition\_prob}{95}{section*.102}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{oscillation\_period}{95}{section*.103}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{delay\_oscill\_time}{95}{section*.104}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{save\_in\_progress\_images}{95}{section*.105}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{save\_intervall}{95}{section*.106}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{oscillation\_dir}{95}{section*.107}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{oscillation\_rot\_s}{95}{section*.108}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{oscillation\_rot\_e}{96}{section*.109}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{random\_seed}{96}{section*.110}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{x\_min, x\_max, y\_min, y\_max}{96}{section*.111}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{resolution}{96}{section*.112}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{path}{96}{section*.113}\protected@file@percent }
+\@writefile{toc}{\contentsline {chapter}{Appendix}{75}{chapter*.77}\protected@file@percent }
+\@writefile{toc}{\contentsline {section}{\numberline {A}LockIn amplifier settings}{75}{section.4.1}\protected@file@percent }
+\newlabel{app:lock_in}{{A}{75}{LockIn amplifier settings}{section.4.1}{}}
+\@writefile{lot}{\contentsline {table}{\numberline {4.1}{\ignorespaces Settings used for the Lock-in amplifier in the experiment. Sensitivity is increased a step at a time until the Lock-in is no longer in overload. Source is chosen as internal. Ground is set to grounded.}}{75}{table.caption.78}\protected@file@percent }
+\newlabel{fig:app_lock_in}{{4.1}{75}{Settings used for the Lock-in amplifier in the experiment. Sensitivity is increased a step at a time until the Lock-in is no longer in overload. Source is chosen as internal. Ground is set to grounded}{table.caption.78}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {B}Evaporation parameters}{75}{section.4.2}\protected@file@percent }
+\newlabel{app:evaporation}{{B}{75}{Evaporation parameters}{section.4.2}{}}
+\@writefile{lot}{\contentsline {table}{\numberline {4.2}{\ignorespaces Table with all the evaporation parameters. FIL stands for the current applied to the heating Filament, EMIS stands for the emission current, FLUX is the measured molecular flux. Press is the maximum pressure in the chamber during the evaporation, and T is the maximal temperature the crucible reached during the evaporation. The voltage was changed to ensure FLUX was in the desired range between $450-520$}}{75}{table.caption.79}\protected@file@percent }
+\newlabel{tab:evaporation_settings}{{4.2}{75}{Table with all the evaporation parameters. FIL stands for the current applied to the heating Filament, EMIS stands for the emission current, FLUX is the measured molecular flux. Press is the maximum pressure in the chamber during the evaporation, and T is the maximal temperature the crucible reached during the evaporation. The voltage was changed to ensure FLUX was in the desired range between $450-520$}{table.caption.79}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {C}Walker principle diagram}{76}{section.4.3}\protected@file@percent }
+\newlabel{app:walker_diagram}{{C}{76}{Walker principle diagram}{section.4.3}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {4.10}{\ignorespaces Overview of the entire signal generation and amplification process of the new Mask Aligner controller.}}{76}{figure.caption.80}\protected@file@percent }
+\newlabel{fig:electronics_diagramm}{{4.10}{76}{Overview of the entire signal generation and amplification process of the new Mask Aligner controller}{figure.caption.80}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {D}Walker circuit diagrams}{76}{section.4.4}\protected@file@percent }
+\newlabel{app:circuit_electronics}{{D}{76}{Walker circuit diagrams}{section.4.4}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {E}Mask Aligner Walker Commands}{80}{section.4.5}\protected@file@percent }
+\newlabel{sec:appendix_walker}{{E}{80}{Mask Aligner Walker Commands}{section.4.5}{}}
+\@writefile{toc}{\contentsline {paragraph}{pulse?}{80}{section*.81}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{pol x}{80}{section*.82}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{amp x}{80}{section*.83}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{volt x}{80}{section*.84}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{channel x}{80}{section*.85}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{maxmstep x}{80}{section*.86}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{step x}{80}{section*.87}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{mstep x}{80}{section*.88}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{cancel}{81}{section*.89}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{help}{81}{section*.90}\protected@file@percent }
+\@writefile{toc}{\contentsline {section}{\numberline {F}Mask Aligner Walker Code}{81}{section.4.6}\protected@file@percent }
+\newlabel{sec:walker_code}{{F}{81}{Mask Aligner Walker Code}{section.4.6}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {G}Raycast Simulation}{92}{section.4.7}\protected@file@percent }
+\newlabel{sec:appendix_raycast}{{G}{92}{Raycast Simulation}{section.4.7}{}}
+\@writefile{toc}{\contentsline {paragraph}{radius\_1}{92}{section*.91}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{angle}{92}{section*.92}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{radius\_mask}{93}{section*.93}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{distance\_circle\_mask}{93}{section*.94}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{distance\_sample}{93}{section*.95}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{rays\_per\_frame}{93}{section*.96}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{running\_time}{93}{section*.97}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{deposition\_gain}{93}{section*.98}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{penalize\_deposition}{93}{section*.99}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{first\_layer\_deposition\_prob}{93}{section*.100}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{oscillation\_period}{93}{section*.101}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{delay\_oscill\_time}{93}{section*.102}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{save\_in\_progress\_images}{93}{section*.103}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{save\_intervall}{93}{section*.104}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{oscillation\_dir}{93}{section*.105}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{oscillation\_rot\_s}{93}{section*.106}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{oscillation\_rot\_e}{94}{section*.107}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{random\_seed}{94}{section*.108}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{x\_min, x\_max, y\_min, y\_max}{94}{section*.109}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{resolution}{94}{section*.110}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{path}{94}{section*.111}\protected@file@percent }
\@setckpt{appendix}{
-\setcounter{page}{97}
+\setcounter{page}{95}
\setcounter{equation}{1}
\setcounter{enumi}{4}
\setcounter{enumii}{0}
@@ -73,7 +73,7 @@
\setcounter{section@level}{4}
\setcounter{Item}{14}
\setcounter{Hfootnote}{1}
-\setcounter{bookmark@seq@number}{66}
+\setcounter{bookmark@seq@number}{65}
\setcounter{parentequation}{0}
\setcounter{FancyVerbLine}{0}
\setcounter{NAT@ctr}{25}
diff --git a/bibliography.aux b/bibliography.aux
index f2c0101d8f51bc4f2255fb6a12633f8177321b9a..04980b30cc833397c2e45fd8889b695b93f44798 100644
--- a/bibliography.aux
+++ b/bibliography.aux
@@ -14,7 +14,7 @@
\bibcite{tungsten_evaporation}{{10}{}{{}}{{}}}
\bibcite{afm_physics}{{11}{}{{}}{{}}}
\bibcite{afm_bio}{{12}{}{{}}{{}}}
-\@writefile{toc}{\contentsline {chapter}{Bibliography}{73}{chapter*.77}\protected@file@percent }
+\@writefile{toc}{\contentsline {chapter}{Bibliography}{71}{chapter*.75}\protected@file@percent }
\bibcite{SEM_image_01}{{13}{}{{}}{{}}}
\bibcite{SEM_image_02}{{14}{}{{}}{{}}}
\bibcite{SEM_book}{{15}{}{{}}{{}}}
@@ -29,7 +29,7 @@
\bibcite{Simon}{{24}{}{{}}{{}}}
\bibcite{grain_growth}{{25}{}{{}}{{}}}
\@setckpt{bibliography}{
-\setcounter{page}{76}
+\setcounter{page}{74}
\setcounter{equation}{1}
\setcounter{enumi}{4}
\setcounter{enumii}{0}
@@ -49,7 +49,7 @@
\setcounter{section@level}{2}
\setcounter{Item}{14}
\setcounter{Hfootnote}{1}
-\setcounter{bookmark@seq@number}{57}
+\setcounter{bookmark@seq@number}{56}
\setcounter{parentequation}{0}
\setcounter{FancyVerbLine}{0}
\setcounter{NAT@ctr}{25}
diff --git a/chap01.aux b/chap01.aux
index 90d66f5b0ab1fe787164b783e5b7f8d8024db71b..8ba4b51ffed9c58f581d2b6fa0ecb0784725d300 100644
--- a/chap01.aux
+++ b/chap01.aux
@@ -109,48 +109,39 @@
\newlabel{sub@fig:approach_curve_example_full}{{e}{24}{\relax }{figure.caption.22}{}}
\@writefile{lof}{\contentsline {figure}{\numberline {1.18}{\ignorespaces (a) capacitance (approach) curve. (b) difference of each capacitance value. Only one sensor is shown. Marked with blue dashed lines are the important points where the slope of the $\frac {1}{r}$ curve changes. Below are images of the geometry between mask and sample at First (c), Second (d) and Full contact (e). Red lines or points indicate where the mask is touching the sample.}}{24}{figure.caption.22}\protected@file@percent }
\newlabel{fig:approach_curve_example}{{1.18}{24}{(a) capacitance (approach) curve. (b) difference of each capacitance value. Only one sensor is shown. Marked with blue dashed lines are the important points where the slope of the $\frac {1}{r}$ curve changes. Below are images of the geometry between mask and sample at First (c), Second (d) and Full contact (e). Red lines or points indicate where the mask is touching the sample}{figure.caption.22}{}}
-\citation{Beeker}
-\@writefile{toc}{\contentsline {subsection}{\numberline {1.5.5}Reproducibility}{25}{subsection.1.5.5}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsubsection}{Reproducibility when removing sample/mask}{25}{section*.23}\protected@file@percent }
-\newlabel{fig:approach_replicability_cap}{{1.19a}{25}{\relax }{figure.caption.24}{}}
-\newlabel{sub@fig:approach_replicability_cap}{{a}{25}{\relax }{figure.caption.24}{}}
-\newlabel{fig:approach_replicability_cap_diff}{{1.19b}{25}{\relax }{figure.caption.24}{}}
-\newlabel{sub@fig:approach_replicability_cap_diff}{{b}{25}{\relax }{figure.caption.24}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {1.19}{\ignorespaces (\subref {fig:approach_replicability_cap}) 3 subsequent approach curves. (\subref {fig:approach_replicability_cap_diff}) corresponding differences in capacitance. \textcolor {tab_green}{Green} is the initial curve. The \textcolor {tab_blue}{blue} curve is after sample has been carefully removed and reinserted. For the \textcolor {tab_red}{red} curve the mask was removed and reinserted. Larger fluctuations in the signal visible on the \textcolor {tab_blue}{Blue} curve are due to an accidental change in time constant of the LockIn Amplifier.}}{25}{figure.caption.24}\protected@file@percent }
-\newlabel{fig:approach_replicability}{{1.19}{25}{(\subref {fig:approach_replicability_cap}) 3 subsequent approach curves. (\subref {fig:approach_replicability_cap_diff}) corresponding differences in capacitance. \textcolor {tab_green}{Green} is the initial curve. The \textcolor {tab_blue}{blue} curve is after sample has been carefully removed and reinserted. For the \textcolor {tab_red}{red} curve the mask was removed and reinserted. Larger fluctuations in the signal visible on the \textcolor {tab_blue}{Blue} curve are due to an accidental change in time constant of the LockIn Amplifier}{figure.caption.24}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {1.6}Mask Aligner operation}{26}{section.1.6}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {1.6.1}Sample preparation}{26}{subsection.1.6.1}\protected@file@percent }
-\newlabel{sec:sample_prep}{{1.6.1}{26}{Sample preparation}{subsection.1.6.1}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {1.7}Measurement techniques}{27}{section.1.7}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {1.7.1}Atomic Force Microscopy}{27}{subsection.1.7.1}\protected@file@percent }
-\@writefile{lof}{\contentsline {figure}{\numberline {1.20}{\ignorespaces Diagram showing the configuration of an AFM with the tip in contact with the sample. Arrows indicate movement directions.}}{28}{figure.caption.25}\protected@file@percent }
-\newlabel{fig:afm_principle}{{1.20}{28}{Diagram showing the configuration of an AFM with the tip in contact with the sample. Arrows indicate movement directions}{figure.caption.25}{}}
-\@writefile{toc}{\contentsline {subsubsection}{Modes}{28}{section*.26}\protected@file@percent }
-\@writefile{lof}{\contentsline {figure}{\numberline {1.21}{\ignorespaces Schematic diagram of the Lennart Jones potential governing the interaction between tip and sample in an AFM. The 3 areas of the AFM Modes are marked \textcolor {tab_green}{contact}, \textcolor {tab_blue}{tapping} and \textcolor {tab_red}{non-contact}. These regions are approximate. Units on both axes are arbitrary.}}{29}{figure.caption.27}\protected@file@percent }
-\newlabel{fig:afm_potential}{{1.21}{29}{Schematic diagram of the Lennart Jones potential governing the interaction between tip and sample in an AFM. The 3 areas of the AFM Modes are marked \textcolor {tab_green}{contact}, \textcolor {tab_blue}{tapping} and \textcolor {tab_red}{non-contact}. These regions are approximate. Units on both axes are arbitrary}{figure.caption.27}{}}
-\@writefile{toc}{\contentsline {paragraph}{Contact}{29}{section*.28}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{Non-Contact}{29}{section*.29}\protected@file@percent }
+\@writefile{toc}{\contentsline {section}{\numberline {1.6}Mask Aligner operation}{25}{section.1.6}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {1.6.1}Sample preparation}{25}{subsection.1.6.1}\protected@file@percent }
+\newlabel{sec:sample_prep}{{1.6.1}{25}{Sample preparation}{subsection.1.6.1}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {1.7}Measurement techniques}{26}{section.1.7}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {1.7.1}Atomic Force Microscopy}{26}{subsection.1.7.1}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {1.19}{\ignorespaces Diagram showing the configuration of an AFM with the tip in contact with the sample. Arrows indicate movement directions.}}{26}{figure.caption.23}\protected@file@percent }
+\newlabel{fig:afm_principle}{{1.19}{26}{Diagram showing the configuration of an AFM with the tip in contact with the sample. Arrows indicate movement directions}{figure.caption.23}{}}
+\@writefile{toc}{\contentsline {subsubsection}{Modes}{27}{section*.24}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {1.20}{\ignorespaces Schematic diagram of the Lennart Jones potential governing the interaction between tip and sample in an AFM. The 3 areas of the AFM Modes are marked \textcolor {tab_green}{contact}, \textcolor {tab_blue}{tapping} and \textcolor {tab_red}{non-contact}. These regions are approximate. Units on both axes are arbitrary.}}{27}{figure.caption.25}\protected@file@percent }
+\newlabel{fig:afm_potential}{{1.20}{27}{Schematic diagram of the Lennart Jones potential governing the interaction between tip and sample in an AFM. The 3 areas of the AFM Modes are marked \textcolor {tab_green}{contact}, \textcolor {tab_blue}{tapping} and \textcolor {tab_red}{non-contact}. These regions are approximate. Units on both axes are arbitrary}{figure.caption.25}{}}
+\@writefile{toc}{\contentsline {paragraph}{Contact}{27}{section*.26}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{Non-Contact}{27}{section*.27}\protected@file@percent }
\citation{afm_physics,afm_bio}
\citation{SEM_image_01}
\citation{SEM_image_02}
\citation{SEM_image_01}
\citation{SEM_image_02}
-\@writefile{toc}{\contentsline {paragraph}{Tapping}{30}{section*.30}\protected@file@percent }
-\@writefile{tdo}{\contentsline {todo}{Check this again}{30}{section*.31}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {1.7.2}Scanning Electron Microscopy}{30}{subsection.1.7.2}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{Tapping}{28}{section*.28}\protected@file@percent }
+\@writefile{tdo}{\contentsline {todo}{Check this again}{28}{section*.29}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {1.7.2}Scanning Electron Microscopy}{28}{subsection.1.7.2}\protected@file@percent }
\citation{SEM_book}
\citation{SEM_book}
\citation{SEM_book}
\citation{SEM_book}
-\newlabel{fig:sem_setup_beam}{{1.22a}{31}{\relax }{figure.caption.32}{}}
-\newlabel{sub@fig:sem_setup_beam}{{a}{31}{\relax }{figure.caption.32}{}}
-\newlabel{fig:sem_setup_interaction}{{1.22b}{31}{\relax }{figure.caption.32}{}}
-\newlabel{sub@fig:sem_setup_interaction}{{b}{31}{\relax }{figure.caption.32}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {1.22}{\ignorespaces The beam path for an SEM (\subref {fig:sem_setup_beam}). The three detectors used in an SEM are shown near the bottom of the image. The secondary electron detector (Everhard-Thornley) and the back scattering and X-ray detector. A diagram showing electron matter interactions (\subref {fig:sem_setup_interaction}). The green area represents the penetration depth into the sample at which the different signals can be detected. Images were taken from~\cite {SEM_image_01} and ~\cite {SEM_image_02}.}}{31}{figure.caption.32}\protected@file@percent }
-\newlabel{fig:sem_setup}{{1.22}{31}{The beam path for an SEM (\subref {fig:sem_setup_beam}). The three detectors used in an SEM are shown near the bottom of the image. The secondary electron detector (Everhard-Thornley) and the back scattering and X-ray detector. A diagram showing electron matter interactions (\subref {fig:sem_setup_interaction}). The green area represents the penetration depth into the sample at which the different signals can be detected. Images were taken from~\cite {SEM_image_01} and ~\cite {SEM_image_02}}{figure.caption.32}{}}
+\newlabel{fig:sem_setup_beam}{{1.21a}{29}{\relax }{figure.caption.30}{}}
+\newlabel{sub@fig:sem_setup_beam}{{a}{29}{\relax }{figure.caption.30}{}}
+\newlabel{fig:sem_setup_interaction}{{1.21b}{29}{\relax }{figure.caption.30}{}}
+\newlabel{sub@fig:sem_setup_interaction}{{b}{29}{\relax }{figure.caption.30}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {1.21}{\ignorespaces The beam path for an SEM (\subref {fig:sem_setup_beam}). The three detectors used in an SEM are shown near the bottom of the image. The secondary electron detector (Everhard-Thornley) and the back scattering and X-ray detector. A diagram showing electron matter interactions (\subref {fig:sem_setup_interaction}). The green area represents the penetration depth into the sample at which the different signals can be detected. Images were taken from~\cite {SEM_image_01} and ~\cite {SEM_image_02}.}}{29}{figure.caption.30}\protected@file@percent }
+\newlabel{fig:sem_setup}{{1.21}{29}{The beam path for an SEM (\subref {fig:sem_setup_beam}). The three detectors used in an SEM are shown near the bottom of the image. The secondary electron detector (Everhard-Thornley) and the back scattering and X-ray detector. A diagram showing electron matter interactions (\subref {fig:sem_setup_interaction}). The green area represents the penetration depth into the sample at which the different signals can be detected. Images were taken from~\cite {SEM_image_01} and ~\cite {SEM_image_02}}{figure.caption.30}{}}
\citation{self_epitaxy}
\@setckpt{chap01}{
-\setcounter{page}{33}
+\setcounter{page}{31}
\setcounter{equation}{3}
\setcounter{enumi}{10}
\setcounter{enumii}{0}
@@ -165,12 +156,12 @@
\setcounter{subsubsection}{0}
\setcounter{paragraph}{0}
\setcounter{subparagraph}{0}
-\setcounter{figure}{22}
+\setcounter{figure}{21}
\setcounter{table}{0}
\setcounter{section@level}{2}
\setcounter{Item}{10}
\setcounter{Hfootnote}{1}
-\setcounter{bookmark@seq@number}{18}
+\setcounter{bookmark@seq@number}{17}
\setcounter{parentequation}{0}
\setcounter{FancyVerbLine}{0}
\setcounter{NAT@ctr}{0}
diff --git a/chap02.tex b/chap02.tex
index b3b4b94da2137be45c3a79736eaf6558d9d76ceb..d55e4080cef6d98a0c29ea28494182d3eb108482 100644
--- a/chap02.tex
+++ b/chap02.tex
@@ -401,13 +401,13 @@ The difference in capacitance increases monotonically. Upon any contact the step
%The values increase monotonically, when however the slope changes, the difference will suddenly drop (Figure \ref{fig:approach_curve_example_cap_diff}). When
%the peak value of this graph is known one can predict the contact before it happens and stop the approach before the sample is contacted. This peak value can be used to define a "stop condition". The stop condition has to be determined using a calibration approach. In practice the stop condition has to be chosen a few steps before the peak due to noise. \\
-Absolute distance can still not be measured since upon retraction and subsequent
-approach, the capacitance values drop. This is either due to accumulation of
-misalignement from tilting and/or
-accumulation of particles on the sample/mask surface.
-In order to still get replicable alignment, the difference of
-capacitance is used.
-%The stop condition is used to determine good alignment~\cite{Beeker}.
+%Absolute distance can still not be measured since upon retraction and subsequent
+%approach, the capacitance values drop. This is either due to accumulation of
+%misalignement from tilting and/or
+%accumulation of particles on the sample/mask surface.
+%In order to still get replicable alignment, the difference of
+%capacitance is used.
+%%The stop condition is used to determine good alignment~\cite{Beeker}.
%\begin{figure}[H]
% \centering
@@ -419,36 +419,36 @@ capacitance is used.
% \label{fig:approach_subsequent}
%\end{figure}
-\subsection{Reproducibility}
-Reproducibility of approach curves with regard to different samples and masks is important for the future use of the Mask Aligner. In the master thesis of Jonas Beeker the
-reproducibility of different masks, different locations, different approaches
-and a comparison before and after evaporation were discussed~\cite{Beeker}.
-
-\subsubsection{Reproducibility when removing sample/mask}
-
-One question concerning reproducibility is whether the approach curve is strongly affected by the exchange of mask or sample, or even just the reinsertion of mask or sample. This can be used to perform a calibration approach curve on one sample and exchange the sample for another. This potentially allows for the evaporation on samples, which were never put into contact with a mask.
-
-\begin{figure}[H]
- \centering
- \begin{subfigure}{0.495\textwidth}
- \includegraphics[width=\linewidth]{img/MA/InsertionReproducibility.pdf}
- \caption{}
- \label{fig:approach_replicability_cap}
- \end{subfigure}
- \begin{subfigure}{0.495\textwidth}
- \includegraphics[width=\linewidth]{img/MA/InsertionReproducibility_diff.pdf}
- \caption{}
- \label{fig:approach_replicability_cap_diff}
- \end{subfigure}
- \caption{(\subref{fig:approach_replicability_cap}) 3 subsequent approach curves. (\subref{fig:approach_replicability_cap_diff}) corresponding differences in capacitance. \textcolor{tab_green}{Green} is the initial curve. The \textcolor{tab_blue}{blue} curve is after sample has been carefully removed and reinserted. For the \textcolor{tab_red}{red} curve the mask was removed and reinserted. Larger fluctuations in the signal visible on the \textcolor{tab_blue}{Blue} curve are due to an accidental change in time constant of the LockIn Amplifier.}
- \label{fig:approach_replicability}
-\end{figure}
-
-Reinserting the mask, the approach curve changed drastically, which can likely be attributed to newly induced tilt on the mask. This can be seen in the shift between the \textcolor{tab_green}{green} and \textcolor{tab_red}{red} curves in Figure \ref{fig:approach_replicability}.
-
-Another reason might be small movement of the mask frame on the \ce{Nd} magnets tilting the mask. This problem cannot be fixed without a complete redesign of the Mask Aligner. \\
-
-Reinserting the sample also induced a difference in approach curves, but this difference is much smaller as can be seen in Figure \ref{fig:approach_replicability} (\textcolor{tab_blue}{blue} and \textcolor{tab_green}{green}). The trend of the curve remains the same, but the absolute value changes slightly. However, the peak in $dC$ changed significantly. A stop condition determined on the \textcolor{tab_green}{green} curve (for example $0.04$ pF) would overshoot the point of first contact on the \textcolor{tab_blue}{blue} curve. This means that after switching a conservative stop condition has to be chosen. \\
+%\subsection{Reproducibility}
+%Reproducibility of approach curves with regard to different samples and masks is important for the future use of the Mask Aligner. In the master thesis of Jonas Beeker the
+%reproducibility of different masks, different locations, different approaches
+%and a comparison before and after evaporation were discussed~\cite{Beeker}.
+%
+%\subsubsection{Reproducibility when removing sample/mask}
+%
+%One question concerning reproducibility is whether the approach curve is strongly affected by the exchange of mask or sample, or even just the reinsertion of mask or sample. This can be used to perform a calibration approach curve on one sample and exchange the sample for another. This potentially allows for the evaporation on samples, which were never put into contact with a mask.
+%
+%\begin{figure}[H]
+% \centering
+% \begin{subfigure}{0.495\textwidth}
+% \includegraphics[width=\linewidth]{img/MA/InsertionReproducibility.pdf}
+% \caption{}
+% \label{fig:approach_replicability_cap}
+% \end{subfigure}
+% \begin{subfigure}{0.495\textwidth}
+% \includegraphics[width=\linewidth]{img/MA/InsertionReproducibility_diff.pdf}
+% \caption{}
+% \label{fig:approach_replicability_cap_diff}
+% \end{subfigure}
+% \caption{(\subref{fig:approach_replicability_cap}) 3 subsequent approach curves. (\subref{fig:approach_replicability_cap_diff}) corresponding differences in capacitance. \textcolor{tab_green}{Green} is the initial curve. The \textcolor{tab_blue}{blue} curve is after sample has been carefully removed and reinserted. For the \textcolor{tab_red}{red} curve the mask was removed and reinserted. Larger fluctuations in the signal visible on the \textcolor{tab_blue}{Blue} curve are due to an accidental change in time constant of the LockIn Amplifier.}
+% \label{fig:approach_replicability}
+%\end{figure}
+%
+%Reinserting the mask, the approach curve changed drastically, which can likely be attributed to newly induced tilt on the mask. This can be seen in the shift between the \textcolor{tab_green}{green} and \textcolor{tab_red}{red} curves in Figure \ref{fig:approach_replicability}.
+%
+%Another reason might be small movement of the mask frame on the \ce{Nd} magnets tilting the mask. This problem cannot be fixed without a complete redesign of the Mask Aligner. \\
+%
+%Reinserting the sample also induced a difference in approach curves, but this difference is much smaller as can be seen in Figure \ref{fig:approach_replicability} (\textcolor{tab_blue}{blue} and \textcolor{tab_green}{green}). The trend of the curve remains the same, but the absolute value changes slightly. However, the peak in $dC$ changed significantly. A stop condition determined on the \textcolor{tab_green}{green} curve (for example $0.04$ pF) would overshoot the point of first contact on the \textcolor{tab_blue}{blue} curve. This means that after switching a conservative stop condition has to be chosen. \\
%
%\subsection{Capacitance correlations} \label{subsec:cross_cap}
diff --git a/chap03.aux b/chap03.aux
index 412beefa7805d0f0a077aa8c0db1fff4e8ce9fb5..f706e3c8f1d245534f2a8b7d1629f9797665faf6 100644
--- a/chap03.aux
+++ b/chap03.aux
@@ -1,77 +1,77 @@
\relax
\providecommand\hyper@newdestlabel[2]{}
-\@writefile{toc}{\contentsline {chapter}{\numberline {4}Electronics}{62}{chapter.4}\protected@file@percent }
+\@writefile{toc}{\contentsline {chapter}{\numberline {4}Electronics}{60}{chapter.4}\protected@file@percent }
\@writefile{lof}{\addvspace {10\p@ }}
\@writefile{lot}{\addvspace {10\p@ }}
-\@writefile{toc}{\contentsline {section}{\numberline {4.1}RHK piezo motor controller}{62}{section.4.1}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.1.1}Overview}{62}{subsection.4.1.1}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{amplitude}{62}{section*.58}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{sweep period}{62}{section*.59}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{time between sweeps}{62}{section*.60}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.1.2}Pulse shape}{62}{subsection.4.1.2}\protected@file@percent }
-\newlabel{fig:RHK_pulse_shape_approach}{{4.1a}{62}{\relax }{figure.caption.61}{}}
-\newlabel{sub@fig:RHK_pulse_shape_approach}{{a}{62}{\relax }{figure.caption.61}{}}
-\newlabel{fig:RHK_pulse_shape_retract}{{4.1b}{62}{\relax }{figure.caption.61}{}}
-\newlabel{sub@fig:RHK_pulse_shape_retract}{{b}{62}{\relax }{figure.caption.61}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {4.1}{\ignorespaces Oscilloscope data showing both an approach step (\subref {fig:RHK_pulse_shape_approach}) and a retract step (\subref {fig:RHK_pulse_shape_retract}) for the RHK Piezo motor controller given at a voltage of $80$ V, as specified per setting. }}{62}{figure.caption.61}\protected@file@percent }
-\newlabel{fig:RHK_pulse_shape}{{4.1}{62}{Oscilloscope data showing both an approach step (\subref {fig:RHK_pulse_shape_approach}) and a retract step (\subref {fig:RHK_pulse_shape_retract}) for the RHK Piezo motor controller given at a voltage of $80$ V, as specified per setting}{figure.caption.61}{}}
-\newlabel{fig:RHK_pulse_shape_fast_flank_z1}{{4.2a}{63}{\relax }{figure.caption.62}{}}
-\newlabel{sub@fig:RHK_pulse_shape_fast_flank_z1}{{a}{63}{\relax }{figure.caption.62}{}}
-\newlabel{fig:RHK_pulse_shape_fast_flank_z2}{{4.2b}{63}{\relax }{figure.caption.62}{}}
-\newlabel{sub@fig:RHK_pulse_shape_fast_flank_z2}{{b}{63}{\relax }{figure.caption.62}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {4.2}{\ignorespaces Plots showing the fast flank of the RHK signal, set to 80 V. (\subref {fig:RHK_pulse_shape_fast_flank_z1}) larger timescale of (\subref {fig:RHK_pulse_shape_fast_flank_z2}).}}{63}{figure.caption.62}\protected@file@percent }
-\newlabel{fig:RHK_pulse_shape_fast_flank}{{4.2}{63}{Plots showing the fast flank of the RHK signal, set to 80 V. (\subref {fig:RHK_pulse_shape_fast_flank_z1}) larger timescale of (\subref {fig:RHK_pulse_shape_fast_flank_z2})}{figure.caption.62}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {4.2}KIM001}{63}{section.4.2}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.2.1}Overview}{63}{subsection.4.2.1}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.2.2}Pulse shape}{63}{subsection.4.2.2}\protected@file@percent }
-\newlabel{fig:kim0001_pulse_shape_approach}{{4.3a}{64}{\relax }{figure.caption.63}{}}
-\newlabel{sub@fig:kim0001_pulse_shape_approach}{{a}{64}{\relax }{figure.caption.63}{}}
-\newlabel{fig:kim0001_pulse_shape_retract}{{4.3b}{64}{\relax }{figure.caption.63}{}}
-\newlabel{sub@fig:kim0001_pulse_shape_retract}{{b}{64}{\relax }{figure.caption.63}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {4.3}{\ignorespaces Approach step (\subref {fig:kim0001_pulse_shape_approach}) and a retract step (\subref {fig:kim0001_pulse_shape_retract}) for the KIM001 device. Flatness of curve is not due to oscilloscope saturation. }}{64}{figure.caption.63}\protected@file@percent }
-\newlabel{fig:kim0001_pulse_shape}{{4.3}{64}{Approach step (\subref {fig:kim0001_pulse_shape_approach}) and a retract step (\subref {fig:kim0001_pulse_shape_retract}) for the KIM001 device. Flatness of curve is not due to oscilloscope saturation}{figure.caption.63}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.2.3}Voltage behavior}{64}{subsection.4.2.3}\protected@file@percent }
+\@writefile{toc}{\contentsline {section}{\numberline {4.1}RHK piezo motor controller}{60}{section.4.1}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.1.1}Overview}{60}{subsection.4.1.1}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{amplitude}{60}{section*.56}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{sweep period}{60}{section*.57}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{time between sweeps}{60}{section*.58}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.1.2}Pulse shape}{60}{subsection.4.1.2}\protected@file@percent }
+\newlabel{fig:RHK_pulse_shape_approach}{{4.1a}{60}{\relax }{figure.caption.59}{}}
+\newlabel{sub@fig:RHK_pulse_shape_approach}{{a}{60}{\relax }{figure.caption.59}{}}
+\newlabel{fig:RHK_pulse_shape_retract}{{4.1b}{60}{\relax }{figure.caption.59}{}}
+\newlabel{sub@fig:RHK_pulse_shape_retract}{{b}{60}{\relax }{figure.caption.59}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {4.1}{\ignorespaces Oscilloscope data showing both an approach step (\subref {fig:RHK_pulse_shape_approach}) and a retract step (\subref {fig:RHK_pulse_shape_retract}) for the RHK Piezo motor controller given at a voltage of $80$ V, as specified per setting. }}{60}{figure.caption.59}\protected@file@percent }
+\newlabel{fig:RHK_pulse_shape}{{4.1}{60}{Oscilloscope data showing both an approach step (\subref {fig:RHK_pulse_shape_approach}) and a retract step (\subref {fig:RHK_pulse_shape_retract}) for the RHK Piezo motor controller given at a voltage of $80$ V, as specified per setting}{figure.caption.59}{}}
+\newlabel{fig:RHK_pulse_shape_fast_flank_z1}{{4.2a}{61}{\relax }{figure.caption.60}{}}
+\newlabel{sub@fig:RHK_pulse_shape_fast_flank_z1}{{a}{61}{\relax }{figure.caption.60}{}}
+\newlabel{fig:RHK_pulse_shape_fast_flank_z2}{{4.2b}{61}{\relax }{figure.caption.60}{}}
+\newlabel{sub@fig:RHK_pulse_shape_fast_flank_z2}{{b}{61}{\relax }{figure.caption.60}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {4.2}{\ignorespaces Plots showing the fast flank of the RHK signal, set to 80 V. (\subref {fig:RHK_pulse_shape_fast_flank_z1}) larger timescale of (\subref {fig:RHK_pulse_shape_fast_flank_z2}).}}{61}{figure.caption.60}\protected@file@percent }
+\newlabel{fig:RHK_pulse_shape_fast_flank}{{4.2}{61}{Plots showing the fast flank of the RHK signal, set to 80 V. (\subref {fig:RHK_pulse_shape_fast_flank_z1}) larger timescale of (\subref {fig:RHK_pulse_shape_fast_flank_z2})}{figure.caption.60}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {4.2}KIM001}{61}{section.4.2}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.2.1}Overview}{61}{subsection.4.2.1}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.2.2}Pulse shape}{61}{subsection.4.2.2}\protected@file@percent }
+\newlabel{fig:kim0001_pulse_shape_approach}{{4.3a}{62}{\relax }{figure.caption.61}{}}
+\newlabel{sub@fig:kim0001_pulse_shape_approach}{{a}{62}{\relax }{figure.caption.61}{}}
+\newlabel{fig:kim0001_pulse_shape_retract}{{4.3b}{62}{\relax }{figure.caption.61}{}}
+\newlabel{sub@fig:kim0001_pulse_shape_retract}{{b}{62}{\relax }{figure.caption.61}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {4.3}{\ignorespaces Approach step (\subref {fig:kim0001_pulse_shape_approach}) and a retract step (\subref {fig:kim0001_pulse_shape_retract}) for the KIM001 device. Flatness of curve is not due to oscilloscope saturation. }}{62}{figure.caption.61}\protected@file@percent }
+\newlabel{fig:kim0001_pulse_shape}{{4.3}{62}{Approach step (\subref {fig:kim0001_pulse_shape_approach}) and a retract step (\subref {fig:kim0001_pulse_shape_retract}) for the KIM001 device. Flatness of curve is not due to oscilloscope saturation}{figure.caption.61}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.2.3}Voltage behavior}{62}{subsection.4.2.3}\protected@file@percent }
\citation{arduino_datasheet}
\citation{arduino_cpu_datasheet}
-\@writefile{lof}{\contentsline {figure}{\numberline {4.4}{\ignorespaces Retract steps of the KIM0001 for a set Voltage of $125$ after different amount of steps. The voltage spikes beyond the desired voltage at the start and after $200$ steps settles on a voltage of ~$118$ V. }}{65}{figure.caption.64}\protected@file@percent }
-\newlabel{fig:kim0001_voltage_behaviour}{{4.4}{65}{Retract steps of the KIM0001 for a set Voltage of $125$ after different amount of steps. The voltage spikes beyond the desired voltage at the start and after $200$ steps settles on a voltage of ~$118$ V}{figure.caption.64}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {4.3}Mask Aligner controller "Walker"}{65}{section.4.3}\protected@file@percent }
-\newlabel{sec:walker}{{4.3}{65}{Mask Aligner controller "Walker"}{section.4.3}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.1}Overview}{65}{subsection.4.3.1}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.2}Signal generation}{65}{subsection.4.3.2}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {4.4}{\ignorespaces Retract steps of the KIM0001 for a set Voltage of $125$ after different amount of steps. The voltage spikes beyond the desired voltage at the start and after $200$ steps settles on a voltage of ~$118$ V. }}{63}{figure.caption.62}\protected@file@percent }
+\newlabel{fig:kim0001_voltage_behaviour}{{4.4}{63}{Retract steps of the KIM0001 for a set Voltage of $125$ after different amount of steps. The voltage spikes beyond the desired voltage at the start and after $200$ steps settles on a voltage of ~$118$ V}{figure.caption.62}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {4.3}Mask Aligner controller "Walker"}{63}{section.4.3}\protected@file@percent }
+\newlabel{sec:walker}{{4.3}{63}{Mask Aligner controller "Walker"}{section.4.3}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.1}Overview}{63}{subsection.4.3.1}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.2}Signal generation}{63}{subsection.4.3.2}\protected@file@percent }
\citation{switch_datasheet}
-\newlabel{fig:bessel_filter_unfiltered}{{4.5a}{66}{\relax }{figure.caption.65}{}}
-\newlabel{sub@fig:bessel_filter_unfiltered}{{a}{66}{\relax }{figure.caption.65}{}}
-\newlabel{fig:bessel_filter_filter}{{4.5b}{66}{\relax }{figure.caption.65}{}}
-\newlabel{sub@fig:bessel_filter_filter}{{b}{66}{\relax }{figure.caption.65}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {4.5}{\ignorespaces (a) aliased simulated signal. (b) 8th order Bessel filtered simulated signal. The amount of aliasing is exaggerated to make the effect more clear. }}{66}{figure.caption.65}\protected@file@percent }
-\newlabel{fig:bessel_filter}{{4.5}{66}{(a) aliased simulated signal. (b) 8th order Bessel filtered simulated signal. The amount of aliasing is exaggerated to make the effect more clear}{figure.caption.65}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.3}Fast flank}{66}{subsection.4.3.3}\protected@file@percent }
-\newlabel{fig:signal_switch_entry}{{4.6a}{67}{\relax }{figure.caption.66}{}}
-\newlabel{sub@fig:signal_switch_entry}{{a}{67}{\relax }{figure.caption.66}{}}
-\newlabel{fig:signal_switch_switched}{{4.6b}{67}{\relax }{figure.caption.66}{}}
-\newlabel{sub@fig:signal_switch_switched}{{b}{67}{\relax }{figure.caption.66}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {4.6}{\ignorespaces (a) normal and the inverted signal. (b) the signal achieved by switching between normal and inverted. }}{67}{figure.caption.66}\protected@file@percent }
-\newlabel{fig:signal_switch}{{4.6}{67}{(a) normal and the inverted signal. (b) the signal achieved by switching between normal and inverted}{figure.caption.66}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.4}Amplification}{67}{subsection.4.3.4}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.5}Programming}{68}{subsection.4.3.5}\protected@file@percent }
-\newlabel{sec:software}{{4.3.5}{68}{Programming}{subsection.4.3.5}{}}
-\@writefile{toc}{\contentsline {subsubsection}{Parameters}{68}{section*.67}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{Amplitude (amp)}{68}{section*.68}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{Voltage (volt)}{68}{section*.69}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{Channel}{68}{section*.70}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{Max Step}{68}{section*.71}\protected@file@percent }
-\@writefile{toc}{\contentsline {paragraph}{Polarity}{68}{section*.72}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.6}Measured pulse shape}{68}{subsection.4.3.6}\protected@file@percent }
-\@writefile{lof}{\contentsline {figure}{\numberline {4.7}{\ignorespaces (a) approach step and a (b) retract step for the new Walker device \textcolor {tab_red}{(red)} and for comparison the RHK in \textcolor {tab_blue}{(blue)} in an unloaded state for a nominal voltage of 80 V. The dashed \textcolor {tab_green}{green} lines show a timeframe of 1000 $\mu $s around the fast flank, which should be the length of 1 pulse exactly.}}{69}{figure.caption.73}\protected@file@percent }
-\newlabel{fig:walker_pulse_shape_slow}{{4.7}{69}{(a) approach step and a (b) retract step for the new Walker device \textcolor {tab_red}{(red)} and for comparison the RHK in \textcolor {tab_blue}{(blue)} in an unloaded state for a nominal voltage of 80 V. The dashed \textcolor {tab_green}{green} lines show a timeframe of 1000 $\mu $s around the fast flank, which should be the length of 1 pulse exactly}{figure.caption.73}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {4.8}{\ignorespaces Plots showing the fast Flank of the Walker Signal and the fast flank of the RHK Signal, for both (a) approach and (b) retract, for a nominal voltage of 80 V (without load). }}{70}{figure.caption.74}\protected@file@percent }
-\newlabel{fig:walker_pulse_shape_fast}{{4.8}{70}{Plots showing the fast Flank of the Walker Signal and the fast flank of the RHK Signal, for both (a) approach and (b) retract, for a nominal voltage of 80 V (without load)}{figure.caption.74}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.7}Operation with the Mask Aligner}{70}{subsection.4.3.7}\protected@file@percent }
-\@writefile{lof}{\contentsline {figure}{\numberline {4.9}{\ignorespaces Diagram showing how communication with the Walker and the Lock-in amplifier is done and how they interact with elements in vacuum. Red lines are input, black lines are output lines. The capacitance relay is used to measure $C_i$ in order. }}{71}{figure.caption.75}\protected@file@percent }
-\newlabel{fig:diagram_MA_circ_walker}{{4.9}{71}{Diagram showing how communication with the Walker and the Lock-in amplifier is done and how they interact with elements in vacuum. Red lines are input, black lines are output lines. The capacitance relay is used to measure $C_i$ in order}{figure.caption.75}{}}
+\newlabel{fig:bessel_filter_unfiltered}{{4.5a}{64}{\relax }{figure.caption.63}{}}
+\newlabel{sub@fig:bessel_filter_unfiltered}{{a}{64}{\relax }{figure.caption.63}{}}
+\newlabel{fig:bessel_filter_filter}{{4.5b}{64}{\relax }{figure.caption.63}{}}
+\newlabel{sub@fig:bessel_filter_filter}{{b}{64}{\relax }{figure.caption.63}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {4.5}{\ignorespaces (a) aliased simulated signal. (b) 8th order Bessel filtered simulated signal. The amount of aliasing is exaggerated to make the effect more clear. }}{64}{figure.caption.63}\protected@file@percent }
+\newlabel{fig:bessel_filter}{{4.5}{64}{(a) aliased simulated signal. (b) 8th order Bessel filtered simulated signal. The amount of aliasing is exaggerated to make the effect more clear}{figure.caption.63}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.3}Fast flank}{64}{subsection.4.3.3}\protected@file@percent }
+\newlabel{fig:signal_switch_entry}{{4.6a}{65}{\relax }{figure.caption.64}{}}
+\newlabel{sub@fig:signal_switch_entry}{{a}{65}{\relax }{figure.caption.64}{}}
+\newlabel{fig:signal_switch_switched}{{4.6b}{65}{\relax }{figure.caption.64}{}}
+\newlabel{sub@fig:signal_switch_switched}{{b}{65}{\relax }{figure.caption.64}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {4.6}{\ignorespaces (a) normal and the inverted signal. (b) the signal achieved by switching between normal and inverted. }}{65}{figure.caption.64}\protected@file@percent }
+\newlabel{fig:signal_switch}{{4.6}{65}{(a) normal and the inverted signal. (b) the signal achieved by switching between normal and inverted}{figure.caption.64}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.4}Amplification}{65}{subsection.4.3.4}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.5}Programming}{66}{subsection.4.3.5}\protected@file@percent }
+\newlabel{sec:software}{{4.3.5}{66}{Programming}{subsection.4.3.5}{}}
+\@writefile{toc}{\contentsline {subsubsection}{Parameters}{66}{section*.65}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{Amplitude (amp)}{66}{section*.66}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{Voltage (volt)}{66}{section*.67}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{Channel}{66}{section*.68}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{Max Step}{66}{section*.69}\protected@file@percent }
+\@writefile{toc}{\contentsline {paragraph}{Polarity}{66}{section*.70}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.6}Measured pulse shape}{66}{subsection.4.3.6}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {4.7}{\ignorespaces (a) approach step and a (b) retract step for the new Walker device \textcolor {tab_red}{(red)} and for comparison the RHK in \textcolor {tab_blue}{(blue)} in an unloaded state for a nominal voltage of 80 V. The dashed \textcolor {tab_green}{green} lines show a timeframe of 1000 $\mu $s around the fast flank, which should be the length of 1 pulse exactly.}}{67}{figure.caption.71}\protected@file@percent }
+\newlabel{fig:walker_pulse_shape_slow}{{4.7}{67}{(a) approach step and a (b) retract step for the new Walker device \textcolor {tab_red}{(red)} and for comparison the RHK in \textcolor {tab_blue}{(blue)} in an unloaded state for a nominal voltage of 80 V. The dashed \textcolor {tab_green}{green} lines show a timeframe of 1000 $\mu $s around the fast flank, which should be the length of 1 pulse exactly}{figure.caption.71}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {4.8}{\ignorespaces Plots showing the fast Flank of the Walker Signal and the fast flank of the RHK Signal, for both (a) approach and (b) retract, for a nominal voltage of 80 V (without load). }}{68}{figure.caption.72}\protected@file@percent }
+\newlabel{fig:walker_pulse_shape_fast}{{4.8}{68}{Plots showing the fast Flank of the Walker Signal and the fast flank of the RHK Signal, for both (a) approach and (b) retract, for a nominal voltage of 80 V (without load)}{figure.caption.72}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {4.3.7}Operation with the Mask Aligner}{68}{subsection.4.3.7}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {4.9}{\ignorespaces Diagram showing how communication with the Walker and the Lock-in amplifier is done and how they interact with elements in vacuum. Red lines are input, black lines are output lines. The capacitance relay is used to measure $C_i$ in order. }}{69}{figure.caption.73}\protected@file@percent }
+\newlabel{fig:diagram_MA_circ_walker}{{4.9}{69}{Diagram showing how communication with the Walker and the Lock-in amplifier is done and how they interact with elements in vacuum. Red lines are input, black lines are output lines. The capacitance relay is used to measure $C_i$ in order}{figure.caption.73}{}}
\@setckpt{chap03}{
-\setcounter{page}{72}
+\setcounter{page}{70}
\setcounter{equation}{1}
\setcounter{enumi}{4}
\setcounter{enumii}{0}
@@ -91,7 +91,7 @@
\setcounter{section@level}{2}
\setcounter{Item}{14}
\setcounter{Hfootnote}{1}
-\setcounter{bookmark@seq@number}{55}
+\setcounter{bookmark@seq@number}{54}
\setcounter{parentequation}{0}
\setcounter{FancyVerbLine}{0}
\setcounter{NAT@ctr}{0}
diff --git a/chap04.aux b/chap04.aux
index 0f0260fc9f03c6c0bf4e839693da09d12985d8f2..7a36e1f6af2bdab6efc5292ebbff5bded6382a88 100644
--- a/chap04.aux
+++ b/chap04.aux
@@ -1,86 +1,86 @@
\relax
\providecommand\hyper@newdestlabel[2]{}
\citation{Olschewski}
-\@writefile{toc}{\contentsline {chapter}{\numberline {2}Mask Aligner repairs and optimizations}{33}{chapter.2}\protected@file@percent }
+\@writefile{toc}{\contentsline {chapter}{\numberline {2}Mask Aligner repairs and optimizations}{31}{chapter.2}\protected@file@percent }
\@writefile{lof}{\addvspace {10\p@ }}
\@writefile{lot}{\addvspace {10\p@ }}
-\@writefile{toc}{\contentsline {section}{\numberline {2.1}Overview}{33}{section.2.1}\protected@file@percent }
-\newlabel{fig:Repair_Diagram_diagram}{{2.1a}{33}{\relax }{figure.caption.33}{}}
-\newlabel{sub@fig:Repair_Diagram_diagram}{{a}{33}{\relax }{figure.caption.33}{}}
-\newlabel{fig:Repair_Diagram_image}{{2.1b}{33}{\relax }{figure.caption.33}{}}
-\newlabel{sub@fig:Repair_Diagram_image}{{b}{33}{\relax }{figure.caption.33}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {2.1}{\ignorespaces (\subref {fig:Repair_Diagram_diagram}) diagram of front view of a single piezo motor with associated nomenclature. Front plate is turned around and moved to the side. (\subref {fig:Repair_Diagram_image}) a roughly corresponding image as a photo of the Mask Aligner. The lower right solder anchor is detached in the image and the lower left solder anchor is bridged with a technique discussed in Section \ref {ch:solder_anchors}}}{33}{figure.caption.33}\protected@file@percent }
-\newlabel{fig:Repair_Diagram}{{2.1}{33}{(\subref {fig:Repair_Diagram_diagram}) diagram of front view of a single piezo motor with associated nomenclature. Front plate is turned around and moved to the side. (\subref {fig:Repair_Diagram_image}) a roughly corresponding image as a photo of the Mask Aligner. The lower right solder anchor is detached in the image and the lower left solder anchor is bridged with a technique discussed in Section \ref {ch:solder_anchors}}{figure.caption.33}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {2.1}Overview}{31}{section.2.1}\protected@file@percent }
+\newlabel{fig:Repair_Diagram_diagram}{{2.1a}{31}{\relax }{figure.caption.31}{}}
+\newlabel{sub@fig:Repair_Diagram_diagram}{{a}{31}{\relax }{figure.caption.31}{}}
+\newlabel{fig:Repair_Diagram_image}{{2.1b}{31}{\relax }{figure.caption.31}{}}
+\newlabel{sub@fig:Repair_Diagram_image}{{b}{31}{\relax }{figure.caption.31}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {2.1}{\ignorespaces (\subref {fig:Repair_Diagram_diagram}) diagram of front view of a single piezo motor with associated nomenclature. Front plate is turned around and moved to the side. (\subref {fig:Repair_Diagram_image}) a roughly corresponding image as a photo of the Mask Aligner. The lower right solder anchor is detached in the image and the lower left solder anchor is bridged with a technique discussed in Section \ref {ch:solder_anchors}}}{31}{figure.caption.31}\protected@file@percent }
+\newlabel{fig:Repair_Diagram}{{2.1}{31}{(\subref {fig:Repair_Diagram_diagram}) diagram of front view of a single piezo motor with associated nomenclature. Front plate is turned around and moved to the side. (\subref {fig:Repair_Diagram_image}) a roughly corresponding image as a photo of the Mask Aligner. The lower right solder anchor is detached in the image and the lower left solder anchor is bridged with a technique discussed in Section \ref {ch:solder_anchors}}{figure.caption.31}{}}
\citation{torr_seal}
-\@writefile{toc}{\contentsline {section}{\numberline {2.2}General UHV device preparation}{34}{section.2.2}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {2.2.1}UHV compatible Soldering}{34}{subsection.2.2.1}\protected@file@percent }
-\@writefile{toc}{\contentsline {section}{\numberline {2.3}Soldering anchors}{34}{section.2.3}\protected@file@percent }
-\newlabel{ch:solder_anchors}{{2.3}{34}{Soldering anchors}{section.2.3}{}}
-\newlabel{fig:solder_anchors_diagram_base}{{2.2a}{35}{\relax }{figure.caption.34}{}}
-\newlabel{sub@fig:solder_anchors_diagram_base}{{a}{35}{\relax }{figure.caption.34}{}}
-\newlabel{fig:solder_anchors_diagram_SmallerDot}{{2.2b}{35}{\relax }{figure.caption.34}{}}
-\newlabel{sub@fig:solder_anchors_diagram_SmallerDot}{{b}{35}{\relax }{figure.caption.34}{}}
-\newlabel{fig:solder_anchors_diagram_AlO}{{2.2c}{35}{\relax }{figure.caption.34}{}}
-\newlabel{sub@fig:solder_anchors_diagram_AlO}{{c}{35}{\relax }{figure.caption.34}{}}
-\newlabel{fig:solder_anchors_diagram_GlueTop}{{2.2d}{35}{\relax }{figure.caption.34}{}}
-\newlabel{sub@fig:solder_anchors_diagram_GlueTop}{{d}{35}{\relax }{figure.caption.34}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {2.2}{\ignorespaces (\subref {fig:solder_anchors_diagram_base}) solder anchor interfering with the prism due to deterioration over time. (\subref {fig:solder_anchors_diagram_SmallerDot}) making the solder dot smaller. (\subref {fig:solder_anchors_diagram_AlO}) replacing the solder anchor ceramic with a much smaller \ce {Al2O3} plate. (\subref {fig:solder_anchors_diagram_GlueTop}) putting the anchor with glue on the top/bottom of the solder ceramic. The prism is depicted in blue, the cable in brown, black represents the Mask Aligner body, solder ceramic in yellow and solder in gray.}}{35}{figure.caption.34}\protected@file@percent }
-\newlabel{fig:solder_anchors_diagram}{{2.2}{35}{(\subref {fig:solder_anchors_diagram_base}) solder anchor interfering with the prism due to deterioration over time. (\subref {fig:solder_anchors_diagram_SmallerDot}) making the solder dot smaller. (\subref {fig:solder_anchors_diagram_AlO}) replacing the solder anchor ceramic with a much smaller \ce {Al2O3} plate. (\subref {fig:solder_anchors_diagram_GlueTop}) putting the anchor with glue on the top/bottom of the solder ceramic. The prism is depicted in blue, the cable in brown, black represents the Mask Aligner body, solder ceramic in yellow and solder in gray}{figure.caption.34}{}}
-\newlabel{fig:solder_anchors_examples_shear_01}{{2.3a}{36}{\relax }{figure.caption.35}{}}
-\newlabel{sub@fig:solder_anchors_examples_shear_01}{{a}{36}{\relax }{figure.caption.35}{}}
-\newlabel{fig:solder_anchors_examples_shear_02}{{2.3b}{36}{\relax }{figure.caption.35}{}}
-\newlabel{sub@fig:solder_anchors_examples_shear_02}{{b}{36}{\relax }{figure.caption.35}{}}
-\newlabel{fig:solder_anchors_examples_glue_bottom}{{2.3c}{36}{\relax }{figure.caption.35}{}}
-\newlabel{sub@fig:solder_anchors_examples_glue_bottom}{{c}{36}{\relax }{figure.caption.35}{}}
-\newlabel{fig:solder_anchors_examples_AlO}{{2.3d}{36}{\relax }{figure.caption.35}{}}
-\newlabel{sub@fig:solder_anchors_examples_AlO}{{d}{36}{\relax }{figure.caption.35}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {2.3}{\ignorespaces Examples of the different approaches taken to solve the issues with the solder anchor points. (\subref {fig:solder_anchors_examples_shear_01}) initial state of a solder ceramic interfering with the prism. (\subref {fig:solder_anchors_examples_shear_02}) solder ceramic from before after some of the solder was carefully taken off. (\subref {fig:solder_anchors_examples_glue_bottom}) a solder anchor attached to the bottom of a previously used solder ceramic. (\subref {fig:solder_anchors_examples_AlO}) replacement of a solder ceramic with a thinner \ce {Al2O3} plate. }}{36}{figure.caption.35}\protected@file@percent }
-\newlabel{fig:solder_anchors_examples}{{2.3}{36}{Examples of the different approaches taken to solve the issues with the solder anchor points. (\subref {fig:solder_anchors_examples_shear_01}) initial state of a solder ceramic interfering with the prism. (\subref {fig:solder_anchors_examples_shear_02}) solder ceramic from before after some of the solder was carefully taken off. (\subref {fig:solder_anchors_examples_glue_bottom}) a solder anchor attached to the bottom of a previously used solder ceramic. (\subref {fig:solder_anchors_examples_AlO}) replacement of a solder ceramic with a thinner \ce {Al2O3} plate}{figure.caption.35}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {2.2}General UHV device preparation}{32}{section.2.2}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {2.2.1}UHV compatible Soldering}{32}{subsection.2.2.1}\protected@file@percent }
+\@writefile{toc}{\contentsline {section}{\numberline {2.3}Soldering anchors}{32}{section.2.3}\protected@file@percent }
+\newlabel{ch:solder_anchors}{{2.3}{32}{Soldering anchors}{section.2.3}{}}
+\newlabel{fig:solder_anchors_diagram_base}{{2.2a}{33}{\relax }{figure.caption.32}{}}
+\newlabel{sub@fig:solder_anchors_diagram_base}{{a}{33}{\relax }{figure.caption.32}{}}
+\newlabel{fig:solder_anchors_diagram_SmallerDot}{{2.2b}{33}{\relax }{figure.caption.32}{}}
+\newlabel{sub@fig:solder_anchors_diagram_SmallerDot}{{b}{33}{\relax }{figure.caption.32}{}}
+\newlabel{fig:solder_anchors_diagram_AlO}{{2.2c}{33}{\relax }{figure.caption.32}{}}
+\newlabel{sub@fig:solder_anchors_diagram_AlO}{{c}{33}{\relax }{figure.caption.32}{}}
+\newlabel{fig:solder_anchors_diagram_GlueTop}{{2.2d}{33}{\relax }{figure.caption.32}{}}
+\newlabel{sub@fig:solder_anchors_diagram_GlueTop}{{d}{33}{\relax }{figure.caption.32}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {2.2}{\ignorespaces (\subref {fig:solder_anchors_diagram_base}) solder anchor interfering with the prism due to deterioration over time. (\subref {fig:solder_anchors_diagram_SmallerDot}) making the solder dot smaller. (\subref {fig:solder_anchors_diagram_AlO}) replacing the solder anchor ceramic with a much smaller \ce {Al2O3} plate. (\subref {fig:solder_anchors_diagram_GlueTop}) putting the anchor with glue on the top/bottom of the solder ceramic. The prism is depicted in blue, the cable in brown, black represents the Mask Aligner body, solder ceramic in yellow and solder in gray.}}{33}{figure.caption.32}\protected@file@percent }
+\newlabel{fig:solder_anchors_diagram}{{2.2}{33}{(\subref {fig:solder_anchors_diagram_base}) solder anchor interfering with the prism due to deterioration over time. (\subref {fig:solder_anchors_diagram_SmallerDot}) making the solder dot smaller. (\subref {fig:solder_anchors_diagram_AlO}) replacing the solder anchor ceramic with a much smaller \ce {Al2O3} plate. (\subref {fig:solder_anchors_diagram_GlueTop}) putting the anchor with glue on the top/bottom of the solder ceramic. The prism is depicted in blue, the cable in brown, black represents the Mask Aligner body, solder ceramic in yellow and solder in gray}{figure.caption.32}{}}
+\newlabel{fig:solder_anchors_examples_shear_01}{{2.3a}{34}{\relax }{figure.caption.33}{}}
+\newlabel{sub@fig:solder_anchors_examples_shear_01}{{a}{34}{\relax }{figure.caption.33}{}}
+\newlabel{fig:solder_anchors_examples_shear_02}{{2.3b}{34}{\relax }{figure.caption.33}{}}
+\newlabel{sub@fig:solder_anchors_examples_shear_02}{{b}{34}{\relax }{figure.caption.33}{}}
+\newlabel{fig:solder_anchors_examples_glue_bottom}{{2.3c}{34}{\relax }{figure.caption.33}{}}
+\newlabel{sub@fig:solder_anchors_examples_glue_bottom}{{c}{34}{\relax }{figure.caption.33}{}}
+\newlabel{fig:solder_anchors_examples_AlO}{{2.3d}{34}{\relax }{figure.caption.33}{}}
+\newlabel{sub@fig:solder_anchors_examples_AlO}{{d}{34}{\relax }{figure.caption.33}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {2.3}{\ignorespaces Examples of the different approaches taken to solve the issues with the solder anchor points. (\subref {fig:solder_anchors_examples_shear_01}) initial state of a solder ceramic interfering with the prism. (\subref {fig:solder_anchors_examples_shear_02}) solder ceramic from before after some of the solder was carefully taken off. (\subref {fig:solder_anchors_examples_glue_bottom}) a solder anchor attached to the bottom of a previously used solder ceramic. (\subref {fig:solder_anchors_examples_AlO}) replacement of a solder ceramic with a thinner \ce {Al2O3} plate. }}{34}{figure.caption.33}\protected@file@percent }
+\newlabel{fig:solder_anchors_examples}{{2.3}{34}{Examples of the different approaches taken to solve the issues with the solder anchor points. (\subref {fig:solder_anchors_examples_shear_01}) initial state of a solder ceramic interfering with the prism. (\subref {fig:solder_anchors_examples_shear_02}) solder ceramic from before after some of the solder was carefully taken off. (\subref {fig:solder_anchors_examples_glue_bottom}) a solder anchor attached to the bottom of a previously used solder ceramic. (\subref {fig:solder_anchors_examples_AlO}) replacement of a solder ceramic with a thinner \ce {Al2O3} plate}{figure.caption.33}{}}
\citation{Olschewski}
-\@writefile{toc}{\contentsline {section}{\numberline {2.4}Piezo regluing}{37}{section.2.4}\protected@file@percent }
-\newlabel{sec:piezo_reglue}{{2.4}{37}{Piezo regluing}{section.2.4}{}}
-\newlabel{fig:Z3_reglue_process_off}{{2.4a}{37}{\relax }{figure.caption.36}{}}
-\newlabel{sub@fig:Z3_reglue_process_off}{{a}{37}{\relax }{figure.caption.36}{}}
-\newlabel{fig:Z3_reglue_process_scratched}{{2.4b}{37}{\relax }{figure.caption.36}{}}
-\newlabel{sub@fig:Z3_reglue_process_scratched}{{b}{37}{\relax }{figure.caption.36}{}}
-\newlabel{fig:Z3_reglue_process_dot}{{2.4c}{37}{\relax }{figure.caption.36}{}}
-\newlabel{sub@fig:Z3_reglue_process_dot}{{c}{37}{\relax }{figure.caption.36}{}}
-\newlabel{fig:Z3_reglue_process_down}{{2.4d}{37}{\relax }{figure.caption.36}{}}
-\newlabel{sub@fig:Z3_reglue_process_down}{{d}{37}{\relax }{figure.caption.36}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {2.4}{\ignorespaces The re-gluing process shown for the upper left piezo on Z3 that was no longer attached to the Mask Aligner Body. (a) detached piezo. Remains of the EPO-TEK H70E epoxy glue are visible as brown stains on both the Mask Aligner Body and the piezo stack. (b) remains of glue were scratched off carefully. (c) the applied dot of Torr Seal epoxy glue. (d) two nuts and the prism used as weights and alignment tools during curing.}}{37}{figure.caption.36}\protected@file@percent }
-\newlabel{fig:Z3_reglue_process}{{2.4}{37}{The re-gluing process shown for the upper left piezo on Z3 that was no longer attached to the Mask Aligner Body. (a) detached piezo. Remains of the EPO-TEK H70E epoxy glue are visible as brown stains on both the Mask Aligner Body and the piezo stack. (b) remains of glue were scratched off carefully. (c) the applied dot of Torr Seal epoxy glue. (d) two nuts and the prism used as weights and alignment tools during curing}{figure.caption.36}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {2.5}{\ignorespaces The final glued position of the upper Z3 motor after re-gluing. Red line shows the deviation from the other piezo stack. The angle $\alpha $ is about $ \approx 4.5^\circ \pm 0.5^\circ $.}}{38}{figure.caption.37}\protected@file@percent }
-\newlabel{fig:Z3_after reglue}{{2.5}{38}{The final glued position of the upper Z3 motor after re-gluing. Red line shows the deviation from the other piezo stack. The angle $\alpha $ is about $ \approx 4.5^\circ \pm 0.5^\circ $}{figure.caption.37}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {2.5}Z3 motor}{38}{section.2.5}\protected@file@percent }
-\@writefile{lof}{\contentsline {figure}{\numberline {2.6}{\ignorespaces Step size against screw rotation data obtained to calibrate the screw firmness for Z2 and Z3. Larger x-axis values means less firm screw. \textcolor {tab_blue}{Blue} and \textcolor {tab_orange}{orange} show Z3 before swapping front plate with Z1, \textcolor {tab_green}{green} and \textcolor {tab_red}{red} show after.}}{39}{figure.caption.38}\protected@file@percent }
-\newlabel{fig:Z3_screw_rot}{{2.6}{39}{Step size against screw rotation data obtained to calibrate the screw firmness for Z2 and Z3. Larger x-axis values means less firm screw. \textcolor {tab_blue}{Blue} and \textcolor {tab_orange}{orange} show Z3 before swapping front plate with Z1, \textcolor {tab_green}{green} and \textcolor {tab_red}{red} show after}{figure.caption.38}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {2.5.1}Front plate repair}{39}{subsection.2.5.1}\protected@file@percent }
+\@writefile{toc}{\contentsline {section}{\numberline {2.4}Piezo regluing}{35}{section.2.4}\protected@file@percent }
+\newlabel{sec:piezo_reglue}{{2.4}{35}{Piezo regluing}{section.2.4}{}}
+\newlabel{fig:Z3_reglue_process_off}{{2.4a}{35}{\relax }{figure.caption.34}{}}
+\newlabel{sub@fig:Z3_reglue_process_off}{{a}{35}{\relax }{figure.caption.34}{}}
+\newlabel{fig:Z3_reglue_process_scratched}{{2.4b}{35}{\relax }{figure.caption.34}{}}
+\newlabel{sub@fig:Z3_reglue_process_scratched}{{b}{35}{\relax }{figure.caption.34}{}}
+\newlabel{fig:Z3_reglue_process_dot}{{2.4c}{35}{\relax }{figure.caption.34}{}}
+\newlabel{sub@fig:Z3_reglue_process_dot}{{c}{35}{\relax }{figure.caption.34}{}}
+\newlabel{fig:Z3_reglue_process_down}{{2.4d}{35}{\relax }{figure.caption.34}{}}
+\newlabel{sub@fig:Z3_reglue_process_down}{{d}{35}{\relax }{figure.caption.34}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {2.4}{\ignorespaces The re-gluing process shown for the upper left piezo on Z3 that was no longer attached to the Mask Aligner Body. (a) detached piezo. Remains of the EPO-TEK H70E epoxy glue are visible as brown stains on both the Mask Aligner Body and the piezo stack. (b) remains of glue were scratched off carefully. (c) the applied dot of Torr Seal epoxy glue. (d) two nuts and the prism used as weights and alignment tools during curing.}}{35}{figure.caption.34}\protected@file@percent }
+\newlabel{fig:Z3_reglue_process}{{2.4}{35}{The re-gluing process shown for the upper left piezo on Z3 that was no longer attached to the Mask Aligner Body. (a) detached piezo. Remains of the EPO-TEK H70E epoxy glue are visible as brown stains on both the Mask Aligner Body and the piezo stack. (b) remains of glue were scratched off carefully. (c) the applied dot of Torr Seal epoxy glue. (d) two nuts and the prism used as weights and alignment tools during curing}{figure.caption.34}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {2.5}{\ignorespaces The final glued position of the upper Z3 motor after re-gluing. Red line shows the deviation from the other piezo stack. The angle $\alpha $ is about $ \approx 4.5^\circ \pm 0.5^\circ $.}}{36}{figure.caption.35}\protected@file@percent }
+\newlabel{fig:Z3_after reglue}{{2.5}{36}{The final glued position of the upper Z3 motor after re-gluing. Red line shows the deviation from the other piezo stack. The angle $\alpha $ is about $ \approx 4.5^\circ \pm 0.5^\circ $}{figure.caption.35}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {2.5}Z3 motor}{36}{section.2.5}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {2.6}{\ignorespaces Step size against screw rotation data obtained to calibrate the screw firmness for Z2 and Z3. Larger x-axis values means less firm screw. \textcolor {tab_blue}{Blue} and \textcolor {tab_orange}{orange} show Z3 before swapping front plate with Z1, \textcolor {tab_green}{green} and \textcolor {tab_red}{red} show after.}}{37}{figure.caption.36}\protected@file@percent }
+\newlabel{fig:Z3_screw_rot}{{2.6}{37}{Step size against screw rotation data obtained to calibrate the screw firmness for Z2 and Z3. Larger x-axis values means less firm screw. \textcolor {tab_blue}{Blue} and \textcolor {tab_orange}{orange} show Z3 before swapping front plate with Z1, \textcolor {tab_green}{green} and \textcolor {tab_red}{red} show after}{figure.caption.36}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {2.5.1}Front plate repair}{37}{subsection.2.5.1}\protected@file@percent }
\citation{Olschewski}
-\@writefile{lof}{\contentsline {figure}{\numberline {2.7}{\ignorespaces Screw rotation calibration data for Z2 and Z3 after front plate repairs.}}{40}{figure.caption.39}\protected@file@percent }
-\newlabel{fig:Z3_screw_rot_after_rep}{{2.7}{40}{Screw rotation calibration data for Z2 and Z3 after front plate repairs}{figure.caption.39}{}}
-\newlabel{fig:Front_plate_repair_tool}{{2.8a}{41}{\relax }{figure.caption.40}{}}
-\newlabel{sub@fig:Front_plate_repair_tool}{{a}{41}{\relax }{figure.caption.40}{}}
-\newlabel{fig:Front_plate_repair_plate}{{2.8b}{41}{\relax }{figure.caption.40}{}}
-\newlabel{sub@fig:Front_plate_repair_plate}{{b}{41}{\relax }{figure.caption.40}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {2.8}{\ignorespaces (\subref {fig:Front_plate_repair_tool}) Solidworks explosive diagram of the Z3 front plate with the alignment tool. (\subref {fig:Front_plate_repair_plate}) final front plate assembled.}}{41}{figure.caption.40}\protected@file@percent }
-\newlabel{fig:Front_plate_repair}{{2.8}{41}{(\subref {fig:Front_plate_repair_tool}) Solidworks explosive diagram of the Z3 front plate with the alignment tool. (\subref {fig:Front_plate_repair_plate}) final front plate assembled}{figure.caption.40}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {2.5.2}Small capacitance stack}{41}{subsection.2.5.2}\protected@file@percent }
-\@writefile{lof}{\contentsline {figure}{\numberline {2.9}{\ignorespaces The measured capacitance values for the piezo stacks of the motor Z3. }}{42}{figure.caption.41}\protected@file@percent }
-\newlabel{fig:Z3_weaker_stack}{{2.9}{42}{The measured capacitance values for the piezo stacks of the motor Z3}{figure.caption.41}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {2.6}Feed through cabling optimizations}{42}{section.2.6}\protected@file@percent }
-\newlabel{fig:Feedthrough_Repairs_left}{{2.10a}{43}{\relax }{figure.caption.42}{}}
-\newlabel{sub@fig:Feedthrough_Repairs_left}{{a}{43}{\relax }{figure.caption.42}{}}
-\newlabel{fig:Feedthrough_Repairs_right}{{2.10b}{43}{\relax }{figure.caption.42}{}}
-\newlabel{sub@fig:Feedthrough_Repairs_right}{{b}{43}{\relax }{figure.caption.42}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {2.10}{\ignorespaces Left (\subref {fig:Feedthrough_Repairs_left}) and right (\subref {fig:Feedthrough_Repairs_right}) side of Mask Aligner flange. \textcolor {tab_red}{Red} circles mark the changes made to the grounding.}}{43}{figure.caption.42}\protected@file@percent }
-\newlabel{fig:Feedthrough_Repairs}{{2.10}{43}{Left (\subref {fig:Feedthrough_Repairs_left}) and right (\subref {fig:Feedthrough_Repairs_right}) side of Mask Aligner flange. \textcolor {tab_red}{Red} circles mark the changes made to the grounding}{figure.caption.42}{}}
-\@writefile{lot}{\contentsline {table}{\numberline {2.1}{\ignorespaces The cross capacitance values of mask 1 before and after the optimizations of the feedthrough and capacitance sensor cables.}}{43}{table.caption.43}\protected@file@percent }
-\newlabel{tab:cross_cap_after_repair}{{2.1}{43}{The cross capacitance values of mask 1 before and after the optimizations of the feedthrough and capacitance sensor cables}{table.caption.43}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {2.7}Final test}{43}{section.2.7}\protected@file@percent }
-\@writefile{lof}{\contentsline {figure}{\numberline {2.11}{\ignorespaces The final calibration that was performed, after all the optimizations were done. Driving of the motors was done in 2000, 4000, 6000, 8000 and 10000 steps under ambient conditions.}}{44}{figure.caption.44}\protected@file@percent }
-\newlabel{fig:calibration_after_repair}{{2.11}{44}{The final calibration that was performed, after all the optimizations were done. Driving of the motors was done in 2000, 4000, 6000, 8000 and 10000 steps under ambient conditions}{figure.caption.44}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {2.7}{\ignorespaces Screw rotation calibration data for Z2 and Z3 after front plate repairs.}}{38}{figure.caption.37}\protected@file@percent }
+\newlabel{fig:Z3_screw_rot_after_rep}{{2.7}{38}{Screw rotation calibration data for Z2 and Z3 after front plate repairs}{figure.caption.37}{}}
+\newlabel{fig:Front_plate_repair_tool}{{2.8a}{39}{\relax }{figure.caption.38}{}}
+\newlabel{sub@fig:Front_plate_repair_tool}{{a}{39}{\relax }{figure.caption.38}{}}
+\newlabel{fig:Front_plate_repair_plate}{{2.8b}{39}{\relax }{figure.caption.38}{}}
+\newlabel{sub@fig:Front_plate_repair_plate}{{b}{39}{\relax }{figure.caption.38}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {2.8}{\ignorespaces (\subref {fig:Front_plate_repair_tool}) Solidworks explosive diagram of the Z3 front plate with the alignment tool. (\subref {fig:Front_plate_repair_plate}) final front plate assembled.}}{39}{figure.caption.38}\protected@file@percent }
+\newlabel{fig:Front_plate_repair}{{2.8}{39}{(\subref {fig:Front_plate_repair_tool}) Solidworks explosive diagram of the Z3 front plate with the alignment tool. (\subref {fig:Front_plate_repair_plate}) final front plate assembled}{figure.caption.38}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {2.5.2}Small capacitance stack}{39}{subsection.2.5.2}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {2.9}{\ignorespaces The measured capacitance values for the piezo stacks of the motor Z3. }}{40}{figure.caption.39}\protected@file@percent }
+\newlabel{fig:Z3_weaker_stack}{{2.9}{40}{The measured capacitance values for the piezo stacks of the motor Z3}{figure.caption.39}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {2.6}Feed through cabling optimizations}{40}{section.2.6}\protected@file@percent }
+\newlabel{fig:Feedthrough_Repairs_left}{{2.10a}{41}{\relax }{figure.caption.40}{}}
+\newlabel{sub@fig:Feedthrough_Repairs_left}{{a}{41}{\relax }{figure.caption.40}{}}
+\newlabel{fig:Feedthrough_Repairs_right}{{2.10b}{41}{\relax }{figure.caption.40}{}}
+\newlabel{sub@fig:Feedthrough_Repairs_right}{{b}{41}{\relax }{figure.caption.40}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {2.10}{\ignorespaces Left (\subref {fig:Feedthrough_Repairs_left}) and right (\subref {fig:Feedthrough_Repairs_right}) side of Mask Aligner flange. \textcolor {tab_red}{Red} circles mark the changes made to the grounding.}}{41}{figure.caption.40}\protected@file@percent }
+\newlabel{fig:Feedthrough_Repairs}{{2.10}{41}{Left (\subref {fig:Feedthrough_Repairs_left}) and right (\subref {fig:Feedthrough_Repairs_right}) side of Mask Aligner flange. \textcolor {tab_red}{Red} circles mark the changes made to the grounding}{figure.caption.40}{}}
+\@writefile{lot}{\contentsline {table}{\numberline {2.1}{\ignorespaces The cross capacitance values of mask 1 before and after the optimizations of the feedthrough and capacitance sensor cables.}}{41}{table.caption.41}\protected@file@percent }
+\newlabel{tab:cross_cap_after_repair}{{2.1}{41}{The cross capacitance values of mask 1 before and after the optimizations of the feedthrough and capacitance sensor cables}{table.caption.41}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {2.7}Final test}{41}{section.2.7}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {2.11}{\ignorespaces The final calibration that was performed, after all the optimizations were done. Driving of the motors was done in 2000, 4000, 6000, 8000 and 10000 steps under ambient conditions.}}{42}{figure.caption.42}\protected@file@percent }
+\newlabel{fig:calibration_after_repair}{{2.11}{42}{The final calibration that was performed, after all the optimizations were done. Driving of the motors was done in 2000, 4000, 6000, 8000 and 10000 steps under ambient conditions}{figure.caption.42}{}}
\@setckpt{chap04}{
-\setcounter{page}{45}
+\setcounter{page}{43}
\setcounter{equation}{0}
\setcounter{enumi}{4}
\setcounter{enumii}{0}
@@ -100,7 +100,7 @@
\setcounter{section@level}{1}
\setcounter{Item}{14}
\setcounter{Hfootnote}{1}
-\setcounter{bookmark@seq@number}{29}
+\setcounter{bookmark@seq@number}{28}
\setcounter{parentequation}{0}
\setcounter{FancyVerbLine}{0}
\setcounter{NAT@ctr}{0}
diff --git a/chap05.aux b/chap05.aux
index b387bad07df6ed7da5e2ad45ab5b379a97409109..d0a51e3eb7871cf657ff468fc6db9a791ff68b08 100644
--- a/chap05.aux
+++ b/chap05.aux
@@ -1,97 +1,97 @@
\relax
\providecommand\hyper@newdestlabel[2]{}
-\@writefile{toc}{\contentsline {chapter}{\numberline {3}Evaporations and measurement}{45}{chapter.3}\protected@file@percent }
+\@writefile{toc}{\contentsline {chapter}{\numberline {3}Evaporations and measurement}{43}{chapter.3}\protected@file@percent }
\@writefile{lof}{\addvspace {10\p@ }}
\@writefile{lot}{\addvspace {10\p@ }}
-\@writefile{toc}{\contentsline {section}{\numberline {3.1}Evaporation configuration}{45}{section.3.1}\protected@file@percent }
-\@writefile{lof}{\contentsline {figure}{\numberline {3.1}{\ignorespaces The approach curve measured for field 1 until full contact.}}{45}{figure.caption.45}\protected@file@percent }
-\newlabel{fig:evaporation_approach_curve}{{3.1}{45}{The approach curve measured for field 1 until full contact}{figure.caption.45}{}}
-\newlabel{fig:Evaporation_diagramm_sample_img}{{3.2a}{46}{\relax }{figure.caption.46}{}}
-\newlabel{sub@fig:Evaporation_diagramm_sample_img}{{a}{46}{\relax }{figure.caption.46}{}}
-\newlabel{fig:Evaporation_diagramm_mask_img}{{3.2b}{46}{\relax }{figure.caption.46}{}}
-\newlabel{sub@fig:Evaporation_diagramm_mask_img}{{b}{46}{\relax }{figure.caption.46}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.2}{\ignorespaces (\subref {fig:Evaporation_diagramm_sample_img}) diagram showing the Evaporation performed on the sample. Red squares represent the positions of the evaporated fields. The number shows the order of evaporations. Distances are measured using an optical microscope. Fields are at a $10^\circ $ angle with respect to the sample holder. (\subref {fig:Evaporation_diagramm_mask_img}) microscope image of the mask taken before evaporation. The mask holder is placed straight in the microscope. The mask itself is angled on the mask holder.}}{46}{figure.caption.46}\protected@file@percent }
-\newlabel{fig:Evaporation_diagramm}{{3.2}{46}{(\subref {fig:Evaporation_diagramm_sample_img}) diagram showing the Evaporation performed on the sample. Red squares represent the positions of the evaporated fields. The number shows the order of evaporations. Distances are measured using an optical microscope. Fields are at a $10^\circ $ angle with respect to the sample holder. (\subref {fig:Evaporation_diagramm_mask_img}) microscope image of the mask taken before evaporation. The mask holder is placed straight in the microscope. The mask itself is angled on the mask holder}{figure.caption.46}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {3.2}Contamination}{47}{section.3.2}\protected@file@percent }
-\newlabel{fig:evaporation_contamination_img}{{3.3a}{47}{\relax }{figure.caption.47}{}}
-\newlabel{sub@fig:evaporation_contamination_img}{{a}{47}{\relax }{figure.caption.47}{}}
-\newlabel{fig:evaporation_contamination_anal}{{3.3b}{47}{\relax }{figure.caption.47}{}}
-\newlabel{sub@fig:evaporation_contamination_anal}{{b}{47}{\relax }{figure.caption.47}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.3}{\ignorespaces (\subref {fig:evaporation_contamination_img}) AFM image of field $3$ without any grain removal applied. Data was obtained on multiple different spots on the sample. (\subref {fig:evaporation_contamination_anal}) line cuts obtained from contamination particles. \textcolor {tab_red}{Red} and \textcolor {tab_green}{green} lines show the average height and width of the contamination particles obtained from peak fits.}}{47}{figure.caption.47}\protected@file@percent }
-\newlabel{fig:evaporation_contamination}{{3.3}{47}{(\subref {fig:evaporation_contamination_img}) AFM image of field $3$ without any grain removal applied. Data was obtained on multiple different spots on the sample. (\subref {fig:evaporation_contamination_anal}) line cuts obtained from contamination particles. \textcolor {tab_red}{Red} and \textcolor {tab_green}{green} lines show the average height and width of the contamination particles obtained from peak fits}{figure.caption.47}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {3.3}Penumbra}{48}{section.3.3}\protected@file@percent }
-\newlabel{fig:penumbra_tilt_sigmas}{{3.4a}{48}{\relax }{figure.caption.48}{}}
-\newlabel{sub@fig:penumbra_tilt_sigmas}{{a}{48}{\relax }{figure.caption.48}{}}
-\newlabel{fig:Evaporation_diagramm_field}{{3.4b}{48}{\relax }{figure.caption.48}{}}
-\newlabel{sub@fig:Evaporation_diagramm_field}{{b}{48}{\relax }{figure.caption.48}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.4}{\ignorespaces (\subref {fig:penumbra_tilt_sigmas}) AFM image of evaporated \ce {Pb} dot illustrating the penumbral widths used for evaporation analysis $\sigma _s$ and $\sigma _l$, depicted in \textcolor {tab_red}{red}, and the major axis of the tilt \textcolor {tab_green}{(green)}. $\sigma _s$ is drawn larger than actually measured, to aid visibility. The \textcolor {tab_blue}{blue} lines are the major $a$ and minor $b$ axis of the ellipse formed on the evaporated dot. Inset shows the same image in the phase data. The data is from Evaporation 5. (\subref {fig:Evaporation_diagramm_field}) AFM image of the top right part of field $3$. Grains were reduced using post-processing. Black circles show the dots chosen for further examination on this particular field.}}{48}{figure.caption.48}\protected@file@percent }
-\newlabel{fig:penumbra_tilt_sigmas_and_field_show}{{3.4}{48}{(\subref {fig:penumbra_tilt_sigmas}) AFM image of evaporated \ce {Pb} dot illustrating the penumbral widths used for evaporation analysis $\sigma _s$ and $\sigma _l$, depicted in \textcolor {tab_red}{red}, and the major axis of the tilt \textcolor {tab_green}{(green)}. $\sigma _s$ is drawn larger than actually measured, to aid visibility. The \textcolor {tab_blue}{blue} lines are the major $a$ and minor $b$ axis of the ellipse formed on the evaporated dot. Inset shows the same image in the phase data. The data is from Evaporation 5. (\subref {fig:Evaporation_diagramm_field}) AFM image of the top right part of field $3$. Grains were reduced using post-processing. Black circles show the dots chosen for further examination on this particular field}{figure.caption.48}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.5}{\ignorespaces Example of the analysis conducted on each of the recorded dots for a single line cut. (a) raw AFM data before cleaning with a large amount of very bright contaminant particles. (b) cleaned image. The black lines in (b) show how multiple line cuts were obtained on a single image to obtain values for $\sigma _s$ and $\sigma _l$. The fit parameters are the two different penumbra widths induced by the tilt $\sigma _s$ and $\sigma _l$ for a single line cut. (c) line cut data from one line as an example. This line cut was obtained from \textcolor {tab_green}{(green)} line in (b). }}{50}{figure.caption.49}\protected@file@percent }
-\newlabel{fig:evaporation_analysis}{{3.5}{50}{Example of the analysis conducted on each of the recorded dots for a single line cut. (a) raw AFM data before cleaning with a large amount of very bright contaminant particles. (b) cleaned image. The black lines in (b) show how multiple line cuts were obtained on a single image to obtain values for $\sigma _s$ and $\sigma _l$. The fit parameters are the two different penumbra widths induced by the tilt $\sigma _s$ and $\sigma _l$ for a single line cut. (c) line cut data from one line as an example. This line cut was obtained from \textcolor {tab_green}{(green)} line in (b)}{figure.caption.49}{}}
-\newlabel{fig:evaporation_measured_penumbra_sigs}{{3.6a}{51}{\relax }{figure.caption.50}{}}
-\newlabel{sub@fig:evaporation_measured_penumbra_sigs}{{a}{51}{\relax }{figure.caption.50}{}}
-\newlabel{fig:evaporation_measured_penumbra_sigl}{{3.6b}{51}{\relax }{figure.caption.50}{}}
-\newlabel{sub@fig:evaporation_measured_penumbra_sigl}{{b}{51}{\relax }{figure.caption.50}{}}
-\newlabel{fig:evaporation_measured_penumbra_height}{{3.6c}{51}{\relax }{figure.caption.50}{}}
-\newlabel{sub@fig:evaporation_measured_penumbra_height}{{c}{51}{\relax }{figure.caption.50}{}}
-\newlabel{fig:evaporation_measured_penumbra_circle_r}{{3.6d}{51}{\relax }{figure.caption.50}{}}
-\newlabel{sub@fig:evaporation_measured_penumbra_circle_r}{{d}{51}{\relax }{figure.caption.50}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.6}{\ignorespaces Data obtained from the previously described method for each of the 5 evaporations, one dot each from the center, the left, the right, the bottom and the top. (\subref {fig:evaporation_measured_penumbra_sigs})smaller penumbra $\sigma _s$. (\subref {fig:evaporation_measured_penumbra_sigl}) larger penumbra $\sigma _l$. (\subref {fig:evaporation_measured_penumbra_height}) height of the dot. (\subref {fig:evaporation_measured_penumbra_circle_r}) diameter of the circle.}}{51}{figure.caption.50}\protected@file@percent }
-\newlabel{fig:evaporation_measured_penumbra}{{3.6}{51}{Data obtained from the previously described method for each of the 5 evaporations, one dot each from the center, the left, the right, the bottom and the top. (\subref {fig:evaporation_measured_penumbra_sigs})smaller penumbra $\sigma _s$. (\subref {fig:evaporation_measured_penumbra_sigl}) larger penumbra $\sigma _l$. (\subref {fig:evaporation_measured_penumbra_height}) height of the dot. (\subref {fig:evaporation_measured_penumbra_circle_r}) diameter of the circle}{figure.caption.50}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {3.4}Tilt and deformation}{52}{section.3.4}\protected@file@percent }
-\newlabel{fig:evaporation_tilts_example}{{3.7a}{53}{\relax }{figure.caption.51}{}}
-\newlabel{sub@fig:evaporation_tilts_example}{{a}{53}{\relax }{figure.caption.51}{}}
-\newlabel{fig:evaporation_tilts_all}{{3.7b}{53}{\relax }{figure.caption.51}{}}
-\newlabel{sub@fig:evaporation_tilts_all}{{b}{53}{\relax }{figure.caption.51}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.7}{\ignorespaces (\subref {fig:evaporation_tilts_example}) image of the reconstruction of the tilt angle for Field 3. (\subref {fig:evaporation_tilts_all}) the same for all fields. For fields 1, 4, 5 the full field scans were performed at low resolution and due to this the direction of the tilt could not be determined from the images. The only dots drawn in this case are the high resolution AFM scans of single dots.}}{53}{figure.caption.51}\protected@file@percent }
-\newlabel{fig:evaporation_tilts}{{3.7}{53}{(\subref {fig:evaporation_tilts_example}) image of the reconstruction of the tilt angle for Field 3. (\subref {fig:evaporation_tilts_all}) the same for all fields. For fields 1, 4, 5 the full field scans were performed at low resolution and due to this the direction of the tilt could not be determined from the images. The only dots drawn in this case are the high resolution AFM scans of single dots}{figure.caption.51}{}}
-\newlabel{fig:evaporation_SEM_mask}{{3.8a}{54}{\relax }{figure.caption.52}{}}
-\newlabel{sub@fig:evaporation_SEM_mask}{{a}{54}{\relax }{figure.caption.52}{}}
-\newlabel{fig:evaporation_SEM_analysis_clog}{{3.8b}{54}{\relax }{figure.caption.52}{}}
-\newlabel{sub@fig:evaporation_SEM_analysis_clog}{{b}{54}{\relax }{figure.caption.52}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.8}{\ignorespaces (\subref {fig:evaporation_SEM_mask}) SEM image of the mask. The inset shows another image of the same mask. The image of the mask was very unstable due to heavy charging effects. (\subref {fig:evaporation_SEM_analysis_clog}) example of the clogging noticed on $4$ of the mask holes.}}{54}{figure.caption.52}\protected@file@percent }
-\newlabel{fig:evaporation_SEM}{{3.8}{54}{(\subref {fig:evaporation_SEM_mask}) SEM image of the mask. The inset shows another image of the same mask. The image of the mask was very unstable due to heavy charging effects. (\subref {fig:evaporation_SEM_analysis_clog}) example of the clogging noticed on $4$ of the mask holes}{figure.caption.52}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {3.1}Evaporation configuration}{43}{section.3.1}\protected@file@percent }
+\@writefile{lof}{\contentsline {figure}{\numberline {3.1}{\ignorespaces The approach curve measured for field 1 until full contact.}}{43}{figure.caption.43}\protected@file@percent }
+\newlabel{fig:evaporation_approach_curve}{{3.1}{43}{The approach curve measured for field 1 until full contact}{figure.caption.43}{}}
+\newlabel{fig:Evaporation_diagramm_sample_img}{{3.2a}{44}{\relax }{figure.caption.44}{}}
+\newlabel{sub@fig:Evaporation_diagramm_sample_img}{{a}{44}{\relax }{figure.caption.44}{}}
+\newlabel{fig:Evaporation_diagramm_mask_img}{{3.2b}{44}{\relax }{figure.caption.44}{}}
+\newlabel{sub@fig:Evaporation_diagramm_mask_img}{{b}{44}{\relax }{figure.caption.44}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.2}{\ignorespaces (\subref {fig:Evaporation_diagramm_sample_img}) diagram showing the Evaporation performed on the sample. Red squares represent the positions of the evaporated fields. The number shows the order of evaporations. Distances are measured using an optical microscope. Fields are at a $10^\circ $ angle with respect to the sample holder. (\subref {fig:Evaporation_diagramm_mask_img}) microscope image of the mask taken before evaporation. The mask holder is placed straight in the microscope. The mask itself is angled on the mask holder.}}{44}{figure.caption.44}\protected@file@percent }
+\newlabel{fig:Evaporation_diagramm}{{3.2}{44}{(\subref {fig:Evaporation_diagramm_sample_img}) diagram showing the Evaporation performed on the sample. Red squares represent the positions of the evaporated fields. The number shows the order of evaporations. Distances are measured using an optical microscope. Fields are at a $10^\circ $ angle with respect to the sample holder. (\subref {fig:Evaporation_diagramm_mask_img}) microscope image of the mask taken before evaporation. The mask holder is placed straight in the microscope. The mask itself is angled on the mask holder}{figure.caption.44}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {3.2}Contamination}{45}{section.3.2}\protected@file@percent }
+\newlabel{fig:evaporation_contamination_img}{{3.3a}{45}{\relax }{figure.caption.45}{}}
+\newlabel{sub@fig:evaporation_contamination_img}{{a}{45}{\relax }{figure.caption.45}{}}
+\newlabel{fig:evaporation_contamination_anal}{{3.3b}{45}{\relax }{figure.caption.45}{}}
+\newlabel{sub@fig:evaporation_contamination_anal}{{b}{45}{\relax }{figure.caption.45}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.3}{\ignorespaces (\subref {fig:evaporation_contamination_img}) AFM image of field $3$ without any grain removal applied. Data was obtained on multiple different spots on the sample. (\subref {fig:evaporation_contamination_anal}) line cuts obtained from contamination particles. \textcolor {tab_red}{Red} and \textcolor {tab_green}{green} lines show the average height and width of the contamination particles obtained from peak fits.}}{45}{figure.caption.45}\protected@file@percent }
+\newlabel{fig:evaporation_contamination}{{3.3}{45}{(\subref {fig:evaporation_contamination_img}) AFM image of field $3$ without any grain removal applied. Data was obtained on multiple different spots on the sample. (\subref {fig:evaporation_contamination_anal}) line cuts obtained from contamination particles. \textcolor {tab_red}{Red} and \textcolor {tab_green}{green} lines show the average height and width of the contamination particles obtained from peak fits}{figure.caption.45}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {3.3}Penumbra}{46}{section.3.3}\protected@file@percent }
+\newlabel{fig:penumbra_tilt_sigmas}{{3.4a}{46}{\relax }{figure.caption.46}{}}
+\newlabel{sub@fig:penumbra_tilt_sigmas}{{a}{46}{\relax }{figure.caption.46}{}}
+\newlabel{fig:Evaporation_diagramm_field}{{3.4b}{46}{\relax }{figure.caption.46}{}}
+\newlabel{sub@fig:Evaporation_diagramm_field}{{b}{46}{\relax }{figure.caption.46}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.4}{\ignorespaces (\subref {fig:penumbra_tilt_sigmas}) AFM image of evaporated \ce {Pb} dot illustrating the penumbral widths used for evaporation analysis $\sigma _s$ and $\sigma _l$, depicted in \textcolor {tab_red}{red}, and the major axis of the tilt \textcolor {tab_green}{(green)}. $\sigma _s$ is drawn larger than actually measured, to aid visibility. The \textcolor {tab_blue}{blue} lines are the major $a$ and minor $b$ axis of the ellipse formed on the evaporated dot. Inset shows the same image in the phase data. The data is from Evaporation 5. (\subref {fig:Evaporation_diagramm_field}) AFM image of the top right part of field $3$. Grains were reduced using post-processing. Black circles show the dots chosen for further examination on this particular field.}}{46}{figure.caption.46}\protected@file@percent }
+\newlabel{fig:penumbra_tilt_sigmas_and_field_show}{{3.4}{46}{(\subref {fig:penumbra_tilt_sigmas}) AFM image of evaporated \ce {Pb} dot illustrating the penumbral widths used for evaporation analysis $\sigma _s$ and $\sigma _l$, depicted in \textcolor {tab_red}{red}, and the major axis of the tilt \textcolor {tab_green}{(green)}. $\sigma _s$ is drawn larger than actually measured, to aid visibility. The \textcolor {tab_blue}{blue} lines are the major $a$ and minor $b$ axis of the ellipse formed on the evaporated dot. Inset shows the same image in the phase data. The data is from Evaporation 5. (\subref {fig:Evaporation_diagramm_field}) AFM image of the top right part of field $3$. Grains were reduced using post-processing. Black circles show the dots chosen for further examination on this particular field}{figure.caption.46}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.5}{\ignorespaces Example of the analysis conducted on each of the recorded dots for a single line cut. (a) raw AFM data before cleaning with a large amount of very bright contaminant particles. (b) cleaned image. The black lines in (b) show how multiple line cuts were obtained on a single image to obtain values for $\sigma _s$ and $\sigma _l$. The fit parameters are the two different penumbra widths induced by the tilt $\sigma _s$ and $\sigma _l$ for a single line cut. (c) line cut data from one line as an example. This line cut was obtained from \textcolor {tab_green}{(green)} line in (b). }}{48}{figure.caption.47}\protected@file@percent }
+\newlabel{fig:evaporation_analysis}{{3.5}{48}{Example of the analysis conducted on each of the recorded dots for a single line cut. (a) raw AFM data before cleaning with a large amount of very bright contaminant particles. (b) cleaned image. The black lines in (b) show how multiple line cuts were obtained on a single image to obtain values for $\sigma _s$ and $\sigma _l$. The fit parameters are the two different penumbra widths induced by the tilt $\sigma _s$ and $\sigma _l$ for a single line cut. (c) line cut data from one line as an example. This line cut was obtained from \textcolor {tab_green}{(green)} line in (b)}{figure.caption.47}{}}
+\newlabel{fig:evaporation_measured_penumbra_sigs}{{3.6a}{49}{\relax }{figure.caption.48}{}}
+\newlabel{sub@fig:evaporation_measured_penumbra_sigs}{{a}{49}{\relax }{figure.caption.48}{}}
+\newlabel{fig:evaporation_measured_penumbra_sigl}{{3.6b}{49}{\relax }{figure.caption.48}{}}
+\newlabel{sub@fig:evaporation_measured_penumbra_sigl}{{b}{49}{\relax }{figure.caption.48}{}}
+\newlabel{fig:evaporation_measured_penumbra_height}{{3.6c}{49}{\relax }{figure.caption.48}{}}
+\newlabel{sub@fig:evaporation_measured_penumbra_height}{{c}{49}{\relax }{figure.caption.48}{}}
+\newlabel{fig:evaporation_measured_penumbra_circle_r}{{3.6d}{49}{\relax }{figure.caption.48}{}}
+\newlabel{sub@fig:evaporation_measured_penumbra_circle_r}{{d}{49}{\relax }{figure.caption.48}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.6}{\ignorespaces Data obtained from the previously described method for each of the 5 evaporations, one dot each from the center, the left, the right, the bottom and the top. (\subref {fig:evaporation_measured_penumbra_sigs})smaller penumbra $\sigma _s$. (\subref {fig:evaporation_measured_penumbra_sigl}) larger penumbra $\sigma _l$. (\subref {fig:evaporation_measured_penumbra_height}) height of the dot. (\subref {fig:evaporation_measured_penumbra_circle_r}) diameter of the circle.}}{49}{figure.caption.48}\protected@file@percent }
+\newlabel{fig:evaporation_measured_penumbra}{{3.6}{49}{Data obtained from the previously described method for each of the 5 evaporations, one dot each from the center, the left, the right, the bottom and the top. (\subref {fig:evaporation_measured_penumbra_sigs})smaller penumbra $\sigma _s$. (\subref {fig:evaporation_measured_penumbra_sigl}) larger penumbra $\sigma _l$. (\subref {fig:evaporation_measured_penumbra_height}) height of the dot. (\subref {fig:evaporation_measured_penumbra_circle_r}) diameter of the circle}{figure.caption.48}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {3.4}Tilt and deformation}{50}{section.3.4}\protected@file@percent }
+\newlabel{fig:evaporation_tilts_example}{{3.7a}{51}{\relax }{figure.caption.49}{}}
+\newlabel{sub@fig:evaporation_tilts_example}{{a}{51}{\relax }{figure.caption.49}{}}
+\newlabel{fig:evaporation_tilts_all}{{3.7b}{51}{\relax }{figure.caption.49}{}}
+\newlabel{sub@fig:evaporation_tilts_all}{{b}{51}{\relax }{figure.caption.49}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.7}{\ignorespaces (\subref {fig:evaporation_tilts_example}) image of the reconstruction of the tilt angle for Field 3. (\subref {fig:evaporation_tilts_all}) the same for all fields. For fields 1, 4, 5 the full field scans were performed at low resolution and due to this the direction of the tilt could not be determined from the images. The only dots drawn in this case are the high resolution AFM scans of single dots.}}{51}{figure.caption.49}\protected@file@percent }
+\newlabel{fig:evaporation_tilts}{{3.7}{51}{(\subref {fig:evaporation_tilts_example}) image of the reconstruction of the tilt angle for Field 3. (\subref {fig:evaporation_tilts_all}) the same for all fields. For fields 1, 4, 5 the full field scans were performed at low resolution and due to this the direction of the tilt could not be determined from the images. The only dots drawn in this case are the high resolution AFM scans of single dots}{figure.caption.49}{}}
+\newlabel{fig:evaporation_SEM_mask}{{3.8a}{52}{\relax }{figure.caption.50}{}}
+\newlabel{sub@fig:evaporation_SEM_mask}{{a}{52}{\relax }{figure.caption.50}{}}
+\newlabel{fig:evaporation_SEM_analysis_clog}{{3.8b}{52}{\relax }{figure.caption.50}{}}
+\newlabel{sub@fig:evaporation_SEM_analysis_clog}{{b}{52}{\relax }{figure.caption.50}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.8}{\ignorespaces (\subref {fig:evaporation_SEM_mask}) SEM image of the mask. The inset shows another image of the same mask. The image of the mask was very unstable due to heavy charging effects. (\subref {fig:evaporation_SEM_analysis_clog}) example of the clogging noticed on $4$ of the mask holes.}}{52}{figure.caption.50}\protected@file@percent }
+\newlabel{fig:evaporation_SEM}{{3.8}{52}{(\subref {fig:evaporation_SEM_mask}) SEM image of the mask. The inset shows another image of the same mask. The image of the mask was very unstable due to heavy charging effects. (\subref {fig:evaporation_SEM_analysis_clog}) example of the clogging noticed on $4$ of the mask holes}{figure.caption.50}{}}
\citation{Simon}
-\newlabel{fig:evaporation_SEM_analysis_clog_overlay}{{3.9a}{55}{\relax }{figure.caption.53}{}}
-\newlabel{sub@fig:evaporation_SEM_analysis_clog_overlay}{{a}{55}{\relax }{figure.caption.53}{}}
-\newlabel{fig:evaporation_SEM_sample}{{3.9b}{55}{\relax }{figure.caption.53}{}}
-\newlabel{sub@fig:evaporation_SEM_sample}{{b}{55}{\relax }{figure.caption.53}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.9}{\ignorespaces (\subref {fig:evaporation_SEM_analysis_clog_overlay}) tilt direction from \ref {fig:evaporation_tilts} overlayed over the SEM image of the mask after it was rotated to match the fields. (\subref {fig:evaporation_SEM_sample}) SEM images of field 2 on the sample.}}{55}{figure.caption.53}\protected@file@percent }
-\newlabel{fig:evaporation_SEM_analysis}{{3.9}{55}{(\subref {fig:evaporation_SEM_analysis_clog_overlay}) tilt direction from \ref {fig:evaporation_tilts} overlayed over the SEM image of the mask after it was rotated to match the fields. (\subref {fig:evaporation_SEM_sample}) SEM images of field 2 on the sample}{figure.caption.53}{}}
-\@writefile{toc}{\contentsline {section}{\numberline {3.5}Simulation}{55}{section.3.5}\protected@file@percent }
-\newlabel{sec:simulation}{{3.5}{55}{Simulation}{section.3.5}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {3.5.1}Overview and principle}{55}{subsection.3.5.1}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {3.5.2}Results}{57}{subsection.3.5.2}\protected@file@percent }
-\newlabel{fig:evaporation_simulation_first_compare_AFM}{{3.10a}{57}{\relax }{figure.caption.54}{}}
-\newlabel{sub@fig:evaporation_simulation_first_compare_AFM}{{a}{57}{\relax }{figure.caption.54}{}}
-\newlabel{fig:evaporation_simulation_first_compare_SIM}{{3.10b}{57}{\relax }{figure.caption.54}{}}
-\newlabel{sub@fig:evaporation_simulation_first_compare_SIM}{{b}{57}{\relax }{figure.caption.54}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.10}{\ignorespaces (a) a recorded AFM image, colors are for easier identification. (b) a simulated evaporation with parameters obtained from measurement in the AFM image. }}{57}{figure.caption.54}\protected@file@percent }
-\newlabel{fig:evaporation_simulation_first_compare}{{3.10}{57}{(a) a recorded AFM image, colors are for easier identification. (b) a simulated evaporation with parameters obtained from measurement in the AFM image}{figure.caption.54}{}}
+\newlabel{fig:evaporation_SEM_analysis_clog_overlay}{{3.9a}{53}{\relax }{figure.caption.51}{}}
+\newlabel{sub@fig:evaporation_SEM_analysis_clog_overlay}{{a}{53}{\relax }{figure.caption.51}{}}
+\newlabel{fig:evaporation_SEM_sample}{{3.9b}{53}{\relax }{figure.caption.51}{}}
+\newlabel{sub@fig:evaporation_SEM_sample}{{b}{53}{\relax }{figure.caption.51}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.9}{\ignorespaces (\subref {fig:evaporation_SEM_analysis_clog_overlay}) tilt direction from \ref {fig:evaporation_tilts} overlayed over the SEM image of the mask after it was rotated to match the fields. (\subref {fig:evaporation_SEM_sample}) SEM images of field 2 on the sample.}}{53}{figure.caption.51}\protected@file@percent }
+\newlabel{fig:evaporation_SEM_analysis}{{3.9}{53}{(\subref {fig:evaporation_SEM_analysis_clog_overlay}) tilt direction from \ref {fig:evaporation_tilts} overlayed over the SEM image of the mask after it was rotated to match the fields. (\subref {fig:evaporation_SEM_sample}) SEM images of field 2 on the sample}{figure.caption.51}{}}
+\@writefile{toc}{\contentsline {section}{\numberline {3.5}Simulation}{53}{section.3.5}\protected@file@percent }
+\newlabel{sec:simulation}{{3.5}{53}{Simulation}{section.3.5}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {3.5.1}Overview and principle}{53}{subsection.3.5.1}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {3.5.2}Results}{55}{subsection.3.5.2}\protected@file@percent }
+\newlabel{fig:evaporation_simulation_first_compare_AFM}{{3.10a}{55}{\relax }{figure.caption.52}{}}
+\newlabel{sub@fig:evaporation_simulation_first_compare_AFM}{{a}{55}{\relax }{figure.caption.52}{}}
+\newlabel{fig:evaporation_simulation_first_compare_SIM}{{3.10b}{55}{\relax }{figure.caption.52}{}}
+\newlabel{sub@fig:evaporation_simulation_first_compare_SIM}{{b}{55}{\relax }{figure.caption.52}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.10}{\ignorespaces (a) a recorded AFM image, colors are for easier identification. (b) a simulated evaporation with parameters obtained from measurement in the AFM image. }}{55}{figure.caption.52}\protected@file@percent }
+\newlabel{fig:evaporation_simulation_first_compare}{{3.10}{55}{(a) a recorded AFM image, colors are for easier identification. (b) a simulated evaporation with parameters obtained from measurement in the AFM image}{figure.caption.52}{}}
\citation{Bhaskar}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.11}{\ignorespaces Simulation showing the effect of only x-y vibration on the resulting evaporation. White circles show the extreme positions of the circular mask. }}{58}{figure.caption.55}\protected@file@percent }
-\newlabel{fig:evaporation_simulation_overlap}{{3.11}{58}{Simulation showing the effect of only x-y vibration on the resulting evaporation. White circles show the extreme positions of the circular mask}{figure.caption.55}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.11}{\ignorespaces Simulation showing the effect of only x-y vibration on the resulting evaporation. White circles show the extreme positions of the circular mask. }}{56}{figure.caption.53}\protected@file@percent }
+\newlabel{fig:evaporation_simulation_overlap}{{3.11}{56}{Simulation showing the effect of only x-y vibration on the resulting evaporation. White circles show the extreme positions of the circular mask}{figure.caption.53}{}}
\citation{grain_growth}
-\newlabel{fig:evaporation_simulation_sharpness_stick_simple}{{3.12a}{59}{\relax }{figure.caption.56}{}}
-\newlabel{sub@fig:evaporation_simulation_sharpness_stick_simple}{{a}{59}{\relax }{figure.caption.56}{}}
-\newlabel{fig:evaporation_simulation_sharpness_stick_initial}{{3.12b}{59}{\relax }{figure.caption.56}{}}
-\newlabel{sub@fig:evaporation_simulation_sharpness_stick_initial}{{b}{59}{\relax }{figure.caption.56}{}}
-\newlabel{fig:evaporation_simulation_sharpness_stick_power}{{3.12c}{59}{\relax }{figure.caption.56}{}}
-\newlabel{sub@fig:evaporation_simulation_sharpness_stick_power}{{c}{59}{\relax }{figure.caption.56}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.12}{\ignorespaces (\subref {fig:evaporation_simulation_sharpness_stick_simple}) Comparison of the evaporation with harmonic oscillation. (\subref {fig:evaporation_simulation_sharpness_stick_initial}) initial phase with no elliptical oscillation and then drift to the elliptical shape. (\subref {fig:evaporation_simulation_sharpness_stick_power})an anharmonic oscillation with $\sin (\frac {t}{T} + \phi )^{20}$ . The parameters of the ellipse are the same as in Figure \ref {fig:evaporation_simulation_first_compare}.}}{59}{figure.caption.56}\protected@file@percent }
-\newlabel{fig:evaporation_simulation_sharpness}{{3.12}{59}{(\subref {fig:evaporation_simulation_sharpness_stick_simple}) Comparison of the evaporation with harmonic oscillation. (\subref {fig:evaporation_simulation_sharpness_stick_initial}) initial phase with no elliptical oscillation and then drift to the elliptical shape. (\subref {fig:evaporation_simulation_sharpness_stick_power})an anharmonic oscillation with $\sin (\frac {t}{T} + \phi )^{20}$ . The parameters of the ellipse are the same as in Figure \ref {fig:evaporation_simulation_first_compare}}{figure.caption.56}{}}
-\newlabel{fig:evaporation_simulation_rejection_prev}{{3.13a}{60}{\relax }{figure.caption.57}{}}
-\newlabel{sub@fig:evaporation_simulation_rejection_prev}{{a}{60}{\relax }{figure.caption.57}{}}
-\newlabel{fig:evaporation_simulation_rejection_after}{{3.13b}{60}{\relax }{figure.caption.57}{}}
-\newlabel{sub@fig:evaporation_simulation_rejection_after}{{b}{60}{\relax }{figure.caption.57}{}}
-\newlabel{fig:evaporation_simulation_rejection_comparison}{{3.13c}{60}{\relax }{figure.caption.57}{}}
-\newlabel{sub@fig:evaporation_simulation_rejection_comparison}{{c}{60}{\relax }{figure.caption.57}{}}
-\@writefile{lof}{\contentsline {figure}{\numberline {3.13}{\ignorespaces (\subref {fig:evaporation_simulation_rejection_prev}) simulated evaporation dots without rejection. (\subref {fig:evaporation_simulation_rejection_prev}) with (\subref {fig:evaporation_simulation_rejection_after}) $90$ \% probability to reject a deposition, when no previous deposition happened on the target pixel. (\subref {fig:evaporation_simulation_rejection_comparison}) the AFM image from which the parameters were obtained. The parameters of the ellipse are the same as in Figure \ref {fig:evaporation_simulation_first_compare}.}}{60}{figure.caption.57}\protected@file@percent }
-\newlabel{fig:evaporation_simulation_rejection}{{3.13}{60}{(\subref {fig:evaporation_simulation_rejection_prev}) simulated evaporation dots without rejection. (\subref {fig:evaporation_simulation_rejection_prev}) with (\subref {fig:evaporation_simulation_rejection_after}) $90$ \% probability to reject a deposition, when no previous deposition happened on the target pixel. (\subref {fig:evaporation_simulation_rejection_comparison}) the AFM image from which the parameters were obtained. The parameters of the ellipse are the same as in Figure \ref {fig:evaporation_simulation_first_compare}}{figure.caption.57}{}}
-\@writefile{toc}{\contentsline {subsection}{\numberline {3.5.3}Software improvements}{60}{subsection.3.5.3}\protected@file@percent }
-\@writefile{toc}{\contentsline {subsection}{\numberline {3.5.4}Final Remark}{61}{subsection.3.5.4}\protected@file@percent }
+\newlabel{fig:evaporation_simulation_sharpness_stick_simple}{{3.12a}{57}{\relax }{figure.caption.54}{}}
+\newlabel{sub@fig:evaporation_simulation_sharpness_stick_simple}{{a}{57}{\relax }{figure.caption.54}{}}
+\newlabel{fig:evaporation_simulation_sharpness_stick_initial}{{3.12b}{57}{\relax }{figure.caption.54}{}}
+\newlabel{sub@fig:evaporation_simulation_sharpness_stick_initial}{{b}{57}{\relax }{figure.caption.54}{}}
+\newlabel{fig:evaporation_simulation_sharpness_stick_power}{{3.12c}{57}{\relax }{figure.caption.54}{}}
+\newlabel{sub@fig:evaporation_simulation_sharpness_stick_power}{{c}{57}{\relax }{figure.caption.54}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.12}{\ignorespaces (\subref {fig:evaporation_simulation_sharpness_stick_simple}) Comparison of the evaporation with harmonic oscillation. (\subref {fig:evaporation_simulation_sharpness_stick_initial}) initial phase with no elliptical oscillation and then drift to the elliptical shape. (\subref {fig:evaporation_simulation_sharpness_stick_power})an anharmonic oscillation with $\sin (\frac {t}{T} + \phi )^{20}$ . The parameters of the ellipse are the same as in Figure \ref {fig:evaporation_simulation_first_compare}.}}{57}{figure.caption.54}\protected@file@percent }
+\newlabel{fig:evaporation_simulation_sharpness}{{3.12}{57}{(\subref {fig:evaporation_simulation_sharpness_stick_simple}) Comparison of the evaporation with harmonic oscillation. (\subref {fig:evaporation_simulation_sharpness_stick_initial}) initial phase with no elliptical oscillation and then drift to the elliptical shape. (\subref {fig:evaporation_simulation_sharpness_stick_power})an anharmonic oscillation with $\sin (\frac {t}{T} + \phi )^{20}$ . The parameters of the ellipse are the same as in Figure \ref {fig:evaporation_simulation_first_compare}}{figure.caption.54}{}}
+\newlabel{fig:evaporation_simulation_rejection_prev}{{3.13a}{58}{\relax }{figure.caption.55}{}}
+\newlabel{sub@fig:evaporation_simulation_rejection_prev}{{a}{58}{\relax }{figure.caption.55}{}}
+\newlabel{fig:evaporation_simulation_rejection_after}{{3.13b}{58}{\relax }{figure.caption.55}{}}
+\newlabel{sub@fig:evaporation_simulation_rejection_after}{{b}{58}{\relax }{figure.caption.55}{}}
+\newlabel{fig:evaporation_simulation_rejection_comparison}{{3.13c}{58}{\relax }{figure.caption.55}{}}
+\newlabel{sub@fig:evaporation_simulation_rejection_comparison}{{c}{58}{\relax }{figure.caption.55}{}}
+\@writefile{lof}{\contentsline {figure}{\numberline {3.13}{\ignorespaces (\subref {fig:evaporation_simulation_rejection_prev}) simulated evaporation dots without rejection. (\subref {fig:evaporation_simulation_rejection_prev}) with (\subref {fig:evaporation_simulation_rejection_after}) $90$ \% probability to reject a deposition, when no previous deposition happened on the target pixel. (\subref {fig:evaporation_simulation_rejection_comparison}) the AFM image from which the parameters were obtained. The parameters of the ellipse are the same as in Figure \ref {fig:evaporation_simulation_first_compare}.}}{58}{figure.caption.55}\protected@file@percent }
+\newlabel{fig:evaporation_simulation_rejection}{{3.13}{58}{(\subref {fig:evaporation_simulation_rejection_prev}) simulated evaporation dots without rejection. (\subref {fig:evaporation_simulation_rejection_prev}) with (\subref {fig:evaporation_simulation_rejection_after}) $90$ \% probability to reject a deposition, when no previous deposition happened on the target pixel. (\subref {fig:evaporation_simulation_rejection_comparison}) the AFM image from which the parameters were obtained. The parameters of the ellipse are the same as in Figure \ref {fig:evaporation_simulation_first_compare}}{figure.caption.55}{}}
+\@writefile{toc}{\contentsline {subsection}{\numberline {3.5.3}Software improvements}{58}{subsection.3.5.3}\protected@file@percent }
+\@writefile{toc}{\contentsline {subsection}{\numberline {3.5.4}Final Remark}{59}{subsection.3.5.4}\protected@file@percent }
\@setckpt{chap05}{
-\setcounter{page}{62}
+\setcounter{page}{60}
\setcounter{equation}{1}
\setcounter{enumi}{4}
\setcounter{enumii}{0}
@@ -111,7 +111,7 @@
\setcounter{section@level}{2}
\setcounter{Item}{14}
\setcounter{Hfootnote}{1}
-\setcounter{bookmark@seq@number}{39}
+\setcounter{bookmark@seq@number}{38}
\setcounter{parentequation}{0}
\setcounter{FancyVerbLine}{0}
\setcounter{NAT@ctr}{0}
diff --git a/conclusion.aux b/conclusion.aux
index 2966cb08be6f87e5cf85df8bed1fcf1129bd4f0d..665f2069ba938f7349bda25ded52fd918c05f1fd 100644
--- a/conclusion.aux
+++ b/conclusion.aux
@@ -1,9 +1,9 @@
\relax
\providecommand\hyper@newdestlabel[2]{}
\citation{self_epitaxy}
-\@writefile{toc}{\contentsline {chapter}{Conclusions and Outlook}{72}{chapter*.76}\protected@file@percent }
+\@writefile{toc}{\contentsline {chapter}{Conclusions and Outlook}{70}{chapter*.74}\protected@file@percent }
\@setckpt{conclusion}{
-\setcounter{page}{73}
+\setcounter{page}{71}
\setcounter{equation}{1}
\setcounter{enumi}{4}
\setcounter{enumii}{0}
@@ -23,7 +23,7 @@
\setcounter{section@level}{2}
\setcounter{Item}{14}
\setcounter{Hfootnote}{1}
-\setcounter{bookmark@seq@number}{56}
+\setcounter{bookmark@seq@number}{55}
\setcounter{parentequation}{0}
\setcounter{FancyVerbLine}{0}
\setcounter{NAT@ctr}{0}
diff --git a/pdfa.xmpi b/pdfa.xmpi
index b6f940410282f063abe45d2f4de6c476953bf563..d2f6ca8149b4ae9ef4a8f6d1128b764b2c1b8af3 100644
--- a/pdfa.xmpi
+++ b/pdfa.xmpi
@@ -73,15 +73,15 @@
</rdf:Description>
<rdf:Description rdf:about="" xmlns:xmp="http://ns.adobe.com/xap/1.0/">
<xmp:CreatorTool>LaTeX with hyperref</xmp:CreatorTool>
- <xmp:ModifyDate>2024-10-21T01:00:54+02:00</xmp:ModifyDate>
- <xmp:CreateDate>2024-10-21T01:00:54+02:00</xmp:CreateDate>
- <xmp:MetadataDate>2024-10-21T01:00:54+02:00</xmp:MetadataDate>
+ <xmp:ModifyDate>2024-10-21T21:16:07+02:00</xmp:ModifyDate>
+ <xmp:CreateDate>2024-10-21T21:16:07+02:00</xmp:CreateDate>
+ <xmp:MetadataDate>2024-10-21T21:16:07+02:00</xmp:MetadataDate>
</rdf:Description>
<rdf:Description rdf:about="" xmlns:xmpRights = "http://ns.adobe.com/xap/1.0/rights/">
</rdf:Description>
<rdf:Description rdf:about="" xmlns:xmpMM="http://ns.adobe.com/xap/1.0/mm/">
<xmpMM:DocumentID>uuid:C8CFC28F-88E1-7995-E9AD-F6D12EAD346B</xmpMM:DocumentID>
- <xmpMM:InstanceID>uuid:79377725-C151-5C19-D4FA-AE92CB657856</xmpMM:InstanceID>
+ <xmpMM:InstanceID>uuid:32AC96DD-3C97-4C13-7ABB-AA216931FFB2</xmpMM:InstanceID>
</rdf:Description>
</rdf:RDF>
</x:xmpmeta>
diff --git a/thesis.aux b/thesis.aux
index 406701bf3df564d4818dfced7c9d07a382863af0..97db7e913397bc9f34e3759e4f19a72c05efb8c1 100644
--- a/thesis.aux
+++ b/thesis.aux
@@ -6,16 +6,16 @@
\@input{title.aux}
\@input{preface.aux}
\@input{chap01.aux}
-\pgfsyspdfmark {pgfid1}{4736286}{25254965}
-\pgfsyspdfmark {pgfid4}{37433768}{25275739}
-\pgfsyspdfmark {pgfid5}{39282063}{25001013}
+\pgfsyspdfmark {pgfid1}{4736286}{19553333}
+\pgfsyspdfmark {pgfid4}{37433768}{19574107}
+\pgfsyspdfmark {pgfid5}{39282063}{19299381}
\@input{chap04.aux}
\@input{chap05.aux}
\@input{chap03.aux}
\@input{conclusion.aux}
\@input{bibliography.aux}
-\@writefile{toc}{\contentsline {chapter}{List of Abbreviations}{76}{chapter*.78}\protected@file@percent }
+\@writefile{toc}{\contentsline {chapter}{List of Abbreviations}{74}{chapter*.76}\protected@file@percent }
\@input{appendix.aux}
\@input{acknowledgments.aux}
\providecommand\NAT@force@numbers{}\NAT@force@numbers
-\gdef \@abspage@last{98}
+\gdef \@abspage@last{96}
diff --git a/thesis.log b/thesis.log
index 331abe937ee8caaf9621e04e7517b559d9b5a8a4..70847a1d0a1cde7a4274d33c2b914caf73fc3abc 100644
--- a/thesis.log
+++ b/thesis.log
@@ -1,4 +1,4 @@
-This is pdfTeX, Version 3.141592653-2.6-1.40.25 (MiKTeX 24.1) (preloaded format=pdflatex 2024.9.29) 21 OCT 2024 01:00
+This is pdfTeX, Version 3.141592653-2.6-1.40.25 (MiKTeX 24.1) (preloaded format=pdflatex 2024.9.29) 21 OCT 2024 21:16
entering extended mode
restricted \write18 enabled.
%&-line parsing enabled.
@@ -1593,7 +1593,7 @@ pdfTeX warning (ext4): destination with the same identifier (name{page.1}) has
been already used, duplicate ignored
<to be read again>
\relax
-l.45 ...ftware improvements}{60}{subsection.3.5.3}
+l.44 ...{3.5.4}Final Remark}{59}{subsection.3.5.4}
% [1
@@ -1660,7 +1660,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 21--22
[]
-<img/Plots/Background/Penumbra_diagramm.pdf, id=389, 490.1206pt x 456.06708pt>
+<img/Plots/Background/Penumbra_diagramm.pdf, id=384, 490.1206pt x 456.06708pt>
File: img/Plots/Background/Penumbra_diagramm.pdf Graphic file (type pdf)
<use img/Plots/Background/Penumbra_diagramm.pdf>
Package pdftex.def Info: img/Plots/Background/Penumbra_diagramm.pdf used on in
@@ -1677,14 +1677,14 @@ Underfull \hbox (badness 10000) in paragraph at lines 39--41
[]
-<img/Plots/Background/Penumbra_diagramm_tilt.pdf, id=417, 316.68901pt x 226.646
+<img/Plots/Background/Penumbra_diagramm_tilt.pdf, id=412, 316.68901pt x 226.646
1pt>
File: img/Plots/Background/Penumbra_diagramm_tilt.pdf Graphic file (type pdf)
<use img/Plots/Background/Penumbra_diagramm_tilt.pdf>
Package pdftex.def Info: img/Plots/Background/Penumbra_diagramm_tilt.pdf used
on input line 45.
(pdftex.def) Requested size: 207.32315pt x 148.373pt.
-<img/Plots/Background/Penumbra_ImageTilt.pdf, id=418, 371.04158pt x 280.97652pt
+<img/Plots/Background/Penumbra_ImageTilt.pdf, id=413, 371.04158pt x 280.97652pt
>
File: img/Plots/Background/Penumbra_ImageTilt.pdf Graphic file (type pdf)
<use img/Plots/Background/Penumbra_ImageTilt.pdf>
@@ -1692,7 +1692,7 @@ Package pdftex.def Info: img/Plots/Background/Penumbra_ImageTilt.pdf used on i
nput line 50.
(pdftex.def) Requested size: 207.32315pt x 156.99849pt.
(chap02.tex
-<img/EBeamDep.pdf, id=425, 422.32782pt x 512.66531pt>
+<img/EBeamDep.pdf, id=420, 422.32782pt x 512.66531pt>
File: img/EBeamDep.pdf Graphic file (type pdf)
<use img/EBeamDep.pdf>
Package pdftex.def Info: img/EBeamDep.pdf used on input line 9.
@@ -1709,7 +1709,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 22--23
[]
[8 <./img/EBeamDep.pdf>]
-<img/MaskAlignerChamber.pdf, id=551, 569.05513pt x 566.20984pt>
+<img/MaskAlignerChamber.pdf, id=546, 569.05513pt x 566.20984pt>
File: img/MaskAlignerChamber.pdf Graphic file (type pdf)
<use img/MaskAlignerChamber.pdf>
Package pdftex.def Info: img/MaskAlignerChamber.pdf used on input line 40.
@@ -1724,7 +1724,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 57--58
[]
-<img/MA/Evaporator.pdf, id=588, 735.31029pt x 663.98062pt>
+<img/MA/Evaporator.pdf, id=583, 735.31029pt x 663.98062pt>
File: img/MA/Evaporator.pdf Graphic file (type pdf)
<use img/MA/Evaporator.pdf>
Package pdftex.def Info: img/MA/Evaporator.pdf used on input line 61.
@@ -1734,13 +1734,13 @@ Underfull \hbox (badness 10000) in paragraph at lines 66--67
[]
-<img/MA/NomenclatureMaskAlignerFront.pdf, id=595, 466.6252pt x 859.27322pt>
+<img/MA/NomenclatureMaskAlignerFront.pdf, id=590, 466.6252pt x 859.27322pt>
File: img/MA/NomenclatureMaskAlignerFront.pdf Graphic file (type pdf)
<use img/MA/NomenclatureMaskAlignerFront.pdf>
Package pdftex.def Info: img/MA/NomenclatureMaskAlignerFront.pdf used on input
line 71.
(pdftex.def) Requested size: 193.50208pt x 356.32951pt.
-<img/MA/NomenclatureMaskAlignerCrossSec.pdf, id=596, 478.00629pt x 808.05826pt>
+<img/MA/NomenclatureMaskAlignerCrossSec.pdf, id=591, 478.00629pt x 808.05826pt>
File: img/MA/NomenclatureMaskAlignerCrossSec.pdf Graphic file (type pdf)
<use img/MA/NomenclatureMaskAlignerCrossSec.pdf>
@@ -1767,19 +1767,19 @@ Underfull \hbox (badness 10000) in paragraph at lines 96--98
[]
-<img/SlipStickGrafix.pdf, id=679, 865.10777pt x 482.39015pt>
+<img/SlipStickGrafix.pdf, id=674, 865.10777pt x 482.39015pt>
File: img/SlipStickGrafix.pdf Graphic file (type pdf)
<use img/SlipStickGrafix.pdf>
Package pdftex.def Info: img/SlipStickGrafix.pdf used on input line 105.
(pdftex.def) Requested size: 414.6463pt x 231.20605pt.
[14]
-<img/MA/Calibration_screw_image.pdf, id=687, 1220.64026pt x 1220.64026pt>
+<img/MA/Calibration_screw_image.pdf, id=682, 1220.64026pt x 1220.64026pt>
File: img/MA/Calibration_screw_image.pdf Graphic file (type pdf)
<use img/MA/Calibration_screw_image.pdf>
Package pdftex.def Info: img/MA/Calibration_screw_image.pdf used on input line
124.
(pdftex.def) Requested size: 172.77046pt x 172.76964pt.
-<img/Plots/ScrewRot_SwappedPlate.pdf, id=688, 462.52798pt x 346.89601pt>
+<img/Plots/ScrewRot_SwappedPlate.pdf, id=683, 462.52798pt x 346.89601pt>
File: img/Plots/ScrewRot_SwappedPlate.pdf Graphic file (type pdf)
<use img/Plots/ScrewRot_SwappedPlate.pdf>
Package pdftex.def Info: img/Plots/ScrewRot_SwappedPlate.pdf used on input lin
@@ -1800,24 +1800,24 @@ Underfull \hbox (badness 10000) in paragraph at lines 146--149
[]
-<img/CalibrationUHV_Z1.pdf, id=783, 3661.68pt x 3178.48857pt>
+<img/CalibrationUHV_Z1.pdf, id=778, 3661.68pt x 3178.48857pt>
File: img/CalibrationUHV_Z1.pdf Graphic file (type pdf)
<use img/CalibrationUHV_Z1.pdf>
Package pdftex.def Info: img/CalibrationUHV_Z1.pdf used on input line 153.
(pdftex.def) Requested size: 193.50208pt x 167.9547pt.
-<img/CalibrationUHV_Z2_Z3.pdf, id=784, 3661.68pt x 3184.17902pt>
+<img/CalibrationUHV_Z2_Z3.pdf, id=779, 3661.68pt x 3184.17902pt>
File: img/CalibrationUHV_Z2_Z3.pdf Graphic file (type pdf)
<use img/CalibrationUHV_Z2_Z3.pdf>
Package pdftex.def Info: img/CalibrationUHV_Z2_Z3.pdf used on input line 158.
(pdftex.def) Requested size: 193.50208pt x 168.25539pt.
[16 <./img/MA/Calibration_screw_image.pdf> <./img/Plots/ScrewRot_SwappedPlate.p
df>]
-<img/MA/CalibrationZ1.pdf, id=851, 1445.4pt x 1445.4pt>
+<img/MA/CalibrationZ1.pdf, id=846, 1445.4pt x 1445.4pt>
File: img/MA/CalibrationZ1.pdf Graphic file (type pdf)
<use img/MA/CalibrationZ1.pdf>
Package pdftex.def Info: img/MA/CalibrationZ1.pdf used on input line 172.
(pdftex.def) Requested size: 228.05475pt x 228.04869pt.
-<img/MA/CalibrationZ2.pdf, id=852, 1445.4pt x 1445.4pt>
+<img/MA/CalibrationZ2.pdf, id=847, 1445.4pt x 1445.4pt>
File: img/MA/CalibrationZ2.pdf Graphic file (type pdf)
<use img/MA/CalibrationZ2.pdf>
Package pdftex.def Info: img/MA/CalibrationZ2.pdf used on input line 178.
@@ -1831,7 +1831,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 188--195
[]
-<img/Plots/Calibrations/screw_diff_explain.pdf, id=885, 554.82875pt x 464.6079p
+<img/Plots/Calibrations/screw_diff_explain.pdf, id=880, 554.82875pt x 464.6079p
t>
File: img/Plots/Calibrations/screw_diff_explain.pdf Graphic file (type pdf)
<use img/Plots/Calibrations/screw_diff_explain.pdf>
@@ -1843,7 +1843,7 @@ Package pdftex.def Info: img/Plots/Calibrations/screw_diff_explain.pdf used on
pdfTeX warning: pdflatex.exe (file ./img/MA/CalibrationZ2.pdf): PDF inclusion:
multiple pdfs with page group included in a single page
>]
-<img/Plots/Calibrations/80V.pdf, id=925, 578.16pt x 325.215pt>
+<img/Plots/Calibrations/80V.pdf, id=920, 578.16pt x 325.215pt>
File: img/Plots/Calibrations/80V.pdf Graphic file (type pdf)
<use img/Plots/Calibrations/80V.pdf>
Package pdftex.def Info: img/Plots/Calibrations/80V.pdf used on input line 205
@@ -1851,7 +1851,7 @@ Package pdftex.def Info: img/Plots/Calibrations/80V.pdf used on input line 205
(pdftex.def) Requested size: 368.57838pt x 207.32306pt.
[19 <./img/Plots/Calibrations/screw_diff_explain.pdf> <./img/Plots/Calibration
s/80V.pdf>]
-<img/Plots/Calibrations/VoltageBehaviour.pdf, id=1038, 867.24pt x 433.62pt>
+<img/Plots/Calibrations/VoltageBehaviour.pdf, id=1033, 867.24pt x 433.62pt>
File: img/Plots/Calibrations/VoltageBehaviour.pdf Graphic file (type pdf)
<use img/Plots/Calibrations/VoltageBehaviour.pdf>
Package pdftex.def Info: img/Plots/Calibrations/VoltageBehaviour.pdf used on i
@@ -1872,33 +1872,33 @@ Underfull \hbox (badness 10000) in paragraph at lines 235--239
[]
-<img/CameraAlignment_bad_low.pdf, id=1084, 2938.98pt x 1334.9875pt>
+<img/CameraAlignment_bad_low.pdf, id=1079, 2938.98pt x 1334.9875pt>
File: img/CameraAlignment_bad_low.pdf Graphic file (type pdf)
<use img/CameraAlignment_bad_low.pdf>
Package pdftex.def Info: img/CameraAlignment_bad_low.pdf used on input line 24
3.
(pdftex.def) Requested size: 147.43416pt x 66.95699pt.
-<img/CameraAlignment_high.png, id=1085, 2938.98pt x 1334.9875pt>
+<img/CameraAlignment_high.png, id=1080, 2938.98pt x 1334.9875pt>
File: img/CameraAlignment_high.png Graphic file (type png)
<use img/CameraAlignment_high.png>
Package pdftex.def Info: img/CameraAlignment_high.png used on input line 248.
(pdftex.def) Requested size: 147.43416pt x 66.95699pt.
-<img/CameraAlignment_good.png, id=1087, 2938.98pt x 1334.9875pt>
+<img/CameraAlignment_good.png, id=1082, 2938.98pt x 1334.9875pt>
File: img/CameraAlignment_good.png Graphic file (type png)
<use img/CameraAlignment_good.png>
Package pdftex.def Info: img/CameraAlignment_good.png used on input line 253.
(pdftex.def) Requested size: 147.43416pt x 66.95699pt.
-<img/OpticalAlign01.png, id=1092, 977.6525pt x 977.6525pt>
+<img/OpticalAlign01.png, id=1087, 977.6525pt x 977.6525pt>
File: img/OpticalAlign01.png Graphic file (type png)
<use img/OpticalAlign01.png>
Package pdftex.def Info: img/OpticalAlign01.png used on input line 270.
(pdftex.def) Requested size: 147.43416pt x 147.43219pt.
-<img/OpticalAlign02.png, id=1093, 977.6525pt x 977.6525pt>
+<img/OpticalAlign02.png, id=1088, 977.6525pt x 977.6525pt>
File: img/OpticalAlign02.png Graphic file (type png)
<use img/OpticalAlign02.png>
Package pdftex.def Info: img/OpticalAlign02.png used on input line 275.
(pdftex.def) Requested size: 147.43416pt x 147.43219pt.
-<img/OpticalAlign03.png, id=1094, 977.6525pt x 977.6525pt>
+<img/OpticalAlign03.png, id=1089, 977.6525pt x 977.6525pt>
File: img/OpticalAlign03.png Graphic file (type png)
<use img/OpticalAlign03.png>
Package pdftex.def Info: img/OpticalAlign03.png used on input line 280.
@@ -1908,14 +1908,14 @@ Package pdftex.def Info: img/OpticalAlign03.png used on input line 280.
> <./img/OpticalAlign03.png>]
LaTeX Font Info: External font `lmex10' loaded for size
(Font) <5> on input line 294.
-<img/MA/NomeclatureMotorsAndCapacitance.pdf, id=1122, 597.50786pt x 597.50786pt
+<img/MA/NomeclatureMotorsAndCapacitance.pdf, id=1117, 597.50786pt x 597.50786pt
>
File: img/MA/NomeclatureMotorsAndCapacitance.pdf Graphic file (type pdf)
<use img/MA/NomeclatureMotorsAndCapacitance.pdf>
Package pdftex.def Info: img/MA/NomeclatureMotorsAndCapacitance.pdf used on in
put line 301.
(pdftex.def) Requested size: 228.05475pt x 228.04912pt.
-<img/MA/Mask.pdf, id=1123, 477.04668pt x 674.3149pt>
+<img/MA/Mask.pdf, id=1118, 477.04668pt x 674.3149pt>
File: img/MA/Mask.pdf Graphic file (type pdf)
<use img/MA/Mask.pdf>
Package pdftex.def Info: img/MA/Mask.pdf used on input line 306.
@@ -1925,36 +1925,36 @@ Package pdftex.def Info: img/MA/Mask.pdf used on input line 306.
pdfTeX warning: pdflatex.exe (file ./img/MA/Mask.pdf): PDF inclusion: multiple
pdfs with page group included in a single page
>]
-<img/MA/SchaltDiagramRHK.pdf, id=1218, 544.13278pt x 385.4176pt>
+<img/MA/SchaltDiagramRHK.pdf, id=1213, 544.13278pt x 385.4176pt>
File: img/MA/SchaltDiagramRHK.pdf Graphic file (type pdf)
<use img/MA/SchaltDiagramRHK.pdf>
Package pdftex.def Info: img/MA/SchaltDiagramRHK.pdf used on input line 318.
(pdftex.def) Requested size: 345.54092pt x 244.7492pt.
-<img/Diagram/ApproachExplanation.pdf, id=1220, 578.16pt x 433.62pt>
+<img/Diagram/ApproachExplanation.pdf, id=1215, 578.16pt x 433.62pt>
File: img/Diagram/ApproachExplanation.pdf Graphic file (type pdf)
<use img/Diagram/ApproachExplanation.pdf>
Package pdftex.def Info: img/Diagram/ApproachExplanation.pdf used on input lin
e 344.
(pdftex.def) Requested size: 207.32315pt x 155.48775pt.
-<img/Diagram/ApproachExplanation_diff.pdf, id=1221, 578.16pt x 433.62pt>
+<img/Diagram/ApproachExplanation_diff.pdf, id=1216, 578.16pt x 433.62pt>
File: img/Diagram/ApproachExplanation_diff.pdf Graphic file (type pdf)
<use img/Diagram/ApproachExplanation_diff.pdf>
Package pdftex.def Info: img/Diagram/ApproachExplanation_diff.pdf used on inpu
t line 349.
(pdftex.def) Requested size: 207.32315pt x 155.48775pt.
-<img/Diagram/ApproachCurve_FirstContact.png, id=1222, 1084.05pt x 513.92pt>
+<img/Diagram/ApproachCurve_FirstContact.png, id=1217, 1084.05pt x 513.92pt>
File: img/Diagram/ApproachCurve_FirstContact.png Graphic file (type png)
<use img/Diagram/ApproachCurve_FirstContact.png>
Package pdftex.def Info: img/Diagram/ApproachCurve_FirstContact.png used on in
put line 355.
(pdftex.def) Requested size: 138.21777pt x 65.51805pt.
-<img/Diagram/ApproachCurve_SecondContact.png, id=1223, 1084.05pt x 513.92pt>
+<img/Diagram/ApproachCurve_SecondContact.png, id=1218, 1084.05pt x 513.92pt>
File: img/Diagram/ApproachCurve_SecondContact.png Graphic file (type png)
<use img/Diagram/ApproachCurve_SecondContact.png>
Package pdftex.def Info: img/Diagram/ApproachCurve_SecondContact.png used on i
nput line 361.
(pdftex.def) Requested size: 138.21777pt x 65.51805pt.
-<img/Diagram/ApproachCurve_FullContact.png, id=1224, 1084.05pt x 513.92pt>
+<img/Diagram/ApproachCurve_FullContact.png, id=1219, 1084.05pt x 513.92pt>
File: img/Diagram/ApproachCurve_FullContact.png Graphic file (type png)
<use img/Diagram/ApproachCurve_FullContact.png>
Package pdftex.def Info: img/Diagram/ApproachCurve_FullContact.png used on inp
@@ -1977,65 +1977,40 @@ Underfull \hbox (badness 10000) in paragraph at lines 393--403
[24 <./img/Diagram/ApproachExplanation.pdf> <./img/Diagram/ApproachExplanation_
diff.pdf> <./img/Diagram/ApproachCurve_FirstContact.png> <./img/Diagram/Approac
-hCurve_SecondContact.png> <./img/Diagram/ApproachCurve_FullContact.png>]
-<img/MA/InsertionReproducibility.pdf, id=1458, 578.16pt x 361.35pt>
-File: img/MA/InsertionReproducibility.pdf Graphic file (type pdf)
-<use img/MA/InsertionReproducibility.pdf>
-Package pdftex.def Info: img/MA/InsertionReproducibility.pdf used on input lin
-e 434.
-(pdftex.def) Requested size: 228.05475pt x 142.53043pt.
-<img/MA/InsertionReproducibility_diff.pdf, id=1459, 578.16pt x 361.35pt>
-File: img/MA/InsertionReproducibility_diff.pdf Graphic file (type pdf)
-<use img/MA/InsertionReproducibility_diff.pdf>
-Package pdftex.def Info: img/MA/InsertionReproducibility_diff.pdf used on inpu
-t line 439.
-(pdftex.def) Requested size: 228.05475pt x 142.53043pt.
-
-Underfull \hbox (badness 10000) in paragraph at lines 449--450
-
- []
-
-[25 <./img/MA/InsertionReproducibility.pdf> <./img/MA/InsertionReproducibility_
-diff.pdf>]
-Underfull \hbox (badness 10000) in paragraph at lines 451--452
-
- []
-
-[26])
+hCurve_SecondContact.png> <./img/Diagram/ApproachCurve_FullContact.png>])
+[25]
Underfull \hbox (badness 10000) in paragraph at lines 66--68
[]
-<img/Plots/Background/AFMDiagram.pdf, id=1552, 525.07625pt x 367.71567pt>
+<img/Plots/Background/AFMDiagram.pdf, id=1468, 525.07625pt x 367.71567pt>
File: img/Plots/Background/AFMDiagram.pdf Graphic file (type pdf)
<use img/Plots/Background/AFMDiagram.pdf>
Package pdftex.def Info: img/Plots/Background/AFMDiagram.pdf used on input lin
e 73.
(pdftex.def) Requested size: 322.50345pt x 225.85481pt.
-[27]
-<img/Plots/AFMPotential.pdf, id=1563, 433.62pt x 289.08pt>
+[26 <./img/Plots/Background/AFMDiagram.pdf>]
+<img/Plots/AFMPotential.pdf, id=1559, 433.62pt x 289.08pt>
File: img/Plots/AFMPotential.pdf Graphic file (type pdf)
<use img/Plots/AFMPotential.pdf>
Package pdftex.def Info: img/Plots/AFMPotential.pdf used on input line 83.
(pdftex.def) Requested size: 322.50345pt x 215.01418pt.
- [28 <./img/Plots/Background/AFMDiagram.pdf>]
LaTeX Font Info: Trying to load font information for TS1+lmr on input line 9
6.
(C:\Users\Luzifer\AppData\Local\Programs\MiKTeX\tex/latex/lm\ts1lmr.fd
File: ts1lmr.fd 2015/05/01 v1.6.1 Font defs for Latin Modern
)
-[29{C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/enc/dvips/lm/lm-ts1.en
-c} <./img/Plots/AFMPotential.pdf>]
+[27 <./img/Plots/AFMPotential.pdf>]
Package hyperref Info: bookmark level for unknown todo defaults to 0 on input l
ine 107.
-<img/Plots/Background/SEMSetup.png, id=1696, 481.8pt x 642.4803pt>
+<img/Plots/Background/SEMSetup.png, id=1604, 481.8pt x 642.4803pt>
File: img/Plots/Background/SEMSetup.png Graphic file (type png)
<use img/Plots/Background/SEMSetup.png>
Package pdftex.def Info: img/Plots/Background/SEMSetup.png used on input line
115.
(pdftex.def) Requested size: 186.58957pt x 248.8115pt.
-<img/Plots/Background/Electron_Beam_Matter_Interaction.pdf, id=1697, 227.93503p
+<img/Plots/Background/Electron_Beam_Matter_Interaction.pdf, id=1605, 227.93503p
t x 203.94936pt>
File: img/Plots/Background/Electron_Beam_Matter_Interaction.pdf Graphic file (t
ype pdf)
@@ -2043,7 +2018,8 @@ ype pdf)
Package pdftex.def Info: img/Plots/Background/Electron_Beam_Matter_Interaction.
pdf used on input line 120.
(pdftex.def) Requested size: 186.58957pt x 166.96257pt.
- [30]
+ [28{C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/enc/dvips/lm/lm-ts1.e
+nc}]
Underfull \hbox (badness 10000) in paragraph at lines 128--129
[]
@@ -2053,7 +2029,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 130--132
[]
-[31 <./img/Plots/Background/SEMSetup.png> <./img/Plots/Background/Electron_Beam
+[29 <./img/Plots/Background/SEMSetup.png> <./img/Plots/Background/Electron_Beam
_Matter_Interaction.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 133--135
@@ -2064,24 +2040,24 @@ Underfull \hbox (badness 10000) in paragraph at lines 136--130
[]
-[32]
+[30]
\openout2 = `chap04.aux'.
(chap04.tex
Chapter 2.
-<img/Repairs/NomeclatureDiagram.pdf, id=1775, 542.86818pt x 488.42506pt>
+<img/Repairs/NomeclatureDiagram.pdf, id=1684, 542.86818pt x 488.42506pt>
File: img/Repairs/NomeclatureDiagram.pdf Graphic file (type pdf)
<use img/Repairs/NomeclatureDiagram.pdf>
Package pdftex.def Info: img/Repairs/NomeclatureDiagram.pdf used on input line
10.
(pdftex.def) Requested size: 216.53954pt x 194.82251pt.
-<img/Repairs/nomeclaturediagram_side.png, id=1776, 1053.6966pt x 1118.0169pt>
+<img/Repairs/nomeclaturediagram_side.png, id=1685, 1053.6966pt x 1118.0169pt>
File: img/Repairs/nomeclaturediagram_side.png Graphic file (type png)
<use img/Repairs/nomeclaturediagram_side.png>
Package pdftex.def Info: img/Repairs/nomeclaturediagram_side.png used on input
line 15.
(pdftex.def) Requested size: 195.80792pt x 207.7511pt.
-[33
+[31
@@ -2097,31 +2073,31 @@ Underfull \hbox (badness 10000) in paragraph at lines 52--54
[]
-<img/Repairs/SolderAnchorsBase.pdf, id=1800, 467.37352pt x 406.31995pt>
+<img/Repairs/SolderAnchorsBase.pdf, id=1709, 467.37352pt x 406.31995pt>
File: img/Repairs/SolderAnchorsBase.pdf Graphic file (type pdf)
<use img/Repairs/SolderAnchorsBase.pdf>
Package pdftex.def Info: img/Repairs/SolderAnchorsBase.pdf used on input line
58.
(pdftex.def) Requested size: 110.57463pt x 96.12999pt.
-<img/Repairs/SolderAnchorsSmallerDot.pdf, id=1801, 467.37352pt x 406.31995pt>
+<img/Repairs/SolderAnchorsSmallerDot.pdf, id=1710, 467.37352pt x 406.31995pt>
File: img/Repairs/SolderAnchorsSmallerDot.pdf Graphic file (type pdf)
<use img/Repairs/SolderAnchorsSmallerDot.pdf>
Package pdftex.def Info: img/Repairs/SolderAnchorsSmallerDot.pdf used on input
line 63.
(pdftex.def) Requested size: 110.57463pt x 96.12999pt.
-<img/Repairs/SolderAnchorsAlO.pdf, id=1802, 467.37352pt x 406.31995pt>
+<img/Repairs/SolderAnchorsAlO.pdf, id=1711, 467.37352pt x 406.31995pt>
File: img/Repairs/SolderAnchorsAlO.pdf Graphic file (type pdf)
<use img/Repairs/SolderAnchorsAlO.pdf>
Package pdftex.def Info: img/Repairs/SolderAnchorsAlO.pdf used on input line 6
8.
(pdftex.def) Requested size: 110.57463pt x 96.12999pt.
-<img/Repairs/SolderAnchorsGlueTop.pdf, id=1803, 467.37352pt x 406.31995pt>
+<img/Repairs/SolderAnchorsGlueTop.pdf, id=1712, 467.37352pt x 406.31995pt>
File: img/Repairs/SolderAnchorsGlueTop.pdf Graphic file (type pdf)
<use img/Repairs/SolderAnchorsGlueTop.pdf>
Package pdftex.def Info: img/Repairs/SolderAnchorsGlueTop.pdf used on input li
ne 73.
(pdftex.def) Requested size: 110.57463pt x 96.12999pt.
-[34]
+[32]
Underfull \hbox (badness 10000) in paragraph at lines 81--83
[]
@@ -2141,7 +2117,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 89--90
[]
-[35 <./img/Repairs/SolderAnchorsBase.pdf> <./img/Repairs/SolderAnchorsSmallerDo
+[33 <./img/Repairs/SolderAnchorsBase.pdf> <./img/Repairs/SolderAnchorsSmallerDo
t.pdf
pdfTeX warning: pdflatex.exe (file ./img/Repairs/SolderAnchorsSmallerDot.pdf):
@@ -2155,14 +2131,14 @@ lusion: multiple pdfs with page group included in a single page
pdfTeX warning: pdflatex.exe (file ./img/Repairs/SolderAnchorsGlueTop.pdf): PDF
inclusion: multiple pdfs with page group included in a single page
>]
-<img/Repairs/SolderAnchors/Solder_shear_big.png, id=1835, 1575.8875pt x 1798.72
+<img/Repairs/SolderAnchors/Solder_shear_big.png, id=1744, 1575.8875pt x 1798.72
pt>
File: img/Repairs/SolderAnchors/Solder_shear_big.png Graphic file (type png)
<use img/Repairs/SolderAnchors/Solder_shear_big.png>
Package pdftex.def Info: img/Repairs/SolderAnchors/Solder_shear_big.png used o
n input line 95.
(pdftex.def) Requested size: 145.12872pt x 165.63794pt.
-<img/Repairs/SolderAnchors/Solder_shear_smaller.png, id=1836, 1575.8875pt x 179
+<img/Repairs/SolderAnchors/Solder_shear_smaller.png, id=1745, 1575.8875pt x 179
8.72pt>
File: img/Repairs/SolderAnchors/Solder_shear_smaller.png Graphic file (type png
)
@@ -2170,13 +2146,13 @@ File: img/Repairs/SolderAnchors/Solder_shear_smaller.png Graphic file (type png
Package pdftex.def Info: img/Repairs/SolderAnchors/Solder_shear_smaller.png us
ed on input line 101.
(pdftex.def) Requested size: 145.12872pt x 165.63794pt.
-<img/Repairs/SolderAnchors/GlueBelow.png, id=1837, 2457.18pt x 2055.68pt>
+<img/Repairs/SolderAnchors/GlueBelow.png, id=1746, 2457.18pt x 2055.68pt>
File: img/Repairs/SolderAnchors/GlueBelow.png Graphic file (type png)
<use img/Repairs/SolderAnchors/GlueBelow.png>
Package pdftex.def Info: img/Repairs/SolderAnchors/GlueBelow.png used on input
line 107.
(pdftex.def) Requested size: 145.12872pt x 121.39072pt.
-<img/Repairs/SolderAnchors/AlO.png, id=1838, 2457.18pt x 2055.68pt>
+<img/Repairs/SolderAnchors/AlO.png, id=1747, 2457.18pt x 2055.68pt>
File: img/Repairs/SolderAnchors/AlO.png Graphic file (type png)
<use img/Repairs/SolderAnchors/AlO.png>
Package pdftex.def Info: img/Repairs/SolderAnchors/AlO.png used on input line
@@ -2187,29 +2163,29 @@ Underfull \hbox (badness 10000) in paragraph at lines 121--124
[]
-[36 <./img/Repairs/SolderAnchors/Solder_shear_big.png> <./img/Repairs/SolderAnc
+[34 <./img/Repairs/SolderAnchors/Solder_shear_big.png> <./img/Repairs/SolderAnc
hors/Solder_shear_smaller.png> <./img/Repairs/SolderAnchors/GlueBelow.png> <./i
mg/Repairs/SolderAnchors/AlO.png>]
Underfull \hbox (badness 10000) in paragraph at lines 126--127
[]
-<img/Repairs/Z3-PiezoOff.png, id=1861, 2055.68pt x 1399.2275pt>
+<img/Repairs/Z3-PiezoOff.png, id=1769, 2055.68pt x 1399.2275pt>
File: img/Repairs/Z3-PiezoOff.png Graphic file (type png)
<use img/Repairs/Z3-PiezoOff.png>
Package pdftex.def Info: img/Repairs/Z3-PiezoOff.png used on input line 132.
(pdftex.def) Requested size: 156.64394pt x 106.60286pt.
-<img/Repairs/Z3-scratched.png, id=1862, 2055.68pt x 1399.2275pt>
+<img/Repairs/Z3-scratched.png, id=1770, 2055.68pt x 1399.2275pt>
File: img/Repairs/Z3-scratched.png Graphic file (type png)
<use img/Repairs/Z3-scratched.png>
Package pdftex.def Info: img/Repairs/Z3-scratched.png used on input line 138.
(pdftex.def) Requested size: 156.64394pt x 106.60286pt.
-<img/Repairs/Z3-GlueDot.png, id=1863, 2055.68pt x 1399.2275pt>
+<img/Repairs/Z3-GlueDot.png, id=1771, 2055.68pt x 1399.2275pt>
File: img/Repairs/Z3-GlueDot.png Graphic file (type png)
<use img/Repairs/Z3-GlueDot.png>
Package pdftex.def Info: img/Repairs/Z3-GlueDot.png used on input line 144.
(pdftex.def) Requested size: 156.64394pt x 106.60286pt.
-<img/Repairs/Z3-WeightDown.png, id=1864, 2055.68pt x 1399.2275pt>
+<img/Repairs/Z3-WeightDown.png, id=1772, 2055.68pt x 1399.2275pt>
File: img/Repairs/Z3-WeightDown.png Graphic file (type png)
<use img/Repairs/Z3-WeightDown.png>
Package pdftex.def Info: img/Repairs/Z3-WeightDown.png used on input line 150.
@@ -2220,21 +2196,21 @@ Underfull \hbox (badness 10000) in paragraph at lines 158--159
[]
-[37 <./img/Repairs/Z3-PiezoOff.png> <./img/Repairs/Z3-scratched.png> <./img/Rep
+[35 <./img/Repairs/Z3-PiezoOff.png> <./img/Repairs/Z3-scratched.png> <./img/Rep
airs/Z3-GlueDot.png> <./img/Repairs/Z3-WeightDown.png>]
-<img/Repairs/Z3-afterglue.pdf, id=1878, 2055.68pt x 1399.22762pt>
+<img/Repairs/Z3-afterglue.pdf, id=1786, 2055.68pt x 1399.22762pt>
File: img/Repairs/Z3-afterglue.pdf Graphic file (type pdf)
<use img/Repairs/Z3-afterglue.pdf>
Package pdftex.def Info: img/Repairs/Z3-afterglue.pdf used on input line 165.
(pdftex.def) Requested size: 322.50345pt x 219.50415pt.
-<img/Repairs/ScrewRot_CompareSwappedPlate.pdf, id=1880, 462.52798pt x 346.89601
+<img/Repairs/ScrewRot_CompareSwappedPlate.pdf, id=1788, 462.52798pt x 346.89601
pt>
File: img/Repairs/ScrewRot_CompareSwappedPlate.pdf Graphic file (type pdf)
<use img/Repairs/ScrewRot_CompareSwappedPlate.pdf>
Package pdftex.def Info: img/Repairs/ScrewRot_CompareSwappedPlate.pdf used on
input line 175.
(pdftex.def) Requested size: 322.50345pt x 241.88864pt.
- [38 <./img/Repairs/Z3-afterglue.pdf>]
+ [36 <./img/Repairs/Z3-afterglue.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 184--185
[]
@@ -2249,8 +2225,8 @@ Underfull \hbox (badness 10000) in paragraph at lines 188--189
[]
-[39 <./img/Repairs/ScrewRot_CompareSwappedPlate.pdf>]
-<img/Repairs/ScrewRot_SwappedPlate.pdf, id=1962, 462.52798pt x 346.89601pt>
+[37 <./img/Repairs/ScrewRot_CompareSwappedPlate.pdf>]
+<img/Repairs/ScrewRot_SwappedPlate.pdf, id=1871, 462.52798pt x 346.89601pt>
File: img/Repairs/ScrewRot_SwappedPlate.pdf Graphic file (type pdf)
<use img/Repairs/ScrewRot_SwappedPlate.pdf>
Package pdftex.def Info: img/Repairs/ScrewRot_SwappedPlate.pdf used on input l
@@ -2271,13 +2247,13 @@ Underfull \hbox (badness 10000) in paragraph at lines 202--203
[]
-[40 <./img/Repairs/ScrewRot_SwappedPlate.pdf>]
-<img/Repairs/GlueAid.png, id=2021, 302.0886pt x 542.7477pt>
+[38 <./img/Repairs/ScrewRot_SwappedPlate.pdf>]
+<img/Repairs/GlueAid.png, id=1930, 302.0886pt x 542.7477pt>
File: img/Repairs/GlueAid.png Graphic file (type png)
<use img/Repairs/GlueAid.png>
Package pdftex.def Info: img/Repairs/GlueAid.png used on input line 210.
(pdftex.def) Requested size: 125.4308pt x 225.35204pt.
-<img/Repairs/NewFrontPlate.png, id=2022, 1507.6325pt x 1969.3575pt>
+<img/Repairs/NewFrontPlate.png, id=1931, 1507.6325pt x 1969.3575pt>
File: img/Repairs/NewFrontPlate.png Graphic file (type png)
<use img/Repairs/NewFrontPlate.png>
Package pdftex.def Info: img/Repairs/NewFrontPlate.png used on input line 216.
@@ -2288,36 +2264,36 @@ Underfull \hbox (badness 10000) in paragraph at lines 227--228
[]
-<img/Repairs/WeakerCapacitor.pdf, id=2029, 597.50786pt x 597.50786pt>
+<img/Repairs/WeakerCapacitor.pdf, id=1938, 597.50786pt x 597.50786pt>
File: img/Repairs/WeakerCapacitor.pdf Graphic file (type pdf)
<use img/Repairs/WeakerCapacitor.pdf>
Package pdftex.def Info: img/Repairs/WeakerCapacitor.pdf used on input line 23
3.
(pdftex.def) Requested size: 207.32315pt x 207.31654pt.
-[41 <./img/Repairs/GlueAid.png> <./img/Repairs/NewFrontPlate.png>]
-<img/Repairs/FeedThroughtLeft.pdf, id=2037, 2663.9525pt x 2465.21pt>
+[39 <./img/Repairs/GlueAid.png> <./img/Repairs/NewFrontPlate.png>]
+<img/Repairs/FeedThroughtLeft.pdf, id=1946, 2663.9525pt x 2465.21pt>
File: img/Repairs/FeedThroughtLeft.pdf Graphic file (type pdf)
<use img/Repairs/FeedThroughtLeft.pdf>
Package pdftex.def Info: img/Repairs/FeedThroughtLeft.pdf used on input line 2
44.
(pdftex.def) Requested size: 216.6513pt x 200.45581pt.
-<img/Repairs/FeedThroughtRight.pdf, id=2038, 2663.9525pt x 2465.21pt>
+<img/Repairs/FeedThroughtRight.pdf, id=1947, 2663.9525pt x 2465.21pt>
File: img/Repairs/FeedThroughtRight.pdf Graphic file (type pdf)
<use img/Repairs/FeedThroughtRight.pdf>
Package pdftex.def Info: img/Repairs/FeedThroughtRight.pdf used on input line
249.
(pdftex.def) Requested size: 216.6513pt x 200.45581pt.
- [42 <./img/Repairs/WeakerCapacitor.pdf>]
+ [40 <./img/Repairs/WeakerCapacitor.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 257--258
[]
-<img/Repairs/80.0V.pdf, id=2063, 578.16pt x 324.92592pt>
+<img/Repairs/80.0V.pdf, id=1971, 578.16pt x 324.92592pt>
File: img/Repairs/80.0V.pdf Graphic file (type pdf)
<use img/Repairs/80.0V.pdf>
Package pdftex.def Info: img/Repairs/80.0V.pdf used on input line 280.
(pdftex.def) Requested size: 368.57838pt x 207.13876pt.
-[43 <./img/Repairs/FeedThroughtLeft.pdf> <./img/Repairs/FeedThroughtRight.pdf
+[41 <./img/Repairs/FeedThroughtLeft.pdf> <./img/Repairs/FeedThroughtRight.pdf
pdfTeX warning: pdflatex.exe (file ./img/Repairs/FeedThroughtRight.pdf): PDF in
clusion: multiple pdfs with page group included in a single page
@@ -2326,12 +2302,12 @@ Underfull \hbox (badness 10000) in paragraph at lines 285--133
[]
-[44 <./img/Repairs/80.0V.pdf>]
+[42 <./img/Repairs/80.0V.pdf>]
\openout2 = `chap05.aux'.
(chap05.tex
Chapter 3.
-<img/Evaporation/Approach_Curve_Field01.pdf, id=2165, 1156.32pt x 650.43pt>
+<img/Evaporation/Approach_Curve_Field01.pdf, id=2074, 1156.32pt x 650.43pt>
File: img/Evaporation/Approach_Curve_Field01.pdf Graphic file (type pdf)
<use img/Evaporation/Approach_Curve_Field01.pdf>
Package pdftex.def Info: img/Evaporation/Approach_Curve_Field01.pdf used on in
@@ -2342,7 +2318,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 18--19
[]
-[45
+[43
@@ -2352,46 +2328,46 @@ Underfull \hbox (badness 10000) in paragraph at lines 28--29
[]
-<img/Evaporation/SampleImage.pdf, id=2226, 299.74013pt x 380.17047pt>
+<img/Evaporation/SampleImage.pdf, id=2135, 299.74013pt x 380.17047pt>
File: img/Evaporation/SampleImage.pdf Graphic file (type pdf)
<use img/Evaporation/SampleImage.pdf>
Package pdftex.def Info: img/Evaporation/SampleImage.pdf used on input line 34
.
(pdftex.def) Requested size: 186.58957pt x 236.6604pt.
-<img/Evaporation/Mask01_Aspect.png, id=2227, 367.3725pt x 462.528pt>
+<img/Evaporation/Mask01_Aspect.png, id=2136, 367.3725pt x 462.528pt>
File: img/Evaporation/Mask01_Aspect.png Graphic file (type png)
<use img/Evaporation/Mask01_Aspect.png>
Package pdftex.def Info: img/Evaporation/Mask01_Aspect.png used on input line
40.
(pdftex.def) Requested size: 186.58957pt x 234.92632pt.
-[46 <./img/Evaporation/SampleImage.pdf> <./img/Evaporation/Mask01_Aspect.png>]
-<img/Evaporation/Contamination.png, id=2248, 1325.95375pt x 1097.09875pt>
+[44 <./img/Evaporation/SampleImage.pdf> <./img/Evaporation/Mask01_Aspect.png>]
+<img/Evaporation/Contamination.png, id=2157, 1325.95375pt x 1097.09875pt>
File: img/Evaporation/Contamination.png Graphic file (type png)
<use img/Evaporation/Contamination.png>
Package pdftex.def Info: img/Evaporation/Contamination.png used on input line
59.
(pdftex.def) Requested size: 216.6513pt x 179.25574pt.
-<img/Evaporation/Contamination.pdf, id=2249, 433.62pt x 361.35pt>
+<img/Evaporation/Contamination.pdf, id=2158, 433.62pt x 361.35pt>
File: img/Evaporation/Contamination.pdf Graphic file (type pdf)
<use img/Evaporation/Contamination.pdf>
Package pdftex.def Info: img/Evaporation/Contamination.pdf used on input line
65.
(pdftex.def) Requested size: 228.05475pt x 190.04793pt.
-[47 <./img/Evaporation/Contamination.png> <./img/Evaporation/Contamination.pdf>
+[45 <./img/Evaporation/Contamination.png> <./img/Evaporation/Contamination.pdf>
]
Underfull \hbox (badness 10000) in paragraph at lines 80--81
[]
-<img/Plots/Background/IllustrationSigmas.pdf, id=2292, 944.027pt x 810.77919pt>
+<img/Plots/Background/IllustrationSigmas.pdf, id=2201, 944.027pt x 810.77919pt>
File: img/Plots/Background/IllustrationSigmas.pdf Graphic file (type pdf)
<use img/Plots/Background/IllustrationSigmas.pdf>
Package pdftex.def Info: img/Plots/Background/IllustrationSigmas.pdf used on i
nput line 85.
(pdftex.def) Requested size: 214.46744pt x 184.18657pt.
-<img/Evaporation/Field3_TR.pdf, id=2293, 957.5775pt x 812.28468pt>
+<img/Evaporation/Field3_TR.pdf, id=2202, 957.5775pt x 812.28468pt>
File: img/Evaporation/Field3_TR.pdf Graphic file (type pdf)
<use img/Evaporation/Field3_TR.pdf>
Package pdftex.def Info: img/Evaporation/Field3_TR.pdf used on input line 90.
@@ -2401,57 +2377,57 @@ Underfull \hbox (badness 10000) in paragraph at lines 99--100
[]
-[48 <./img/Plots/Background/IllustrationSigmas.pdf> <./img/Evaporation/Field3_T
+[46 <./img/Plots/Background/IllustrationSigmas.pdf> <./img/Evaporation/Field3_T
R.pdf
pdfTeX warning: pdflatex.exe (file ./img/Evaporation/Field3_TR.pdf): PDF inclus
ion: multiple pdfs with page group included in a single page
>]
-<img/Evaporation/Field5_top_demo01.png, id=2336, 1337.99875pt x 1097.09875pt>
+<img/Evaporation/Field5_top_demo01.png, id=2244, 1337.99875pt x 1097.09875pt>
File: img/Evaporation/Field5_top_demo01.png Graphic file (type png)
<use img/Evaporation/Field5_top_demo01.png>
Package pdftex.def Info: img/Evaporation/Field5_top_demo01.png used on input l
ine 120.
(pdftex.def) Requested size: 196.95636pt x 161.49422pt.
-<img/Evaporation/Field5_top_demo02.png, id=2337, 1335.99126pt x 1089.06876pt>
+<img/Evaporation/Field5_top_demo02.png, id=2245, 1335.99126pt x 1089.06876pt>
File: img/Evaporation/Field5_top_demo02.png Graphic file (type png)
<use img/Evaporation/Field5_top_demo02.png>
Package pdftex.def Info: img/Evaporation/Field5_top_demo02.png used on input l
ine 125.
(pdftex.def) Requested size: 196.95636pt x 160.54485pt.
-<img/Evaporation/TopField5Fit.pdf, id=2338, 462.52798pt x 346.89601pt>
+<img/Evaporation/TopField5Fit.pdf, id=2246, 462.52798pt x 346.89601pt>
File: img/Evaporation/TopField5Fit.pdf Graphic file (type pdf)
<use img/Evaporation/TopField5Fit.pdf>
Package pdftex.def Info: img/Evaporation/TopField5Fit.pdf used on input line 1
30.
(pdftex.def) Requested size: 262.61292pt x 196.97055pt.
- [49{C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/enc/dvips/lm/lm-mathe
+ [47{C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/enc/dvips/lm/lm-mathe
x.enc}]
-<img/Evaporation/sigmas_summary.pdf, id=2347, 433.62pt x 289.08pt>
+<img/Evaporation/sigmas_summary.pdf, id=2255, 433.62pt x 289.08pt>
File: img/Evaporation/sigmas_summary.pdf Graphic file (type pdf)
<use img/Evaporation/sigmas_summary.pdf>
Package pdftex.def Info: img/Evaporation/sigmas_summary.pdf used on input line
142.
(pdftex.def) Requested size: 228.05475pt x 152.03833pt.
-<img/Evaporation/sigmal_summary.pdf, id=2348, 433.62pt x 289.08pt>
+<img/Evaporation/sigmal_summary.pdf, id=2256, 433.62pt x 289.08pt>
File: img/Evaporation/sigmal_summary.pdf Graphic file (type pdf)
<use img/Evaporation/sigmal_summary.pdf>
Package pdftex.def Info: img/Evaporation/sigmal_summary.pdf used on input line
147.
(pdftex.def) Requested size: 228.05475pt x 152.03833pt.
-<img/Evaporation/heights_summary.pdf, id=2349, 433.62pt x 289.08pt>
+<img/Evaporation/heights_summary.pdf, id=2257, 433.62pt x 289.08pt>
File: img/Evaporation/heights_summary.pdf Graphic file (type pdf)
<use img/Evaporation/heights_summary.pdf>
Package pdftex.def Info: img/Evaporation/heights_summary.pdf used on input lin
e 152.
(pdftex.def) Requested size: 228.05475pt x 152.03833pt.
-<img/Evaporation/umbra_summary.pdf, id=2350, 433.62pt x 289.08pt>
+<img/Evaporation/umbra_summary.pdf, id=2258, 433.62pt x 289.08pt>
File: img/Evaporation/umbra_summary.pdf Graphic file (type pdf)
<use img/Evaporation/umbra_summary.pdf>
Package pdftex.def Info: img/Evaporation/umbra_summary.pdf used on input line
157.
(pdftex.def) Requested size: 228.05475pt x 152.03833pt.
- [50 <./img/Evaporation/Field5_top_demo01.png> <./img/Evaporation/Field5_top_de
+ [48 <./img/Evaporation/Field5_top_demo01.png> <./img/Evaporation/Field5_top_de
mo02.png> <./img/Evaporation/TopField5Fit.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 164--166
@@ -2462,7 +2438,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 167--168
[]
-[51 <./img/Evaporation/sigmas_summary.pdf> <./img/Evaporation/sigmal_summary.pd
+[49 <./img/Evaporation/sigmas_summary.pdf> <./img/Evaporation/sigmal_summary.pd
f> <./img/Evaporation/heights_summary.pdf> <./img/Evaporation/umbra_summary.pdf
>]
Underfull \hbox (badness 10000) in paragraph at lines 169--170
@@ -2484,55 +2460,55 @@ Underfull \hbox (badness 10000) in paragraph at lines 177--178
[]
-<img/Evaporation/Field3Angle.pdf, id=2556, 543.44762pt x 657.25867pt>
+<img/Evaporation/Field3Angle.pdf, id=2465, 543.44762pt x 657.25867pt>
File: img/Evaporation/Field3Angle.pdf Graphic file (type pdf)
<use img/Evaporation/Field3Angle.pdf>
Package pdftex.def Info: img/Evaporation/Field3Angle.pdf used on input line 18
2.
(pdftex.def) Requested size: 216.6513pt x 262.02629pt.
-<img/Evaporation/FieldsAngle.pdf, id=2557, 543.44762pt x 657.25867pt>
+<img/Evaporation/FieldsAngle.pdf, id=2466, 543.44762pt x 657.25867pt>
File: img/Evaporation/FieldsAngle.pdf Graphic file (type pdf)
<use img/Evaporation/FieldsAngle.pdf>
Package pdftex.def Info: img/Evaporation/FieldsAngle.pdf used on input line 18
7.
(pdftex.def) Requested size: 216.6513pt x 262.02629pt.
-[52]
+[50]
Underfull \hbox (badness 10000) in paragraph at lines 195--196
[]
-<img/Evaporation/SEM/SEM_Mask_cropped.pdf, id=2567, 692.5875pt x 692.5875pt>
+<img/Evaporation/SEM/SEM_Mask_cropped.pdf, id=2476, 692.5875pt x 692.5875pt>
File: img/Evaporation/SEM/SEM_Mask_cropped.pdf Graphic file (type pdf)
<use img/Evaporation/SEM/SEM_Mask_cropped.pdf>
Package pdftex.def Info: img/Evaporation/SEM/SEM_Mask_cropped.pdf used on inpu
t line 201.
(pdftex.def) Requested size: 214.46744pt x 214.4674pt.
-<img/Evaporation/SEM/ShowingClog.pdf, id=2568, 359.41805pt x 360.5994pt>
+<img/Evaporation/SEM/ShowingClog.pdf, id=2477, 359.41805pt x 360.5994pt>
File: img/Evaporation/SEM/ShowingClog.pdf Graphic file (type pdf)
<use img/Evaporation/SEM/ShowingClog.pdf>
Package pdftex.def Info: img/Evaporation/SEM/ShowingClog.pdf used on input lin
e 207.
(pdftex.def) Requested size: 203.17896pt x 203.84908pt.
-[53 <./img/Evaporation/Field3Angle.pdf> <./img/Evaporation/FieldsAngle.pdf
+[51 <./img/Evaporation/Field3Angle.pdf> <./img/Evaporation/FieldsAngle.pdf
pdfTeX warning: pdflatex.exe (file ./img/Evaporation/FieldsAngle.pdf): PDF incl
usion: multiple pdfs with page group included in a single page
>]
-<img/Evaporation/SEM/SEM_CloggingOverlay.png, id=2602, 609.2361pt x 569.4876pt>
+<img/Evaporation/SEM/SEM_CloggingOverlay.png, id=2511, 609.2361pt x 569.4876pt>
File: img/Evaporation/SEM/SEM_CloggingOverlay.png Graphic file (type png)
<use img/Evaporation/SEM/SEM_CloggingOverlay.png>
Package pdftex.def Info: img/Evaporation/SEM/SEM_CloggingOverlay.png used on i
nput line 225.
(pdftex.def) Requested size: 217.85364pt x 203.63371pt.
-<img/Evaporation/SEM/SEM_Probe_01_cropped.png, id=2603, 692.5875pt x 692.5875pt
+<img/Evaporation/SEM/SEM_Probe_01_cropped.png, id=2512, 692.5875pt x 692.5875pt
>
File: img/Evaporation/SEM/SEM_Probe_01_cropped.png Graphic file (type png)
<use img/Evaporation/SEM/SEM_Probe_01_cropped.png>
Package pdftex.def Info: img/Evaporation/SEM/SEM_Probe_01_cropped.png used on
input line 231.
(pdftex.def) Requested size: 214.46744pt x 214.4674pt.
- [54 <./img/Evaporation/SEM/SEM_Mask_cropped.pdf> <./img/Evaporation/SEM/Showin
+ [52 <./img/Evaporation/SEM/SEM_Mask_cropped.pdf> <./img/Evaporation/SEM/Showin
gClog.pdf
pdfTeX warning: pdflatex.exe (file ./img/Evaporation/SEM/ShowingClog.pdf): PDF
@@ -2552,7 +2528,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 251--252
[]
-[55 <./img/Evaporation/SEM/SEM_CloggingOverlay.png> <./img/Evaporation/SEM/SEM_
+[53 <./img/Evaporation/SEM/SEM_CloggingOverlay.png> <./img/Evaporation/SEM/SEM_
Probe_01_cropped.png>]
Underfull \hbox (badness 10000) in paragraph at lines 255--257
@@ -2568,31 +2544,31 @@ Underfull \hbox (badness 10000) in paragraph at lines 267--268
[]
-<img/Evaporation/Sim/Field3_right.pdf, id=2651, 1003.49907pt x 822.82407pt>
+<img/Evaporation/Sim/Field3_right.pdf, id=2559, 1003.49907pt x 822.82407pt>
File: img/Evaporation/Sim/Field3_right.pdf Graphic file (type pdf)
<use img/Evaporation/Sim/Field3_right.pdf>
Package pdftex.def Info: img/Evaporation/Sim/Field3_right.pdf used on input li
ne 274.
(pdftex.def) Requested size: 196.95636pt x 161.48586pt.
-<img/Evaporation/Sim/Field3_right_sim_simple.pdf, id=2652, 364.9783pt x 280.976
+<img/Evaporation/Sim/Field3_right_sim_simple.pdf, id=2560, 364.9783pt x 280.976
52pt>
File: img/Evaporation/Sim/Field3_right_sim_simple.pdf Graphic file (type pdf)
<use img/Evaporation/Sim/Field3_right_sim_simple.pdf>
Package pdftex.def Info: img/Evaporation/Sim/Field3_right_sim_simple.pdf used
on input line 279.
(pdftex.def) Requested size: 205.71188pt x 158.36615pt.
-[56]
+[54]
Underfull \hbox (badness 10000) in paragraph at lines 287--288
[]
-<img/Evaporation/Sim/OverlapCircles.pdf, id=2660, 364.36125pt x 280.04625pt>
+<img/Evaporation/Sim/OverlapCircles.pdf, id=2569, 364.36125pt x 280.04625pt>
File: img/Evaporation/Sim/OverlapCircles.pdf Graphic file (type pdf)
<use img/Evaporation/Sim/OverlapCircles.pdf>
Package pdftex.def Info: img/Evaporation/Sim/OverlapCircles.pdf used on input
line 293.
(pdftex.def) Requested size: 230.36061pt x 177.05394pt.
-[57 <./img/Evaporation/Sim/Field3_right.pdf> <./img/Evaporation/Sim/Field3_righ
+[55 <./img/Evaporation/Sim/Field3_right.pdf> <./img/Evaporation/Sim/Field3_righ
t_sim_simple.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 298--299
@@ -2608,7 +2584,7 @@ File: img/Evaporation/Sim/Field3_right_sim_simple.pdf Graphic file (type pdf)
Package pdftex.def Info: img/Evaporation/Sim/Field3_right_sim_simple.pdf used
on input line 305.
(pdftex.def) Requested size: 149.73299pt x 115.2697pt.
-<img/Evaporation/Sim/Field3_right_sim_simple_initial.pdf, id=2717, 364.9783pt x
+<img/Evaporation/Sim/Field3_right_sim_simple_initial.pdf, id=2626, 364.9783pt x
280.97652pt>
File: img/Evaporation/Sim/Field3_right_sim_simple_initial.pdf Graphic file (typ
e pdf)
@@ -2616,7 +2592,7 @@ e pdf)
Package pdftex.def Info: img/Evaporation/Sim/Field3_right_sim_simple_initial.pd
f used on input line 310.
(pdftex.def) Requested size: 149.73299pt x 115.2697pt.
-<img/Evaporation/Sim/Field3_right_sim_simple_power.pdf, id=2718, 364.9783pt x 2
+<img/Evaporation/Sim/Field3_right_sim_simple_power.pdf, id=2627, 364.9783pt x 2
80.97652pt>
File: img/Evaporation/Sim/Field3_right_sim_simple_power.pdf Graphic file (type
pdf)
@@ -2624,7 +2600,7 @@ pdf)
Package pdftex.def Info: img/Evaporation/Sim/Field3_right_sim_simple_power.pdf
used on input line 315.
(pdftex.def) Requested size: 149.73299pt x 115.2697pt.
-[58 <./img/Evaporation/Sim/OverlapCircles.pdf>]
+[56 <./img/Evaporation/Sim/OverlapCircles.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 325--327
[]
@@ -2640,7 +2616,7 @@ pdf)
Package pdftex.def Info: img/Evaporation/Sim/Field3_right_sim_simple_power.pdf
used on input line 333.
(pdftex.def) Requested size: 149.73299pt x 115.2697pt.
-<img/Evaporation/Sim/Field3_right_sim_simple_rejection.pdf, id=2753, 364.9783pt
+<img/Evaporation/Sim/Field3_right_sim_simple_rejection.pdf, id=2662, 364.9783pt
x 280.97652pt>
File: img/Evaporation/Sim/Field3_right_sim_simple_rejection.pdf Graphic file (t
ype pdf)
@@ -2648,13 +2624,13 @@ ype pdf)
Package pdftex.def Info: img/Evaporation/Sim/Field3_right_sim_simple_rejection.
pdf used on input line 338.
(pdftex.def) Requested size: 149.73299pt x 115.2697pt.
-<img/Evaporation/Sim/Field3_right.png, id=2754, 1231.60126pt x 1083.04625pt>
+<img/Evaporation/Sim/Field3_right.png, id=2663, 1231.60126pt x 1083.04625pt>
File: img/Evaporation/Sim/Field3_right.png Graphic file (type png)
<use img/Evaporation/Sim/Field3_right.png>
Package pdftex.def Info: img/Evaporation/Sim/Field3_right.png used on input li
ne 343.
(pdftex.def) Requested size: 140.062pt x 123.16779pt.
-[59 <./img/Evaporation/Sim/Field3_right_sim_simple_initial.pdf> <./img/Evaporat
+[57 <./img/Evaporation/Sim/Field3_right_sim_simple_initial.pdf> <./img/Evaporat
ion/Sim/Field3_right_sim_simple_power.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 351--352
@@ -2680,7 +2656,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 369--370
[]
-[60 <./img/Evaporation/Sim/Field3_right_sim_simple_rejection.pdf> <./img/Evapor
+[58 <./img/Evaporation/Sim/Field3_right_sim_simple_rejection.pdf> <./img/Evapor
ation/Sim/Field3_right.png>]
Underfull \hbox (badness 10000) in paragraph at lines 371--372
@@ -2696,36 +2672,36 @@ Underfull \hbox (badness 10000) in paragraph at lines 377--134
[]
-[61]
+[59]
\openout2 = `chap03.aux'.
(chap03.tex
Chapter 4.
-<img/Plots/RHK/F0002CH1.CSV.pdf, id=2879, 867.24pt x 650.43pt>
+<img/Plots/RHK/F0002CH1.CSV.pdf, id=2787, 867.24pt x 650.43pt>
File: img/Plots/RHK/F0002CH1.CSV.pdf Graphic file (type pdf)
<use img/Plots/RHK/F0002CH1.CSV.pdf>
Package pdftex.def Info: img/Plots/RHK/F0002CH1.CSV.pdf used on input line 18.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
-<img/Plots/RHK/F0003CH1.CSV.pdf, id=2880, 867.24pt x 650.43pt>
+<img/Plots/RHK/F0003CH1.CSV.pdf, id=2788, 867.24pt x 650.43pt>
File: img/Plots/RHK/F0003CH1.CSV.pdf Graphic file (type pdf)
<use img/Plots/RHK/F0003CH1.CSV.pdf>
Package pdftex.def Info: img/Plots/RHK/F0003CH1.CSV.pdf used on input line 23.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
-[62
+[60
<./img/Plots/RHK/F0002CH1.CSV.pdf> <./img/Plots/RHK/F0003CH1.CSV.pdf>]
-<img/Plots/RHK/F0006CH1.CSV.pdf, id=2946, 867.24pt x 650.43pt>
+<img/Plots/RHK/F0006CH1.CSV.pdf, id=2855, 867.24pt x 650.43pt>
File: img/Plots/RHK/F0006CH1.CSV.pdf Graphic file (type pdf)
<use img/Plots/RHK/F0006CH1.CSV.pdf>
Package pdftex.def Info: img/Plots/RHK/F0006CH1.CSV.pdf used on input line 37.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
-<img/Plots/RHK/F0008CH1.CSV.pdf, id=2947, 867.24pt x 650.43pt>
+<img/Plots/RHK/F0008CH1.CSV.pdf, id=2856, 867.24pt x 650.43pt>
File: img/Plots/RHK/F0008CH1.CSV.pdf Graphic file (type pdf)
<use img/Plots/RHK/F0008CH1.CSV.pdf>
Package pdftex.def Info: img/Plots/RHK/F0008CH1.CSV.pdf used on input line 42.
@@ -2736,90 +2712,90 @@ Underfull \hbox (badness 10000) in paragraph at lines 52--53
[]
-<img/Plots/KIM001/ALL0001.pdf, id=2953, 867.24pt x 650.43pt>
+<img/Plots/KIM001/ALL0001.pdf, id=2862, 867.24pt x 650.43pt>
File: img/Plots/KIM001/ALL0001.pdf Graphic file (type pdf)
<use img/Plots/KIM001/ALL0001.pdf>
Package pdftex.def Info: img/Plots/KIM001/ALL0001.pdf used on input line 61.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
-<img/Plots/KIM001/ALL0002.pdf, id=2954, 867.24pt x 650.43pt>
+<img/Plots/KIM001/ALL0002.pdf, id=2863, 867.24pt x 650.43pt>
File: img/Plots/KIM001/ALL0002.pdf Graphic file (type pdf)
<use img/Plots/KIM001/ALL0002.pdf>
Package pdftex.def Info: img/Plots/KIM001/ALL0002.pdf used on input line 66.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
-[63 <./img/Plots/RHK/F0006CH1.CSV.pdf> <./img/Plots/RHK/F0008CH1.CSV.pdf>]
+[61 <./img/Plots/RHK/F0006CH1.CSV.pdf> <./img/Plots/RHK/F0008CH1.CSV.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 76--77
[]
-<img/Plots/KIM001/voltage_behavior.pdf, id=3016, 867.24pt x 650.43pt>
+<img/Plots/KIM001/voltage_behavior.pdf, id=2925, 867.24pt x 650.43pt>
File: img/Plots/KIM001/voltage_behavior.pdf Graphic file (type pdf)
<use img/Plots/KIM001/voltage_behavior.pdf>
Package pdftex.def Info: img/Plots/KIM001/voltage_behavior.pdf used on input l
ine 82.
(pdftex.def) Requested size: 276.43555pt x 207.32802pt.
-[64 <./img/Plots/KIM001/ALL0001.pdf> <./img/Plots/KIM001/ALL0002.pdf>] [65 <./i
+[62 <./img/Plots/KIM001/ALL0001.pdf> <./img/Plots/KIM001/ALL0002.pdf>] [63 <./i
mg/Plots/KIM001/voltage_behavior.pdf>]
-<img/Plots/Filtering.pdf, id=3115, 433.62pt x 289.08pt>
+<img/Plots/Filtering.pdf, id=3024, 433.62pt x 289.08pt>
File: img/Plots/Filtering.pdf Graphic file (type pdf)
<use img/Plots/Filtering.pdf>
Package pdftex.def Info: img/Plots/Filtering.pdf used on input line 106.
(pdftex.def) Requested size: 225.75594pt x 150.50331pt.
-<img/Plots/FilteringDone.pdf, id=3116, 433.62pt x 289.08pt>
+<img/Plots/FilteringDone.pdf, id=3025, 433.62pt x 289.08pt>
File: img/Plots/FilteringDone.pdf Graphic file (type pdf)
<use img/Plots/FilteringDone.pdf>
Package pdftex.def Info: img/Plots/FilteringDone.pdf used on input line 111.
(pdftex.def) Requested size: 225.75594pt x 150.50331pt.
- [66 <./img/Plots/Filtering.pdf> <./img/Plots/FilteringDone.pdf>]
-<img/Plots/InvertedSginal.pdf, id=3203, 433.62pt x 289.08pt>
+ [64 <./img/Plots/Filtering.pdf> <./img/Plots/FilteringDone.pdf>]
+<img/Plots/InvertedSginal.pdf, id=3111, 433.62pt x 289.08pt>
File: img/Plots/InvertedSginal.pdf Graphic file (type pdf)
<use img/Plots/InvertedSginal.pdf>
Package pdftex.def Info: img/Plots/InvertedSginal.pdf used on input line 126.
(pdftex.def) Requested size: 225.75594pt x 150.50331pt.
-<img/Plots/Switching01.pdf, id=3204, 433.62pt x 289.08pt>
+<img/Plots/Switching01.pdf, id=3112, 433.62pt x 289.08pt>
File: img/Plots/Switching01.pdf Graphic file (type pdf)
<use img/Plots/Switching01.pdf>
Package pdftex.def Info: img/Plots/Switching01.pdf used on input line 131.
(pdftex.def) Requested size: 225.75594pt x 150.50331pt.
- [67 <./img/Plots/InvertedSginal.pdf> <./img/Plots/Switching01.pdf>]
+ [65 <./img/Plots/InvertedSginal.pdf> <./img/Plots/Switching01.pdf>]
Underfull \hbox (badness 10000) in paragraph at lines 158--159
[]
-[68]
-<img/Plots/Walker/WalkerApproach.pdf, id=3307, 867.24pt x 650.43pt>
+[66]
+<img/Plots/Walker/WalkerApproach.pdf, id=3216, 867.24pt x 650.43pt>
File: img/Plots/Walker/WalkerApproach.pdf Graphic file (type pdf)
<use img/Plots/Walker/WalkerApproach.pdf>
Package pdftex.def Info: img/Plots/Walker/WalkerApproach.pdf used on input lin
e 169.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
-<img/Plots/Walker/WalkerRetract.pdf, id=3308, 867.24pt x 650.43pt>
+<img/Plots/Walker/WalkerRetract.pdf, id=3217, 867.24pt x 650.43pt>
File: img/Plots/Walker/WalkerRetract.pdf Graphic file (type pdf)
<use img/Plots/Walker/WalkerRetract.pdf>
Package pdftex.def Info: img/Plots/Walker/WalkerRetract.pdf used on input line
173.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
- [69 <./img/Plots/Walker/WalkerApproach.pdf> <./img/Plots/Walker/WalkerRetract.
+ [67 <./img/Plots/Walker/WalkerApproach.pdf> <./img/Plots/Walker/WalkerRetract.
pdf>]
-<img/Plots/Walker/WalkerApproach_ff.pdf, id=3384, 867.24pt x 650.43pt>
+<img/Plots/Walker/WalkerApproach_ff.pdf, id=3293, 867.24pt x 650.43pt>
File: img/Plots/Walker/WalkerApproach_ff.pdf Graphic file (type pdf)
<use img/Plots/Walker/WalkerApproach_ff.pdf>
Package pdftex.def Info: img/Plots/Walker/WalkerApproach_ff.pdf used on input
line 185.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
-<img/Plots/Walker/WalkerRetract_ff.pdf, id=3385, 867.24pt x 650.43pt>
+<img/Plots/Walker/WalkerRetract_ff.pdf, id=3294, 867.24pt x 650.43pt>
File: img/Plots/Walker/WalkerRetract_ff.pdf Graphic file (type pdf)
<use img/Plots/Walker/WalkerRetract_ff.pdf>
Package pdftex.def Info: img/Plots/Walker/WalkerRetract_ff.pdf used on input l
ine 189.
(pdftex.def) Requested size: 225.75594pt x 169.31622pt.
-<img/MA/SchaltDiagramWalker.pdf, id=3388, 544.13278pt x 385.4176pt>
+<img/MA/SchaltDiagramWalker.pdf, id=3297, 544.13278pt x 385.4176pt>
File: img/MA/SchaltDiagramWalker.pdf Graphic file (type pdf)
<use img/MA/SchaltDiagramWalker.pdf>
Package pdftex.def Info: img/MA/SchaltDiagramWalker.pdf used on input line 201
.
(pdftex.def) Requested size: 345.54092pt x 244.7492pt.
- [70 <./img/Plots/Walker/WalkerApproach_ff.pdf> <./img/Plots/Walker/WalkerRetra
-ct_ff.pdf>]) [71 <./img/MA/SchaltDiagramWalker.pdf>]
+ [68 <./img/Plots/Walker/WalkerApproach_ff.pdf> <./img/Plots/Walker/WalkerRetra
+ct_ff.pdf>]) [69 <./img/MA/SchaltDiagramWalker.pdf>]
\openout2 = `conclusion.aux'.
(conclusion.tex
@@ -2847,7 +2823,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 16--18
[]
-) [72
+) [70
@@ -2855,7 +2831,7 @@ Underfull \hbox (badness 10000) in paragraph at lines 16--18
]
\openout2 = `bibliography.aux'.
- (bibliography.tex (thesis.bbl [73
+ (bibliography.tex (thesis.bbl [71
@@ -2882,12 +2858,12 @@ Underfull \hbox (badness 2035) in paragraph at lines 173--176
gn-ers f^^?ur Ul-tra-
[]
-[74])) [75]
+[72])) [73]
Underfull \hbox (badness 10000) in paragraph at lines 151--172
[]
-[76
+[74
@@ -2913,12 +2889,12 @@ pdfTeX warning (ext4): destination with the same identifier (name{section.4.3})
\relax
l.51 \section{Walker principle diagram}
\label{app:walker_diagram}
-<img/ElectronicsDiagramm.pdf, id=3609, 778.32848pt x 492.10774pt>
+<img/ElectronicsDiagramm.pdf, id=3518, 778.32848pt x 492.10774pt>
File: img/ElectronicsDiagramm.pdf Graphic file (type pdf)
<use img/ElectronicsDiagramm.pdf>
Package pdftex.def Info: img/ElectronicsDiagramm.pdf used on input line 54.
(pdftex.def) Requested size: 460.72124pt x 291.29468pt.
- [77
+ [75
]
@@ -2926,7 +2902,7 @@ Package pdftex.def Info: img/ElectronicsDiagramm.pdf used on input line 54.
pdfTeX warning: pdflatex.exe (file ./img/Plots/Walker/MaskAlign Walker Signalel
ektronik 1.0.pdf): PDF inclusion: found PDF version <1.7>, but at most version
<1.5> allowed
-<img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf, id=3616, 845.07724
+<img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf, id=3525, 845.07724
pt x 597.55246pt>
File: img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf Graphic file (
type pdf)
@@ -2955,7 +2931,7 @@ ektronik 1.0.pdf): PDF inclusion: found PDF version <1.7>, but at most version
pdfTeX warning: pdflatex.exe (file ./img/Plots/Walker/MaskAlign Walker Signalel
ektronik 1.0.pdf): PDF inclusion: found PDF version <1.7>, but at most version
<1.5> allowed
-<img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf, id=3619, page=1, 8
+<img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf, id=3528, page=1, 8
45.07724pt x 597.55246pt>
File: img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf Graphic file (
type pdf)
@@ -2969,7 +2945,7 @@ type pdf)
Package pdftex.def Info: img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0
.pdf , page1 used on input line 60.
(pdftex.def) Requested size: 460.72124pt x 325.7736pt.
-[78 <./img/ElectronicsDiagramm.pdf>]
+[76 <./img/ElectronicsDiagramm.pdf>]
File: img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf Graphic file (
type pdf)
<use img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf, page 1>
@@ -2988,14 +2964,14 @@ type pdf)
Package pdftex.def Info: img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0
.pdf , page1 used on input line 60.
(pdftex.def) Requested size: 460.72124pt x 325.7736pt.
- [79
+ [77
<./img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf>]
pdfTeX warning: pdflatex.exe (file ./img/Plots/Walker/MaskAlign Walker Signalel
ektronik 1.0.pdf): PDF inclusion: found PDF version <1.7>, but at most version
<1.5> allowed
-<img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf, id=3693, page=2, 8
+<img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf, id=3601, page=2, 8
45.07724pt x 597.55246pt>
File: img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf Graphic file (
type pdf)
@@ -3015,14 +2991,14 @@ type pdf)
Package pdftex.def Info: img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0
.pdf , page2 used on input line 60.
(pdftex.def) Requested size: 460.72124pt x 325.7736pt.
-[80
+[78
<./img/Plots/Walker/MaskAlign Walker Signalelektronik 1.0.pdf>]
pdfTeX warning: pdflatex.exe (file ./img/Plots/Walker/MaskAlign Walker Netzteil
modifiziert 24-05-2024.pdf): PDF inclusion: found PDF version <1.7>, but at mo
st version <1.5> allowed
-<img/Plots/Walker/MaskAlign Walker Netzteil modifiziert 24-05-2024.pdf, id=3698
+<img/Plots/Walker/MaskAlign Walker Netzteil modifiziert 24-05-2024.pdf, id=3607
, 1194.98447pt x 845.07724pt>
File: img/Plots/Walker/MaskAlign Walker Netzteil modifiziert 24-05-2024.pdf Gra
phic file (type pdf)
@@ -3051,7 +3027,7 @@ st version <1.5> allowed
pdfTeX warning: pdflatex.exe (file ./img/Plots/Walker/MaskAlign Walker Netzteil
modifiziert 24-05-2024.pdf): PDF inclusion: found PDF version <1.7>, but at mo
st version <1.5> allowed
-<img/Plots/Walker/MaskAlign Walker Netzteil modifiziert 24-05-2024.pdf, id=3701
+<img/Plots/Walker/MaskAlign Walker Netzteil modifiziert 24-05-2024.pdf, id=3610
, page=1, 1194.98447pt x 845.07724pt>
File: img/Plots/Walker/MaskAlign Walker Netzteil modifiziert 24-05-2024.pdf Gra
phic file (type pdf)
@@ -3088,10 +3064,10 @@ e 1>
Package pdftex.def Info: img/Plots/Walker/MaskAlign Walker Netzteil modifiziert
24-05-2024.pdf , page1 used on input line 62.
(pdftex.def) Requested size: 460.72124pt x 325.8135pt.
-[81
+[79
<./img/Plots/Walker/MaskAlign Walker Netzteil modifiziert 24-05-2024.pdf>]
-[82]
+[80]
(C:\Users\Luzifer\AppData\Local\Programs\MiKTeX\tex/latex/listings\lstlang1.sty
File: lstlang1.sty 2023/02/27 1.9 listings language file
)
@@ -3109,12 +3085,12 @@ File: ot1lmtt.fd 2015/05/01 v1.6.1 Font defs for Latin Modern
LaTeX Font Info: Font shape `OT1/lmtt/bx/n' in size <8> not available
(Font) Font shape `OT1/lmtt/b/n' tried instead on input line 135.
-[83{C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/enc/dvips/lm/lm-rmtt.e
-nc}] [84] [85] [86] [87] [88] [89] [90] [91] [92] [93] [94] [95]) [96]
+[81{C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/enc/dvips/lm/lm-rmtt.e
+nc}] [82] [83] [84] [85] [86] [87] [88] [89] [90] [91] [92] [93]) [94]
\openout2 = `acknowledgments.aux'.
-(acknowledgments.tex) [97
+(acknowledgments.tex) [95
@@ -3127,13 +3103,13 @@ LaTeX2e <2023-11-01> patch level 1
L3 programming layer <2024-01-04>
***********
Package rerunfilecheck Info: File `thesis.out' has not changed.
-(rerunfilecheck) Checksum: 4282B202C22B1A36B6992F1A635CB0DA;10361.
+(rerunfilecheck) Checksum: AB1E251D69A9C8A538646EC56F856C5E;10224.
)
Here is how much of TeX's memory you used:
- 33783 strings out of 474485
- 633396 string characters out of 5742790
- 2031542 words of memory out of 5000000
- 54326 multiletter control sequences out of 15000+600000
+ 33758 strings out of 474485
+ 632475 string characters out of 5742790
+ 2030542 words of memory out of 5000000
+ 54306 multiletter control sequences out of 15000+600000
646820 words of font info for 109 fonts, out of 8000000 for 9000
1141 hyphenation exceptions out of 8191
99i,19n,104p,1784b,3820s stack positions out of 10000i,1000n,20000p,200000b,200000s
@@ -3156,9 +3132,9 @@ ublic/lm/lmsy8.pfb><C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/type1/
public/lm/lmtk10.pfb><C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/type
1/public/lm/lmtt8.pfb><C:/Users/Luzifer/AppData/Local/Programs/MiKTeX/fonts/typ
e1/public/lm/lmtti10.pfb>
-Output written on thesis.pdf (98 pages, 253504745 bytes).
+Output written on thesis.pdf (96 pages, 253386470 bytes).
PDF statistics:
- 4876 PDF objects out of 5155 (max. 8388607)
- 1066 named destinations out of 1200 (max. 500000)
- 1131 words of extra memory for PDF output out of 10000 (max. 10000000)
+ 4783 PDF objects out of 5155 (max. 8388607)
+ 1061 named destinations out of 1200 (max. 500000)
+ 1113 words of extra memory for PDF output out of 10000 (max. 10000000)
diff --git a/thesis.out b/thesis.out
index f1556f9105f060a89d1efcd5e8c7f17c4c3b5b5d..cc90f27eb7559718caad5e3894432a032a58263a 100644
--- a/thesis.out
+++ b/thesis.out
@@ -10,58 +10,57 @@
\BOOKMARK [2][-]{subsection.1.5.2}{\376\377\000M\000o\000t\000o\000r\000\040\000c\000a\000l\000i\000b\000r\000a\000t\000i\000o\000n}{section.1.5}% 10
\BOOKMARK [2][-]{subsection.1.5.3}{\376\377\000O\000p\000t\000i\000c\000a\000l\000\040\000a\000l\000i\000g\000n\000m\000e\000n\000t}{section.1.5}% 11
\BOOKMARK [2][-]{subsection.1.5.4}{\376\377\000C\000a\000p\000a\000c\000i\000t\000i\000v\000e\000\040\000d\000i\000s\000t\000a\000n\000c\000e\000\040\000m\000e\000a\000s\000u\000r\000e\000m\000e\000n\000t\000s}{section.1.5}% 12
-\BOOKMARK [2][-]{subsection.1.5.5}{\376\377\000R\000e\000p\000r\000o\000d\000u\000c\000i\000b\000i\000l\000i\000t\000y}{section.1.5}% 13
-\BOOKMARK [1][-]{section.1.6}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000o\000p\000e\000r\000a\000t\000i\000o\000n}{chapter.1}% 14
-\BOOKMARK [2][-]{subsection.1.6.1}{\376\377\000S\000a\000m\000p\000l\000e\000\040\000p\000r\000e\000p\000a\000r\000a\000t\000i\000o\000n}{section.1.6}% 15
-\BOOKMARK [1][-]{section.1.7}{\376\377\000M\000e\000a\000s\000u\000r\000e\000m\000e\000n\000t\000\040\000t\000e\000c\000h\000n\000i\000q\000u\000e\000s}{chapter.1}% 16
-\BOOKMARK [2][-]{subsection.1.7.1}{\376\377\000A\000t\000o\000m\000i\000c\000\040\000F\000o\000r\000c\000e\000\040\000M\000i\000c\000r\000o\000s\000c\000o\000p\000y}{section.1.7}% 17
-\BOOKMARK [2][-]{subsection.1.7.2}{\376\377\000S\000c\000a\000n\000n\000i\000n\000g\000\040\000E\000l\000e\000c\000t\000r\000o\000n\000\040\000M\000i\000c\000r\000o\000s\000c\000o\000p\000y}{section.1.7}% 18
-\BOOKMARK [0][-]{chapter.2}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000r\000e\000p\000a\000i\000r\000s\000\040\000a\000n\000d\000\040\000o\000p\000t\000i\000m\000i\000z\000a\000t\000i\000o\000n\000s}{}% 19
-\BOOKMARK [1][-]{section.2.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w}{chapter.2}% 20
-\BOOKMARK [1][-]{section.2.2}{\376\377\000G\000e\000n\000e\000r\000a\000l\000\040\000U\000H\000V\000\040\000d\000e\000v\000i\000c\000e\000\040\000p\000r\000e\000p\000a\000r\000a\000t\000i\000o\000n}{chapter.2}% 21
-\BOOKMARK [2][-]{subsection.2.2.1}{\376\377\000U\000H\000V\000\040\000c\000o\000m\000p\000a\000t\000i\000b\000l\000e\000\040\000S\000o\000l\000d\000e\000r\000i\000n\000g}{section.2.2}% 22
-\BOOKMARK [1][-]{section.2.3}{\376\377\000S\000o\000l\000d\000e\000r\000i\000n\000g\000\040\000a\000n\000c\000h\000o\000r\000s}{chapter.2}% 23
-\BOOKMARK [1][-]{section.2.4}{\376\377\000P\000i\000e\000z\000o\000\040\000r\000e\000g\000l\000u\000i\000n\000g}{chapter.2}% 24
-\BOOKMARK [1][-]{section.2.5}{\376\377\000Z\0003\000\040\000m\000o\000t\000o\000r}{chapter.2}% 25
-\BOOKMARK [2][-]{subsection.2.5.1}{\376\377\000F\000r\000o\000n\000t\000\040\000p\000l\000a\000t\000e\000\040\000r\000e\000p\000a\000i\000r}{section.2.5}% 26
-\BOOKMARK [2][-]{subsection.2.5.2}{\376\377\000S\000m\000a\000l\000l\000\040\000c\000a\000p\000a\000c\000i\000t\000a\000n\000c\000e\000\040\000s\000t\000a\000c\000k}{section.2.5}% 27
-\BOOKMARK [1][-]{section.2.6}{\376\377\000F\000e\000e\000d\000\040\000t\000h\000r\000o\000u\000g\000h\000\040\000c\000a\000b\000l\000i\000n\000g\000\040\000o\000p\000t\000i\000m\000i\000z\000a\000t\000i\000o\000n\000s}{chapter.2}% 28
-\BOOKMARK [1][-]{section.2.7}{\376\377\000F\000i\000n\000a\000l\000\040\000t\000e\000s\000t}{chapter.2}% 29
-\BOOKMARK [0][-]{chapter.3}{\376\377\000E\000v\000a\000p\000o\000r\000a\000t\000i\000o\000n\000s\000\040\000a\000n\000d\000\040\000m\000e\000a\000s\000u\000r\000e\000m\000e\000n\000t}{}% 30
-\BOOKMARK [1][-]{section.3.1}{\376\377\000E\000v\000a\000p\000o\000r\000a\000t\000i\000o\000n\000\040\000c\000o\000n\000f\000i\000g\000u\000r\000a\000t\000i\000o\000n}{chapter.3}% 31
-\BOOKMARK [1][-]{section.3.2}{\376\377\000C\000o\000n\000t\000a\000m\000i\000n\000a\000t\000i\000o\000n}{chapter.3}% 32
-\BOOKMARK [1][-]{section.3.3}{\376\377\000P\000e\000n\000u\000m\000b\000r\000a}{chapter.3}% 33
-\BOOKMARK [1][-]{section.3.4}{\376\377\000T\000i\000l\000t\000\040\000a\000n\000d\000\040\000d\000e\000f\000o\000r\000m\000a\000t\000i\000o\000n}{chapter.3}% 34
-\BOOKMARK [1][-]{section.3.5}{\376\377\000S\000i\000m\000u\000l\000a\000t\000i\000o\000n}{chapter.3}% 35
-\BOOKMARK [2][-]{subsection.3.5.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w\000\040\000a\000n\000d\000\040\000p\000r\000i\000n\000c\000i\000p\000l\000e}{section.3.5}% 36
-\BOOKMARK [2][-]{subsection.3.5.2}{\376\377\000R\000e\000s\000u\000l\000t\000s}{section.3.5}% 37
-\BOOKMARK [2][-]{subsection.3.5.3}{\376\377\000S\000o\000f\000t\000w\000a\000r\000e\000\040\000i\000m\000p\000r\000o\000v\000e\000m\000e\000n\000t\000s}{section.3.5}% 38
-\BOOKMARK [2][-]{subsection.3.5.4}{\376\377\000F\000i\000n\000a\000l\000\040\000R\000e\000m\000a\000r\000k}{section.3.5}% 39
-\BOOKMARK [0][-]{chapter.4}{\376\377\000E\000l\000e\000c\000t\000r\000o\000n\000i\000c\000s}{}% 40
-\BOOKMARK [1][-]{section.4.1}{\376\377\000R\000H\000K\000\040\000p\000i\000e\000z\000o\000\040\000m\000o\000t\000o\000r\000\040\000c\000o\000n\000t\000r\000o\000l\000l\000e\000r}{chapter.4}% 41
-\BOOKMARK [2][-]{subsection.4.1.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w}{section.4.1}% 42
-\BOOKMARK [2][-]{subsection.4.1.2}{\376\377\000P\000u\000l\000s\000e\000\040\000s\000h\000a\000p\000e}{section.4.1}% 43
-\BOOKMARK [1][-]{section.4.2}{\376\377\000K\000I\000M\0000\0000\0001}{chapter.4}% 44
-\BOOKMARK [2][-]{subsection.4.2.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w}{section.4.2}% 45
-\BOOKMARK [2][-]{subsection.4.2.2}{\376\377\000P\000u\000l\000s\000e\000\040\000s\000h\000a\000p\000e}{section.4.2}% 46
-\BOOKMARK [2][-]{subsection.4.2.3}{\376\377\000V\000o\000l\000t\000a\000g\000e\000\040\000b\000e\000h\000a\000v\000i\000o\000r}{section.4.2}% 47
-\BOOKMARK [1][-]{section.4.3}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000c\000o\000n\000t\000r\000o\000l\000l\000e\000r\000\040\000"\000W\000a\000l\000k\000e\000r\000"}{chapter.4}% 48
-\BOOKMARK [2][-]{subsection.4.3.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w}{section.4.3}% 49
-\BOOKMARK [2][-]{subsection.4.3.2}{\376\377\000S\000i\000g\000n\000a\000l\000\040\000g\000e\000n\000e\000r\000a\000t\000i\000o\000n}{section.4.3}% 50
-\BOOKMARK [2][-]{subsection.4.3.3}{\376\377\000F\000a\000s\000t\000\040\000f\000l\000a\000n\000k}{section.4.3}% 51
-\BOOKMARK [2][-]{subsection.4.3.4}{\376\377\000A\000m\000p\000l\000i\000f\000i\000c\000a\000t\000i\000o\000n}{section.4.3}% 52
-\BOOKMARK [2][-]{subsection.4.3.5}{\376\377\000P\000r\000o\000g\000r\000a\000m\000m\000i\000n\000g}{section.4.3}% 53
-\BOOKMARK [2][-]{subsection.4.3.6}{\376\377\000M\000e\000a\000s\000u\000r\000e\000d\000\040\000p\000u\000l\000s\000e\000\040\000s\000h\000a\000p\000e}{section.4.3}% 54
-\BOOKMARK [2][-]{subsection.4.3.7}{\376\377\000O\000p\000e\000r\000a\000t\000i\000o\000n\000\040\000w\000i\000t\000h\000\040\000t\000h\000e\000\040\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r}{section.4.3}% 55
-\BOOKMARK [0][-]{chapter*.76}{\376\377\000C\000o\000n\000c\000l\000u\000s\000i\000o\000n\000s\000\040\000a\000n\000d\000\040\000O\000u\000t\000l\000o\000o\000k}{}% 56
-\BOOKMARK [0][-]{chapter*.77}{\376\377\000B\000i\000b\000l\000i\000o\000g\000r\000a\000p\000h\000y}{}% 57
-\BOOKMARK [0][-]{chapter*.78}{\376\377\000L\000i\000s\000t\000\040\000o\000f\000\040\000A\000b\000b\000r\000e\000v\000i\000a\000t\000i\000o\000n\000s}{}% 58
-\BOOKMARK [0][-]{chapter*.79}{\376\377\000A\000p\000p\000e\000n\000d\000i\000x}{}% 59
-\BOOKMARK [1][-]{section.4.1}{\376\377\000L\000o\000c\000k\000I\000n\000\040\000a\000m\000p\000l\000i\000f\000i\000e\000r\000\040\000s\000e\000t\000t\000i\000n\000g\000s}{chapter*.79}% 60
-\BOOKMARK [1][-]{section.4.2}{\376\377\000E\000v\000a\000p\000o\000r\000a\000t\000i\000o\000n\000\040\000p\000a\000r\000a\000m\000e\000t\000e\000r\000s}{chapter*.79}% 61
-\BOOKMARK [1][-]{section.4.3}{\376\377\000W\000a\000l\000k\000e\000r\000\040\000p\000r\000i\000n\000c\000i\000p\000l\000e\000\040\000d\000i\000a\000g\000r\000a\000m}{chapter*.79}% 62
-\BOOKMARK [1][-]{section.4.4}{\376\377\000W\000a\000l\000k\000e\000r\000\040\000c\000i\000r\000c\000u\000i\000t\000\040\000d\000i\000a\000g\000r\000a\000m\000s}{chapter*.79}% 63
-\BOOKMARK [1][-]{section.4.5}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000W\000a\000l\000k\000e\000r\000\040\000C\000o\000m\000m\000a\000n\000d\000s}{chapter*.79}% 64
-\BOOKMARK [1][-]{section.4.6}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000W\000a\000l\000k\000e\000r\000\040\000C\000o\000d\000e}{chapter*.79}% 65
-\BOOKMARK [1][-]{section.4.7}{\376\377\000R\000a\000y\000c\000a\000s\000t\000\040\000S\000i\000m\000u\000l\000a\000t\000i\000o\000n}{chapter*.79}% 66
-\BOOKMARK [0][-]{chapter*.114}{\376\377\000A\000c\000k\000n\000o\000w\000l\000e\000d\000g\000m\000e\000n\000t\000s}{}% 67
+\BOOKMARK [1][-]{section.1.6}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000o\000p\000e\000r\000a\000t\000i\000o\000n}{chapter.1}% 13
+\BOOKMARK [2][-]{subsection.1.6.1}{\376\377\000S\000a\000m\000p\000l\000e\000\040\000p\000r\000e\000p\000a\000r\000a\000t\000i\000o\000n}{section.1.6}% 14
+\BOOKMARK [1][-]{section.1.7}{\376\377\000M\000e\000a\000s\000u\000r\000e\000m\000e\000n\000t\000\040\000t\000e\000c\000h\000n\000i\000q\000u\000e\000s}{chapter.1}% 15
+\BOOKMARK [2][-]{subsection.1.7.1}{\376\377\000A\000t\000o\000m\000i\000c\000\040\000F\000o\000r\000c\000e\000\040\000M\000i\000c\000r\000o\000s\000c\000o\000p\000y}{section.1.7}% 16
+\BOOKMARK [2][-]{subsection.1.7.2}{\376\377\000S\000c\000a\000n\000n\000i\000n\000g\000\040\000E\000l\000e\000c\000t\000r\000o\000n\000\040\000M\000i\000c\000r\000o\000s\000c\000o\000p\000y}{section.1.7}% 17
+\BOOKMARK [0][-]{chapter.2}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000r\000e\000p\000a\000i\000r\000s\000\040\000a\000n\000d\000\040\000o\000p\000t\000i\000m\000i\000z\000a\000t\000i\000o\000n\000s}{}% 18
+\BOOKMARK [1][-]{section.2.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w}{chapter.2}% 19
+\BOOKMARK [1][-]{section.2.2}{\376\377\000G\000e\000n\000e\000r\000a\000l\000\040\000U\000H\000V\000\040\000d\000e\000v\000i\000c\000e\000\040\000p\000r\000e\000p\000a\000r\000a\000t\000i\000o\000n}{chapter.2}% 20
+\BOOKMARK [2][-]{subsection.2.2.1}{\376\377\000U\000H\000V\000\040\000c\000o\000m\000p\000a\000t\000i\000b\000l\000e\000\040\000S\000o\000l\000d\000e\000r\000i\000n\000g}{section.2.2}% 21
+\BOOKMARK [1][-]{section.2.3}{\376\377\000S\000o\000l\000d\000e\000r\000i\000n\000g\000\040\000a\000n\000c\000h\000o\000r\000s}{chapter.2}% 22
+\BOOKMARK [1][-]{section.2.4}{\376\377\000P\000i\000e\000z\000o\000\040\000r\000e\000g\000l\000u\000i\000n\000g}{chapter.2}% 23
+\BOOKMARK [1][-]{section.2.5}{\376\377\000Z\0003\000\040\000m\000o\000t\000o\000r}{chapter.2}% 24
+\BOOKMARK [2][-]{subsection.2.5.1}{\376\377\000F\000r\000o\000n\000t\000\040\000p\000l\000a\000t\000e\000\040\000r\000e\000p\000a\000i\000r}{section.2.5}% 25
+\BOOKMARK [2][-]{subsection.2.5.2}{\376\377\000S\000m\000a\000l\000l\000\040\000c\000a\000p\000a\000c\000i\000t\000a\000n\000c\000e\000\040\000s\000t\000a\000c\000k}{section.2.5}% 26
+\BOOKMARK [1][-]{section.2.6}{\376\377\000F\000e\000e\000d\000\040\000t\000h\000r\000o\000u\000g\000h\000\040\000c\000a\000b\000l\000i\000n\000g\000\040\000o\000p\000t\000i\000m\000i\000z\000a\000t\000i\000o\000n\000s}{chapter.2}% 27
+\BOOKMARK [1][-]{section.2.7}{\376\377\000F\000i\000n\000a\000l\000\040\000t\000e\000s\000t}{chapter.2}% 28
+\BOOKMARK [0][-]{chapter.3}{\376\377\000E\000v\000a\000p\000o\000r\000a\000t\000i\000o\000n\000s\000\040\000a\000n\000d\000\040\000m\000e\000a\000s\000u\000r\000e\000m\000e\000n\000t}{}% 29
+\BOOKMARK [1][-]{section.3.1}{\376\377\000E\000v\000a\000p\000o\000r\000a\000t\000i\000o\000n\000\040\000c\000o\000n\000f\000i\000g\000u\000r\000a\000t\000i\000o\000n}{chapter.3}% 30
+\BOOKMARK [1][-]{section.3.2}{\376\377\000C\000o\000n\000t\000a\000m\000i\000n\000a\000t\000i\000o\000n}{chapter.3}% 31
+\BOOKMARK [1][-]{section.3.3}{\376\377\000P\000e\000n\000u\000m\000b\000r\000a}{chapter.3}% 32
+\BOOKMARK [1][-]{section.3.4}{\376\377\000T\000i\000l\000t\000\040\000a\000n\000d\000\040\000d\000e\000f\000o\000r\000m\000a\000t\000i\000o\000n}{chapter.3}% 33
+\BOOKMARK [1][-]{section.3.5}{\376\377\000S\000i\000m\000u\000l\000a\000t\000i\000o\000n}{chapter.3}% 34
+\BOOKMARK [2][-]{subsection.3.5.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w\000\040\000a\000n\000d\000\040\000p\000r\000i\000n\000c\000i\000p\000l\000e}{section.3.5}% 35
+\BOOKMARK [2][-]{subsection.3.5.2}{\376\377\000R\000e\000s\000u\000l\000t\000s}{section.3.5}% 36
+\BOOKMARK [2][-]{subsection.3.5.3}{\376\377\000S\000o\000f\000t\000w\000a\000r\000e\000\040\000i\000m\000p\000r\000o\000v\000e\000m\000e\000n\000t\000s}{section.3.5}% 37
+\BOOKMARK [2][-]{subsection.3.5.4}{\376\377\000F\000i\000n\000a\000l\000\040\000R\000e\000m\000a\000r\000k}{section.3.5}% 38
+\BOOKMARK [0][-]{chapter.4}{\376\377\000E\000l\000e\000c\000t\000r\000o\000n\000i\000c\000s}{}% 39
+\BOOKMARK [1][-]{section.4.1}{\376\377\000R\000H\000K\000\040\000p\000i\000e\000z\000o\000\040\000m\000o\000t\000o\000r\000\040\000c\000o\000n\000t\000r\000o\000l\000l\000e\000r}{chapter.4}% 40
+\BOOKMARK [2][-]{subsection.4.1.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w}{section.4.1}% 41
+\BOOKMARK [2][-]{subsection.4.1.2}{\376\377\000P\000u\000l\000s\000e\000\040\000s\000h\000a\000p\000e}{section.4.1}% 42
+\BOOKMARK [1][-]{section.4.2}{\376\377\000K\000I\000M\0000\0000\0001}{chapter.4}% 43
+\BOOKMARK [2][-]{subsection.4.2.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w}{section.4.2}% 44
+\BOOKMARK [2][-]{subsection.4.2.2}{\376\377\000P\000u\000l\000s\000e\000\040\000s\000h\000a\000p\000e}{section.4.2}% 45
+\BOOKMARK [2][-]{subsection.4.2.3}{\376\377\000V\000o\000l\000t\000a\000g\000e\000\040\000b\000e\000h\000a\000v\000i\000o\000r}{section.4.2}% 46
+\BOOKMARK [1][-]{section.4.3}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000c\000o\000n\000t\000r\000o\000l\000l\000e\000r\000\040\000"\000W\000a\000l\000k\000e\000r\000"}{chapter.4}% 47
+\BOOKMARK [2][-]{subsection.4.3.1}{\376\377\000O\000v\000e\000r\000v\000i\000e\000w}{section.4.3}% 48
+\BOOKMARK [2][-]{subsection.4.3.2}{\376\377\000S\000i\000g\000n\000a\000l\000\040\000g\000e\000n\000e\000r\000a\000t\000i\000o\000n}{section.4.3}% 49
+\BOOKMARK [2][-]{subsection.4.3.3}{\376\377\000F\000a\000s\000t\000\040\000f\000l\000a\000n\000k}{section.4.3}% 50
+\BOOKMARK [2][-]{subsection.4.3.4}{\376\377\000A\000m\000p\000l\000i\000f\000i\000c\000a\000t\000i\000o\000n}{section.4.3}% 51
+\BOOKMARK [2][-]{subsection.4.3.5}{\376\377\000P\000r\000o\000g\000r\000a\000m\000m\000i\000n\000g}{section.4.3}% 52
+\BOOKMARK [2][-]{subsection.4.3.6}{\376\377\000M\000e\000a\000s\000u\000r\000e\000d\000\040\000p\000u\000l\000s\000e\000\040\000s\000h\000a\000p\000e}{section.4.3}% 53
+\BOOKMARK [2][-]{subsection.4.3.7}{\376\377\000O\000p\000e\000r\000a\000t\000i\000o\000n\000\040\000w\000i\000t\000h\000\040\000t\000h\000e\000\040\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r}{section.4.3}% 54
+\BOOKMARK [0][-]{chapter*.74}{\376\377\000C\000o\000n\000c\000l\000u\000s\000i\000o\000n\000s\000\040\000a\000n\000d\000\040\000O\000u\000t\000l\000o\000o\000k}{}% 55
+\BOOKMARK [0][-]{chapter*.75}{\376\377\000B\000i\000b\000l\000i\000o\000g\000r\000a\000p\000h\000y}{}% 56
+\BOOKMARK [0][-]{chapter*.76}{\376\377\000L\000i\000s\000t\000\040\000o\000f\000\040\000A\000b\000b\000r\000e\000v\000i\000a\000t\000i\000o\000n\000s}{}% 57
+\BOOKMARK [0][-]{chapter*.77}{\376\377\000A\000p\000p\000e\000n\000d\000i\000x}{}% 58
+\BOOKMARK [1][-]{section.4.1}{\376\377\000L\000o\000c\000k\000I\000n\000\040\000a\000m\000p\000l\000i\000f\000i\000e\000r\000\040\000s\000e\000t\000t\000i\000n\000g\000s}{chapter*.77}% 59
+\BOOKMARK [1][-]{section.4.2}{\376\377\000E\000v\000a\000p\000o\000r\000a\000t\000i\000o\000n\000\040\000p\000a\000r\000a\000m\000e\000t\000e\000r\000s}{chapter*.77}% 60
+\BOOKMARK [1][-]{section.4.3}{\376\377\000W\000a\000l\000k\000e\000r\000\040\000p\000r\000i\000n\000c\000i\000p\000l\000e\000\040\000d\000i\000a\000g\000r\000a\000m}{chapter*.77}% 61
+\BOOKMARK [1][-]{section.4.4}{\376\377\000W\000a\000l\000k\000e\000r\000\040\000c\000i\000r\000c\000u\000i\000t\000\040\000d\000i\000a\000g\000r\000a\000m\000s}{chapter*.77}% 62
+\BOOKMARK [1][-]{section.4.5}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000W\000a\000l\000k\000e\000r\000\040\000C\000o\000m\000m\000a\000n\000d\000s}{chapter*.77}% 63
+\BOOKMARK [1][-]{section.4.6}{\376\377\000M\000a\000s\000k\000\040\000A\000l\000i\000g\000n\000e\000r\000\040\000W\000a\000l\000k\000e\000r\000\040\000C\000o\000d\000e}{chapter*.77}% 64
+\BOOKMARK [1][-]{section.4.7}{\376\377\000R\000a\000y\000c\000a\000s\000t\000\040\000S\000i\000m\000u\000l\000a\000t\000i\000o\000n}{chapter*.77}% 65
+\BOOKMARK [0][-]{chapter*.112}{\376\377\000A\000c\000k\000n\000o\000w\000l\000e\000d\000g\000m\000e\000n\000t\000s}{}% 66
diff --git a/thesis.pdf b/thesis.pdf
index 7eb34a43e95b610f6850d5b2d9f83c98bb18c7a3..1660aa649f2a481699814868fa11b954ffda7d95 100644
Binary files a/thesis.pdf and b/thesis.pdf differ
diff --git a/thesis.synctex.gz b/thesis.synctex.gz
index 545f87617dac6c87ca2a84a6ba8846322374d650..768be0a5cd449e441198a983db35f8c1cea9538e 100644
Binary files a/thesis.synctex.gz and b/thesis.synctex.gz differ
diff --git a/thesis.toc b/thesis.toc
index 33414d75c2e3b5f9b1033631d9de7cf8864f813c..9c6ac4c98a2f0b6f730369383e3dcc8abd2255b9 100644
--- a/thesis.toc
+++ b/thesis.toc
@@ -12,103 +12,101 @@
\contentsline {subsection}{\numberline {1.5.2}Motor calibration}{16}{subsection.1.5.2}%
\contentsline {subsection}{\numberline {1.5.3}Optical alignment}{20}{subsection.1.5.3}%
\contentsline {subsection}{\numberline {1.5.4}Capacitive distance measurements}{22}{subsection.1.5.4}%
-\contentsline {subsection}{\numberline {1.5.5}Reproducibility}{25}{subsection.1.5.5}%
-\contentsline {subsubsection}{Reproducibility when removing sample/mask}{25}{section*.23}%
-\contentsline {section}{\numberline {1.6}Mask Aligner operation}{26}{section.1.6}%
-\contentsline {subsection}{\numberline {1.6.1}Sample preparation}{26}{subsection.1.6.1}%
-\contentsline {section}{\numberline {1.7}Measurement techniques}{27}{section.1.7}%
-\contentsline {subsection}{\numberline {1.7.1}Atomic Force Microscopy}{27}{subsection.1.7.1}%
-\contentsline {subsubsection}{Modes}{28}{section*.26}%
-\contentsline {paragraph}{Contact}{29}{section*.28}%
-\contentsline {paragraph}{Non-Contact}{29}{section*.29}%
-\contentsline {paragraph}{Tapping}{30}{section*.30}%
-\contentsline {subsection}{\numberline {1.7.2}Scanning Electron Microscopy}{30}{subsection.1.7.2}%
-\contentsline {chapter}{\numberline {2}Mask Aligner repairs and optimizations}{33}{chapter.2}%
-\contentsline {section}{\numberline {2.1}Overview}{33}{section.2.1}%
-\contentsline {section}{\numberline {2.2}General UHV device preparation}{34}{section.2.2}%
-\contentsline {subsection}{\numberline {2.2.1}UHV compatible Soldering}{34}{subsection.2.2.1}%
-\contentsline {section}{\numberline {2.3}Soldering anchors}{34}{section.2.3}%
-\contentsline {section}{\numberline {2.4}Piezo regluing}{37}{section.2.4}%
-\contentsline {section}{\numberline {2.5}Z3 motor}{38}{section.2.5}%
-\contentsline {subsection}{\numberline {2.5.1}Front plate repair}{39}{subsection.2.5.1}%
-\contentsline {subsection}{\numberline {2.5.2}Small capacitance stack}{41}{subsection.2.5.2}%
-\contentsline {section}{\numberline {2.6}Feed through cabling optimizations}{42}{section.2.6}%
-\contentsline {section}{\numberline {2.7}Final test}{43}{section.2.7}%
-\contentsline {chapter}{\numberline {3}Evaporations and measurement}{45}{chapter.3}%
-\contentsline {section}{\numberline {3.1}Evaporation configuration}{45}{section.3.1}%
-\contentsline {section}{\numberline {3.2}Contamination}{47}{section.3.2}%
-\contentsline {section}{\numberline {3.3}Penumbra}{48}{section.3.3}%
-\contentsline {section}{\numberline {3.4}Tilt and deformation}{52}{section.3.4}%
-\contentsline {section}{\numberline {3.5}Simulation}{55}{section.3.5}%
-\contentsline {subsection}{\numberline {3.5.1}Overview and principle}{55}{subsection.3.5.1}%
-\contentsline {subsection}{\numberline {3.5.2}Results}{57}{subsection.3.5.2}%
-\contentsline {subsection}{\numberline {3.5.3}Software improvements}{60}{subsection.3.5.3}%
-\contentsline {subsection}{\numberline {3.5.4}Final Remark}{61}{subsection.3.5.4}%
-\contentsline {chapter}{\numberline {4}Electronics}{62}{chapter.4}%
-\contentsline {section}{\numberline {4.1}RHK piezo motor controller}{62}{section.4.1}%
-\contentsline {subsection}{\numberline {4.1.1}Overview}{62}{subsection.4.1.1}%
-\contentsline {paragraph}{amplitude}{62}{section*.58}%
-\contentsline {paragraph}{sweep period}{62}{section*.59}%
-\contentsline {paragraph}{time between sweeps}{62}{section*.60}%
-\contentsline {subsection}{\numberline {4.1.2}Pulse shape}{62}{subsection.4.1.2}%
-\contentsline {section}{\numberline {4.2}KIM001}{63}{section.4.2}%
-\contentsline {subsection}{\numberline {4.2.1}Overview}{63}{subsection.4.2.1}%
-\contentsline {subsection}{\numberline {4.2.2}Pulse shape}{63}{subsection.4.2.2}%
-\contentsline {subsection}{\numberline {4.2.3}Voltage behavior}{64}{subsection.4.2.3}%
-\contentsline {section}{\numberline {4.3}Mask Aligner controller "Walker"}{65}{section.4.3}%
-\contentsline {subsection}{\numberline {4.3.1}Overview}{65}{subsection.4.3.1}%
-\contentsline {subsection}{\numberline {4.3.2}Signal generation}{65}{subsection.4.3.2}%
-\contentsline {subsection}{\numberline {4.3.3}Fast flank}{66}{subsection.4.3.3}%
-\contentsline {subsection}{\numberline {4.3.4}Amplification}{67}{subsection.4.3.4}%
-\contentsline {subsection}{\numberline {4.3.5}Programming}{68}{subsection.4.3.5}%
-\contentsline {subsubsection}{Parameters}{68}{section*.67}%
-\contentsline {paragraph}{Amplitude (amp)}{68}{section*.68}%
-\contentsline {paragraph}{Voltage (volt)}{68}{section*.69}%
-\contentsline {paragraph}{Channel}{68}{section*.70}%
-\contentsline {paragraph}{Max Step}{68}{section*.71}%
-\contentsline {paragraph}{Polarity}{68}{section*.72}%
-\contentsline {subsection}{\numberline {4.3.6}Measured pulse shape}{68}{subsection.4.3.6}%
-\contentsline {subsection}{\numberline {4.3.7}Operation with the Mask Aligner}{70}{subsection.4.3.7}%
-\contentsline {chapter}{Conclusions and Outlook}{72}{chapter*.76}%
-\contentsline {chapter}{Bibliography}{73}{chapter*.77}%
-\contentsline {chapter}{List of Abbreviations}{76}{chapter*.78}%
-\contentsline {chapter}{Appendix}{77}{chapter*.79}%
-\contentsline {section}{\numberline {A}LockIn amplifier settings}{77}{section.4.1}%
-\contentsline {section}{\numberline {B}Evaporation parameters}{77}{section.4.2}%
-\contentsline {section}{\numberline {C}Walker principle diagram}{78}{section.4.3}%
-\contentsline {section}{\numberline {D}Walker circuit diagrams}{78}{section.4.4}%
-\contentsline {section}{\numberline {E}Mask Aligner Walker Commands}{82}{section.4.5}%
-\contentsline {paragraph}{pulse?}{82}{section*.83}%
-\contentsline {paragraph}{pol x}{82}{section*.84}%
-\contentsline {paragraph}{amp x}{82}{section*.85}%
-\contentsline {paragraph}{volt x}{82}{section*.86}%
-\contentsline {paragraph}{channel x}{82}{section*.87}%
-\contentsline {paragraph}{maxmstep x}{82}{section*.88}%
-\contentsline {paragraph}{step x}{82}{section*.89}%
-\contentsline {paragraph}{mstep x}{82}{section*.90}%
-\contentsline {paragraph}{cancel}{83}{section*.91}%
-\contentsline {paragraph}{help}{83}{section*.92}%
-\contentsline {section}{\numberline {F}Mask Aligner Walker Code}{83}{section.4.6}%
-\contentsline {section}{\numberline {G}Raycast Simulation}{94}{section.4.7}%
-\contentsline {paragraph}{radius\_1}{94}{section*.93}%
-\contentsline {paragraph}{angle}{94}{section*.94}%
-\contentsline {paragraph}{radius\_mask}{95}{section*.95}%
-\contentsline {paragraph}{distance\_circle\_mask}{95}{section*.96}%
-\contentsline {paragraph}{distance\_sample}{95}{section*.97}%
-\contentsline {paragraph}{rays\_per\_frame}{95}{section*.98}%
-\contentsline {paragraph}{running\_time}{95}{section*.99}%
-\contentsline {paragraph}{deposition\_gain}{95}{section*.100}%
-\contentsline {paragraph}{penalize\_deposition}{95}{section*.101}%
-\contentsline {paragraph}{first\_layer\_deposition\_prob}{95}{section*.102}%
-\contentsline {paragraph}{oscillation\_period}{95}{section*.103}%
-\contentsline {paragraph}{delay\_oscill\_time}{95}{section*.104}%
-\contentsline {paragraph}{save\_in\_progress\_images}{95}{section*.105}%
-\contentsline {paragraph}{save\_intervall}{95}{section*.106}%
-\contentsline {paragraph}{oscillation\_dir}{95}{section*.107}%
-\contentsline {paragraph}{oscillation\_rot\_s}{95}{section*.108}%
-\contentsline {paragraph}{oscillation\_rot\_e}{96}{section*.109}%
-\contentsline {paragraph}{random\_seed}{96}{section*.110}%
-\contentsline {paragraph}{x\_min, x\_max, y\_min, y\_max}{96}{section*.111}%
-\contentsline {paragraph}{resolution}{96}{section*.112}%
-\contentsline {paragraph}{path}{96}{section*.113}%
-\contentsline {chapter}{Acknowledgments}{97}{chapter*.114}%
+\contentsline {section}{\numberline {1.6}Mask Aligner operation}{25}{section.1.6}%
+\contentsline {subsection}{\numberline {1.6.1}Sample preparation}{25}{subsection.1.6.1}%
+\contentsline {section}{\numberline {1.7}Measurement techniques}{26}{section.1.7}%
+\contentsline {subsection}{\numberline {1.7.1}Atomic Force Microscopy}{26}{subsection.1.7.1}%
+\contentsline {subsubsection}{Modes}{27}{section*.24}%
+\contentsline {paragraph}{Contact}{27}{section*.26}%
+\contentsline {paragraph}{Non-Contact}{27}{section*.27}%
+\contentsline {paragraph}{Tapping}{28}{section*.28}%
+\contentsline {subsection}{\numberline {1.7.2}Scanning Electron Microscopy}{28}{subsection.1.7.2}%
+\contentsline {chapter}{\numberline {2}Mask Aligner repairs and optimizations}{31}{chapter.2}%
+\contentsline {section}{\numberline {2.1}Overview}{31}{section.2.1}%
+\contentsline {section}{\numberline {2.2}General UHV device preparation}{32}{section.2.2}%
+\contentsline {subsection}{\numberline {2.2.1}UHV compatible Soldering}{32}{subsection.2.2.1}%
+\contentsline {section}{\numberline {2.3}Soldering anchors}{32}{section.2.3}%
+\contentsline {section}{\numberline {2.4}Piezo regluing}{35}{section.2.4}%
+\contentsline {section}{\numberline {2.5}Z3 motor}{36}{section.2.5}%
+\contentsline {subsection}{\numberline {2.5.1}Front plate repair}{37}{subsection.2.5.1}%
+\contentsline {subsection}{\numberline {2.5.2}Small capacitance stack}{39}{subsection.2.5.2}%
+\contentsline {section}{\numberline {2.6}Feed through cabling optimizations}{40}{section.2.6}%
+\contentsline {section}{\numberline {2.7}Final test}{41}{section.2.7}%
+\contentsline {chapter}{\numberline {3}Evaporations and measurement}{43}{chapter.3}%
+\contentsline {section}{\numberline {3.1}Evaporation configuration}{43}{section.3.1}%
+\contentsline {section}{\numberline {3.2}Contamination}{45}{section.3.2}%
+\contentsline {section}{\numberline {3.3}Penumbra}{46}{section.3.3}%
+\contentsline {section}{\numberline {3.4}Tilt and deformation}{50}{section.3.4}%
+\contentsline {section}{\numberline {3.5}Simulation}{53}{section.3.5}%
+\contentsline {subsection}{\numberline {3.5.1}Overview and principle}{53}{subsection.3.5.1}%
+\contentsline {subsection}{\numberline {3.5.2}Results}{55}{subsection.3.5.2}%
+\contentsline {subsection}{\numberline {3.5.3}Software improvements}{58}{subsection.3.5.3}%
+\contentsline {subsection}{\numberline {3.5.4}Final Remark}{59}{subsection.3.5.4}%
+\contentsline {chapter}{\numberline {4}Electronics}{60}{chapter.4}%
+\contentsline {section}{\numberline {4.1}RHK piezo motor controller}{60}{section.4.1}%
+\contentsline {subsection}{\numberline {4.1.1}Overview}{60}{subsection.4.1.1}%
+\contentsline {paragraph}{amplitude}{60}{section*.56}%
+\contentsline {paragraph}{sweep period}{60}{section*.57}%
+\contentsline {paragraph}{time between sweeps}{60}{section*.58}%
+\contentsline {subsection}{\numberline {4.1.2}Pulse shape}{60}{subsection.4.1.2}%
+\contentsline {section}{\numberline {4.2}KIM001}{61}{section.4.2}%
+\contentsline {subsection}{\numberline {4.2.1}Overview}{61}{subsection.4.2.1}%
+\contentsline {subsection}{\numberline {4.2.2}Pulse shape}{61}{subsection.4.2.2}%
+\contentsline {subsection}{\numberline {4.2.3}Voltage behavior}{62}{subsection.4.2.3}%
+\contentsline {section}{\numberline {4.3}Mask Aligner controller "Walker"}{63}{section.4.3}%
+\contentsline {subsection}{\numberline {4.3.1}Overview}{63}{subsection.4.3.1}%
+\contentsline {subsection}{\numberline {4.3.2}Signal generation}{63}{subsection.4.3.2}%
+\contentsline {subsection}{\numberline {4.3.3}Fast flank}{64}{subsection.4.3.3}%
+\contentsline {subsection}{\numberline {4.3.4}Amplification}{65}{subsection.4.3.4}%
+\contentsline {subsection}{\numberline {4.3.5}Programming}{66}{subsection.4.3.5}%
+\contentsline {subsubsection}{Parameters}{66}{section*.65}%
+\contentsline {paragraph}{Amplitude (amp)}{66}{section*.66}%
+\contentsline {paragraph}{Voltage (volt)}{66}{section*.67}%
+\contentsline {paragraph}{Channel}{66}{section*.68}%
+\contentsline {paragraph}{Max Step}{66}{section*.69}%
+\contentsline {paragraph}{Polarity}{66}{section*.70}%
+\contentsline {subsection}{\numberline {4.3.6}Measured pulse shape}{66}{subsection.4.3.6}%
+\contentsline {subsection}{\numberline {4.3.7}Operation with the Mask Aligner}{68}{subsection.4.3.7}%
+\contentsline {chapter}{Conclusions and Outlook}{70}{chapter*.74}%
+\contentsline {chapter}{Bibliography}{71}{chapter*.75}%
+\contentsline {chapter}{List of Abbreviations}{74}{chapter*.76}%
+\contentsline {chapter}{Appendix}{75}{chapter*.77}%
+\contentsline {section}{\numberline {A}LockIn amplifier settings}{75}{section.4.1}%
+\contentsline {section}{\numberline {B}Evaporation parameters}{75}{section.4.2}%
+\contentsline {section}{\numberline {C}Walker principle diagram}{76}{section.4.3}%
+\contentsline {section}{\numberline {D}Walker circuit diagrams}{76}{section.4.4}%
+\contentsline {section}{\numberline {E}Mask Aligner Walker Commands}{80}{section.4.5}%
+\contentsline {paragraph}{pulse?}{80}{section*.81}%
+\contentsline {paragraph}{pol x}{80}{section*.82}%
+\contentsline {paragraph}{amp x}{80}{section*.83}%
+\contentsline {paragraph}{volt x}{80}{section*.84}%
+\contentsline {paragraph}{channel x}{80}{section*.85}%
+\contentsline {paragraph}{maxmstep x}{80}{section*.86}%
+\contentsline {paragraph}{step x}{80}{section*.87}%
+\contentsline {paragraph}{mstep x}{80}{section*.88}%
+\contentsline {paragraph}{cancel}{81}{section*.89}%
+\contentsline {paragraph}{help}{81}{section*.90}%
+\contentsline {section}{\numberline {F}Mask Aligner Walker Code}{81}{section.4.6}%
+\contentsline {section}{\numberline {G}Raycast Simulation}{92}{section.4.7}%
+\contentsline {paragraph}{radius\_1}{92}{section*.91}%
+\contentsline {paragraph}{angle}{92}{section*.92}%
+\contentsline {paragraph}{radius\_mask}{93}{section*.93}%
+\contentsline {paragraph}{distance\_circle\_mask}{93}{section*.94}%
+\contentsline {paragraph}{distance\_sample}{93}{section*.95}%
+\contentsline {paragraph}{rays\_per\_frame}{93}{section*.96}%
+\contentsline {paragraph}{running\_time}{93}{section*.97}%
+\contentsline {paragraph}{deposition\_gain}{93}{section*.98}%
+\contentsline {paragraph}{penalize\_deposition}{93}{section*.99}%
+\contentsline {paragraph}{first\_layer\_deposition\_prob}{93}{section*.100}%
+\contentsline {paragraph}{oscillation\_period}{93}{section*.101}%
+\contentsline {paragraph}{delay\_oscill\_time}{93}{section*.102}%
+\contentsline {paragraph}{save\_in\_progress\_images}{93}{section*.103}%
+\contentsline {paragraph}{save\_intervall}{93}{section*.104}%
+\contentsline {paragraph}{oscillation\_dir}{93}{section*.105}%
+\contentsline {paragraph}{oscillation\_rot\_s}{93}{section*.106}%
+\contentsline {paragraph}{oscillation\_rot\_e}{94}{section*.107}%
+\contentsline {paragraph}{random\_seed}{94}{section*.108}%
+\contentsline {paragraph}{x\_min, x\_max, y\_min, y\_max}{94}{section*.109}%
+\contentsline {paragraph}{resolution}{94}{section*.110}%
+\contentsline {paragraph}{path}{94}{section*.111}%
+\contentsline {chapter}{Acknowledgments}{95}{chapter*.112}%